{"id":"https://openalex.org/W2060143257","doi":"https://doi.org/10.1016/s0026-2714(03)00277-4","title":"Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)","display_name":"Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)","publication_year":2003,"publication_date":"2003-09-01","ids":{"openalex":"https://openalex.org/W2060143257","doi":"https://doi.org/10.1016/s0026-2714(03)00277-4","mag":"2060143257"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00277-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00277-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033219643","display_name":"T. Beauch\u00eane","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Beauch\u00eane","raw_affiliation_strings":["IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007857448","display_name":"David Tr\u00e9mouilles","orcid":"https://orcid.org/0000-0001-8446-9129"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I190497903","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","ror":"https://ror.org/03vcm6439","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I190497903","https://openalex.org/I193033237","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210152422","https://openalex.org/I4210159245","https://openalex.org/I4405258862","https://openalex.org/I4405259414"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Tremouilles","raw_affiliation_strings":["LAAS-CNRS, 31401 Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LAAS-CNRS, 31401 Toulouse, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I190497903"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004050860","display_name":"D. Lewis","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Lewis","raw_affiliation_strings":["IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111876180","display_name":"P. Perdu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Perdu","raw_affiliation_strings":["CNES-THALES laboratory, 31401 Toulouse, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CNES-THALES laboratory, 31401 Toulouse, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108666978","display_name":"P. Fouillat","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. Fouillat","raw_affiliation_strings":["IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IXL Laboratory, 351, Cours de la Lib\u00e9ration, 33405 Talence, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.3532,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63274388,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"43","issue":"9-11","first_page":"1577","last_page":"1582"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-system","display_name":"Photovoltaic system","score":0.6833173036575317},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.6358303427696228},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4993014335632324},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.42140302062034607},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.34968671202659607},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2593621015548706},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24006125330924988},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.13281849026679993}],"concepts":[{"id":"https://openalex.org/C41291067","wikidata":"https://www.wikidata.org/wiki/Q1897785","display_name":"Photovoltaic system","level":2,"score":0.6833173036575317},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.6358303427696228},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4993014335632324},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42140302062034607},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34968671202659607},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2593621015548706},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24006125330924988},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13281849026679993}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00277-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00277-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W3107994849","https://openalex.org/W4246450666","https://openalex.org/W2898370298","https://openalex.org/W4388998267","https://openalex.org/W2744391499","https://openalex.org/W3120461830","https://openalex.org/W4230250635","https://openalex.org/W3041790586","https://openalex.org/W2018879842"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}