{"id":"https://openalex.org/W1974610366","doi":"https://doi.org/10.1016/s0026-2714(03)00297-x","title":"Reliability of optoelectronics components: towards new qualification practices","display_name":"Reliability of optoelectronics components: towards new qualification practices","publication_year":2003,"publication_date":"2003-09-01","ids":{"openalex":"https://openalex.org/W1974610366","doi":"https://doi.org/10.1016/s0026-2714(03)00297-x","mag":"1974610366"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00297-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00297-x","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108217597","display_name":"J.L. Goudard","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"JL Goudard","raw_affiliation_strings":["Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France"],"affiliations":[{"raw_affiliation_string":"Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012344832","display_name":"X. Boddaert","orcid":"https://orcid.org/0000-0001-9381-6321"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"X Boddaert","raw_affiliation_strings":["Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France"],"affiliations":[{"raw_affiliation_string":"Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075121814","display_name":"J. P\u00e9rinet","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J P\u00e9rinet","raw_affiliation_strings":["Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France"],"affiliations":[{"raw_affiliation_string":"Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043260304","display_name":"D. Laffitte","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D Laffitte","raw_affiliation_strings":["Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France"],"affiliations":[{"raw_affiliation_string":"Alcatel Optronics, Route de Villejust, 91625 Nozay CEDEX, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5108217597"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15084,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"43","issue":"9-11","first_page":"1767","last_page":"1769"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7110000252723694,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7110000252723694,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.6923999786376953,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.6642000079154968,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7827951908111572},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7296438217163086},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39838749170303345},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39828118681907654},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3741893172264099},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3644048571586609},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17960882186889648}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7827951908111572},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7296438217163086},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39838749170303345},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39828118681907654},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3741893172264099},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3644048571586609},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17960882186889648},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00297-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00297-x","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}