{"id":"https://openalex.org/W2027094089","doi":"https://doi.org/10.1016/s0026-2714(03)00265-8","title":"Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices","display_name":"Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices","publication_year":2003,"publication_date":"2003-09-01","ids":{"openalex":"https://openalex.org/W2027094089","doi":"https://doi.org/10.1016/s0026-2714(03)00265-8","mag":"2027094089"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00265-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00265-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034532111","display_name":"A. U. Gehring","orcid":"https://orcid.org/0000-0003-2700-2578"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":true,"raw_author_name":"A GEHRING","raw_affiliation_strings":["Institute for Microelectronics, Vienna University of Technology Gusshausstrasse 27\u201329, A-1040 Vienna, Austria","Institute for Microelectronics, Vienna University of Technology Gusshausstrasse 27-29, A-1040 Vienna, Austria"],"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, Vienna University of Technology Gusshausstrasse 27\u201329, A-1040 Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]},{"raw_affiliation_string":"Institute for Microelectronics, Vienna University of Technology Gusshausstrasse 27-29, A-1040 Vienna, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5034532111"],"corresponding_institution_ids":["https://openalex.org/I145847075"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":1.0576,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.77412054,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"43","issue":"9-11","first_page":"1495","last_page":"1500"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/passivation","display_name":"Passivation","score":0.8854434490203857},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.708762526512146},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6834245920181274},{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.6802292466163635},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.6401333808898926},{"id":"https://openalex.org/keywords/solar-cell","display_name":"Solar cell","score":0.6257291436195374},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.4845634996891022},{"id":"https://openalex.org/keywords/energy-conversion-efficiency","display_name":"Energy conversion efficiency","score":0.4721510410308838},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.4608919024467468},{"id":"https://openalex.org/keywords/theory-of-solar-cells","display_name":"Theory of solar cells","score":0.4190516471862793},{"id":"https://openalex.org/keywords/solar-cell-efficiency","display_name":"Solar cell efficiency","score":0.29945456981658936},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2344064712524414},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22925284504890442}],"concepts":[{"id":"https://openalex.org/C33574316","wikidata":"https://www.wikidata.org/wiki/Q917260","display_name":"Passivation","level":3,"score":0.8854434490203857},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.708762526512146},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6834245920181274},{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.6802292466163635},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.6401333808898926},{"id":"https://openalex.org/C2780824857","wikidata":"https://www.wikidata.org/wiki/Q58803","display_name":"Solar cell","level":2,"score":0.6257291436195374},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.4845634996891022},{"id":"https://openalex.org/C206991015","wikidata":"https://www.wikidata.org/wiki/Q192704","display_name":"Energy conversion efficiency","level":2,"score":0.4721510410308838},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.4608919024467468},{"id":"https://openalex.org/C92433991","wikidata":"https://www.wikidata.org/wiki/Q7782453","display_name":"Theory of solar cells","level":4,"score":0.4190516471862793},{"id":"https://openalex.org/C190168584","wikidata":"https://www.wikidata.org/wiki/Q7556087","display_name":"Solar cell efficiency","level":3,"score":0.29945456981658936},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2344064712524414},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22925284504890442},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00265-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00265-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8600000143051147,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2001792619","https://openalex.org/W2338840401","https://openalex.org/W2234744065","https://openalex.org/W1521620707","https://openalex.org/W2154322410","https://openalex.org/W4300924757","https://openalex.org/W1964282261","https://openalex.org/W2216126916","https://openalex.org/W2078239563","https://openalex.org/W1996081113"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}