{"id":"https://openalex.org/W2044637241","doi":"https://doi.org/10.1016/s0026-2714(03)00194-x","title":"Single-equation model for low and high voltage soft breakdown conduction","display_name":"Single-equation model for low and high voltage soft breakdown conduction","publication_year":2003,"publication_date":"2003-08-12","ids":{"openalex":"https://openalex.org/W2044637241","doi":"https://doi.org/10.1016/s0026-2714(03)00194-x","mag":"2044637241"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00194-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00194-x","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041660505","display_name":"E. Miranda","orcid":"https://orcid.org/0000-0003-0470-5318"},"institutions":[{"id":"https://openalex.org/I24354313","display_name":"Universidad de Buenos Aires","ror":"https://ror.org/0081fs513","country_code":"AR","type":"education","lineage":["https://openalex.org/I24354313"]}],"countries":["AR"],"is_corresponding":true,"raw_author_name":"E. Miranda","raw_affiliation_strings":["Facultad de Ingenier\u0131\u0301a, Universidad de Buenos Aires, Paseo Col\u00f3n 850, 1603 Buenos Aires, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Facultad de Ingenier\u0131\u0301a, Universidad de Buenos Aires, Paseo Col\u00f3n 850, 1603 Buenos Aires, Argentina","institution_ids":["https://openalex.org/I24354313"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000399582","display_name":"Eduardo F. Mallaina","orcid":null},"institutions":[{"id":"https://openalex.org/I24354313","display_name":"Universidad de Buenos Aires","ror":"https://ror.org/0081fs513","country_code":"AR","type":"education","lineage":["https://openalex.org/I24354313"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"E. Mallaina","raw_affiliation_strings":["Facultad de Ingenier\u0131\u0301a, Universidad de Buenos Aires, Paseo Col\u00f3n 850, 1603 Buenos Aires, Argentina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Facultad de Ingenier\u0131\u0301a, Universidad de Buenos Aires, Paseo Col\u00f3n 850, 1603 Buenos Aires, Argentina","institution_ids":["https://openalex.org/I24354313"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5041660505"],"corresponding_institution_ids":["https://openalex.org/I24354313"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.6383,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.72706941,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"44","issue":"1","first_page":"163","last_page":"166"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/exponential-function","display_name":"Exponential function","score":0.6052124500274658},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.6037896871566772},{"id":"https://openalex.org/keywords/piecewise","display_name":"Piecewise","score":0.6019091606140137},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5385940670967102},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.46593159437179565},{"id":"https://openalex.org/keywords/expression","display_name":"Expression (computer science)","score":0.4649931490421295},{"id":"https://openalex.org/keywords/lambert-w-function","display_name":"Lambert W function","score":0.437275230884552},{"id":"https://openalex.org/keywords/power-law","display_name":"Power law","score":0.42736196517944336},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4018111228942871},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3376960754394531},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.33448565006256104},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.2630268633365631},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.2087474763393402},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.17711496353149414},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08881720900535583}],"concepts":[{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.6052124500274658},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.6037896871566772},{"id":"https://openalex.org/C164660894","wikidata":"https://www.wikidata.org/wiki/Q2037833","display_name":"Piecewise","level":2,"score":0.6019091606140137},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5385940670967102},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.46593159437179565},{"id":"https://openalex.org/C90559484","wikidata":"https://www.wikidata.org/wiki/Q778379","display_name":"Expression (computer science)","level":2,"score":0.4649931490421295},{"id":"https://openalex.org/C130924491","wikidata":"https://www.wikidata.org/wiki/Q429331","display_name":"Lambert W function","level":2,"score":0.437275230884552},{"id":"https://openalex.org/C87040749","wikidata":"https://www.wikidata.org/wiki/Q428971","display_name":"Power law","level":2,"score":0.42736196517944336},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4018111228942871},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3376960754394531},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.33448565006256104},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.2630268633365631},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.2087474763393402},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.17711496353149414},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08881720900535583},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00194-x","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00194-x","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W577942449","https://openalex.org/W2005708699","https://openalex.org/W2039658132","https://openalex.org/W2042262773","https://openalex.org/W2065734941","https://openalex.org/W2117281987","https://openalex.org/W2119870158","https://openalex.org/W2151212966","https://openalex.org/W2536727254","https://openalex.org/W2545225377","https://openalex.org/W4243156156"],"related_works":["https://openalex.org/W2280310889","https://openalex.org/W2108410032","https://openalex.org/W2167065846","https://openalex.org/W1989707661","https://openalex.org/W3098315949","https://openalex.org/W2784164440","https://openalex.org/W4298180436","https://openalex.org/W2062087329","https://openalex.org/W2172521509","https://openalex.org/W4391349094"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}