{"id":"https://openalex.org/W2067356596","doi":"https://doi.org/10.1016/s0045-7906(01)00020-9","title":"Fault isolation in analog circuits using a fuzzy inference system","display_name":"Fault isolation in analog circuits using a fuzzy inference system","publication_year":2003,"publication_date":"2003-01-01","ids":{"openalex":"https://openalex.org/W2067356596","doi":"https://doi.org/10.1016/s0045-7906(01)00020-9","mag":"2067356596"},"language":"en","primary_location":{"id":"doi:10.1016/s0045-7906(01)00020-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0045-7906(01)00020-9","pdf_url":null,"source":{"id":"https://openalex.org/S121340289","display_name":"Computers & Electrical Engineering","issn_l":"0045-7906","issn":["0045-7906","1879-0755"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Electrical Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037765083","display_name":"Mohamed Gamal El\u2010Din","orcid":"https://orcid.org/0000-0001-8443-476X"},"institutions":[{"id":"https://openalex.org/I145487455","display_name":"Cairo University","ror":"https://ror.org/03q21mh05","country_code":"EG","type":"education","lineage":["https://openalex.org/I145487455"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"M.A. El-Gamal","raw_affiliation_strings":["Department of Engineering Mathematics and Physics, Cairo University, Giza, Egypt","Department of Engineering Mathematics and Physics, Cairo University, Giza, Egypt#TAB#"],"affiliations":[{"raw_affiliation_string":"Department of Engineering Mathematics and Physics, Cairo University, Giza, Egypt","institution_ids":["https://openalex.org/I145487455"]},{"raw_affiliation_string":"Department of Engineering Mathematics and Physics, Cairo University, Giza, Egypt#TAB#","institution_ids":["https://openalex.org/I145487455"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007358966","display_name":"M. Abdulghafour","orcid":null},"institutions":[{"id":"https://openalex.org/I47818738","display_name":"Sultan Qaboos University","ror":"https://ror.org/04wq8zb47","country_code":"OM","type":"education","lineage":["https://openalex.org/I47818738"]}],"countries":["OM"],"is_corresponding":true,"raw_author_name":"M. Abdulghafour","raw_affiliation_strings":["Department of Computer Science, Sultan Qaboos University, Muscat 123, Oman","[Department of Computer Science, Sultan Qaboos University, Muscat 123, Oman.]"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Sultan Qaboos University, Muscat 123, Oman","institution_ids":["https://openalex.org/I47818738"]},{"raw_affiliation_string":"[Department of Computer Science, Sultan Qaboos University, Muscat 123, Oman.]","institution_ids":["https://openalex.org/I47818738"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5007358966"],"corresponding_institution_ids":["https://openalex.org/I47818738"],"apc_list":{"value":3100,"currency":"USD","value_usd":3100},"apc_paid":null,"fwci":0.5128,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.66123033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"29","issue":"1","first_page":"213","last_page":"229"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11975","display_name":"Evolutionary Algorithms and Applications","score":0.9793000221252441,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6542081236839294},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.5832923650741577},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.581386387348175},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5297886729240417},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5240997076034546},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5140429735183716},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3769361972808838},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33227550983428955},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3276832103729248},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3125222325325012}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6542081236839294},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.5832923650741577},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.581386387348175},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5297886729240417},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5240997076034546},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5140429735183716},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3769361972808838},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33227550983428955},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3276832103729248},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3125222325325012},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0045-7906(01)00020-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0045-7906(01)00020-9","pdf_url":null,"source":{"id":"https://openalex.org/S121340289","display_name":"Computers & Electrical Engineering","issn_l":"0045-7906","issn":["0045-7906","1879-0755"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Electrical Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","score":0.4399999976158142,"display_name":"Peace, Justice and strong institutions"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W140221739","https://openalex.org/W1491777418","https://openalex.org/W1498043547","https://openalex.org/W1498672627","https://openalex.org/W1531351064","https://openalex.org/W1562159783","https://openalex.org/W1586602118","https://openalex.org/W1977824776","https://openalex.org/W2011409865","https://openalex.org/W2017103958","https://openalex.org/W2020664233","https://openalex.org/W2023702105","https://openalex.org/W2049892975","https://openalex.org/W2051220667","https://openalex.org/W2056457936","https://openalex.org/W2088576840","https://openalex.org/W2091353536","https://openalex.org/W2128143822","https://openalex.org/W2141279581","https://openalex.org/W2147819306","https://openalex.org/W2148651918","https://openalex.org/W2154336645","https://openalex.org/W2167028949","https://openalex.org/W2169757786","https://openalex.org/W2171679673","https://openalex.org/W2595708118","https://openalex.org/W2912848477","https://openalex.org/W4254439724"],"related_works":["https://openalex.org/W2575775159","https://openalex.org/W2135636123","https://openalex.org/W2577233154","https://openalex.org/W2359839532","https://openalex.org/W2361476240","https://openalex.org/W2371965930","https://openalex.org/W2353520333","https://openalex.org/W2350226881","https://openalex.org/W2166897423","https://openalex.org/W1964557544"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}