{"id":"https://openalex.org/W1974809618","doi":"https://doi.org/10.1016/s0026-2714(03)00179-3","title":"Ionising radiation effects on MOSFET drain current","display_name":"Ionising radiation effects on MOSFET drain current","publication_year":2003,"publication_date":"2003-07-22","ids":{"openalex":"https://openalex.org/W1974809618","doi":"https://doi.org/10.1016/s0026-2714(03)00179-3","mag":"1974809618"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00179-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00179-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013633689","display_name":"S. Cimino","orcid":"https://orcid.org/0000-0002-0947-1920"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"S. Cimino","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050762849","display_name":"Andrea Cester","orcid":"https://orcid.org/0000-0001-6583-1735"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Cester","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032762366","display_name":"A. Paccagnella","orcid":"https://orcid.org/0000-0002-6850-4286"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Paccagnella","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova, via Gradenigo 6B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035694704","display_name":"G. Ghidini","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Ghidini","raw_affiliation_strings":["STMicroelectronics, via C. Olivetti 2, 20041 Agrate Brianza, Italy","STMicroelectronics, Via C.Olivetti 2, 20041 Agrate Brianza, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, via C. Olivetti 2, 20041 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Via C.Olivetti 2, 20041 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5013633689"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.11092404,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"43","issue":"8","first_page":"1247","last_page":"1251"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.773857057094574},{"id":"https://openalex.org/keywords/channel-length-modulation","display_name":"Channel length modulation","score":0.656572699546814},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.6549882888793945},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.5791414976119995},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5417711138725281},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5377803444862366},{"id":"https://openalex.org/keywords/short-channel-effect","display_name":"Short-channel effect","score":0.5226561427116394},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.5163149237632751},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46638157963752747},{"id":"https://openalex.org/keywords/drain-induced-barrier-lowering","display_name":"Drain-induced barrier lowering","score":0.4345847964286804},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.4231928586959839},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.3791985511779785},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2893980145454407},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2641909122467041},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23544833064079285},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.19548934698104858},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13192662596702576},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.062380820512771606},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.04951834678649902}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.773857057094574},{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.656572699546814},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.6549882888793945},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.5791414976119995},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5417711138725281},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5377803444862366},{"id":"https://openalex.org/C11918236","wikidata":"https://www.wikidata.org/wiki/Q7501554","display_name":"Short-channel effect","level":5,"score":0.5226561427116394},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.5163149237632751},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46638157963752747},{"id":"https://openalex.org/C73118932","wikidata":"https://www.wikidata.org/wiki/Q5305541","display_name":"Drain-induced barrier lowering","level":5,"score":0.4345847964286804},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4231928586959839},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.3791985511779785},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2893980145454407},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2641909122467041},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23544833064079285},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.19548934698104858},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13192662596702576},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.062380820512771606},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.04951834678649902},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1016/s0026-2714(03)00179-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00179-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:www.research.unipd.it:11577/1341516","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/1341516","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:www.research.unipd.it:11577/2456604","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2456604","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:www.research.unipd.it:11577/2515355","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2515355","pdf_url":null,"source":{"id":"https://openalex.org/S4306402547","display_name":"Padua Research Archive (University of Padova)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/bookPart"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1977004753","https://openalex.org/W2002000485","https://openalex.org/W2042823366","https://openalex.org/W2060183600","https://openalex.org/W2097871221","https://openalex.org/W2105975916","https://openalex.org/W2134239028","https://openalex.org/W2136560998","https://openalex.org/W2138409152","https://openalex.org/W2145857748","https://openalex.org/W2156610011","https://openalex.org/W2158577145","https://openalex.org/W2162303635","https://openalex.org/W2169925409","https://openalex.org/W2532934857"],"related_works":["https://openalex.org/W2025921353","https://openalex.org/W2953908791","https://openalex.org/W1938836414","https://openalex.org/W3114054054","https://openalex.org/W2080688857","https://openalex.org/W2007783480","https://openalex.org/W1835724189","https://openalex.org/W2476331645","https://openalex.org/W2967799633","https://openalex.org/W2975003965"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}