{"id":"https://openalex.org/W2088917386","doi":"https://doi.org/10.1016/s0031-3203(97)00123-4","title":"Iterative relaxational stereo matching based on adaptive support between disparities","display_name":"Iterative relaxational stereo matching based on adaptive support between disparities","publication_year":1998,"publication_date":"1998-08-01","ids":{"openalex":"https://openalex.org/W2088917386","doi":"https://doi.org/10.1016/s0031-3203(97)00123-4","mag":"2088917386"},"language":"en","primary_location":{"id":"doi:10.1016/s0031-3203(97)00123-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0031-3203(97)00123-4","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052800114","display_name":"Kyeong-Hoon Do","orcid":null},"institutions":[{"id":"https://openalex.org/I102786147","display_name":"Dongseo University","ror":"https://ror.org/00wygsf57","country_code":"KR","type":"education","lineage":["https://openalex.org/I102786147"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyeong-Hoon Do","raw_affiliation_strings":["Department of Computer Engineering, Dongseo University, Pusan 617-716, South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Dongseo University, Pusan 617-716, South Korea","institution_ids":["https://openalex.org/I102786147"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027845117","display_name":"Yong\u2010Suk Kim","orcid":"https://orcid.org/0000-0003-3443-263X"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yong-Suk Kim","raw_affiliation_strings":["Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034217121","display_name":"Tae-Uk Uam","orcid":null},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Uk Uam","raw_affiliation_strings":["Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112110530","display_name":"Yeong\u2010Ho Ha","orcid":null},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Yeong-Ho Ha","raw_affiliation_strings":["Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu 702-701, South Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"Department of Electronic Engineering, Kyungpook National University, Taegu, 702-701 South Korea","institution_ids":["https://openalex.org/I31419693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5112110530"],"corresponding_institution_ids":["https://openalex.org/I31419693"],"apc_list":{"value":2710,"currency":"USD","value_usd":2710},"apc_paid":null,"fwci":1.5126,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.83870968,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"8","first_page":"1049","last_page":"1059"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.6394498348236084},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.6020010113716125},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5422995090484619},{"id":"https://openalex.org/keywords/classification-of-discontinuities","display_name":"Classification of discontinuities","score":0.5225431323051453},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5096828937530518},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5028683543205261},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49670106172561646},{"id":"https://openalex.org/keywords/ambiguity","display_name":"Ambiguity","score":0.47996020317077637},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.475953072309494},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3793305456638336},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.14706546068191528}],"concepts":[{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.6394498348236084},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.6020010113716125},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5422995090484619},{"id":"https://openalex.org/C15627037","wikidata":"https://www.wikidata.org/wiki/Q541961","display_name":"Classification of discontinuities","level":2,"score":0.5225431323051453},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5096828937530518},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5028683543205261},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49670106172561646},{"id":"https://openalex.org/C2780522230","wikidata":"https://www.wikidata.org/wiki/Q1140419","display_name":"Ambiguity","level":2,"score":0.47996020317077637},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.475953072309494},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3793305456638336},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.14706546068191528},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C17409809","wikidata":"https://www.wikidata.org/wiki/Q161764","display_name":"Geochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0031-3203(97)00123-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0031-3203(97)00123-4","pdf_url":null,"source":{"id":"https://openalex.org/S414566","display_name":"Pattern Recognition","issn_l":"0031-3203","issn":["0031-3203","1873-5142"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Pattern Recognition","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1564419782","https://openalex.org/W1622620102","https://openalex.org/W1926270821","https://openalex.org/W1977948323","https://openalex.org/W1979622972","https://openalex.org/W1990849189","https://openalex.org/W2050405342","https://openalex.org/W2054536235","https://openalex.org/W2054961868","https://openalex.org/W2070232491","https://openalex.org/W2083161364","https://openalex.org/W2102071159","https://openalex.org/W2105637862","https://openalex.org/W2111898057","https://openalex.org/W2115084764","https://openalex.org/W2118756337","https://openalex.org/W2120364676","https://openalex.org/W2120959311","https://openalex.org/W2136113379","https://openalex.org/W2141128914","https://openalex.org/W2167965718","https://openalex.org/W2570617923","https://openalex.org/W2740373864","https://openalex.org/W2911709767"],"related_works":["https://openalex.org/W2546871836","https://openalex.org/W2136485282","https://openalex.org/W2154631645","https://openalex.org/W2547748020","https://openalex.org/W1965781815","https://openalex.org/W3043252291","https://openalex.org/W2269705005","https://openalex.org/W2149249189","https://openalex.org/W2542880803","https://openalex.org/W2004374232"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}