{"id":"https://openalex.org/W2049345089","doi":"https://doi.org/10.1016/s0026-2714(03)00174-4","title":"New insights into the change of voltage acceleration and temperature activation of oxide breakdown","display_name":"New insights into the change of voltage acceleration and temperature activation of oxide breakdown","publication_year":2003,"publication_date":"2003-07-22","ids":{"openalex":"https://openalex.org/W2049345089","doi":"https://doi.org/10.1016/s0026-2714(03)00174-4","mag":"2049345089"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00174-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00174-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108775755","display_name":"G. Ribes","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"G. Ribes","raw_affiliation_strings":["STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078174490","display_name":"S. Bruy\u00e8re","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Bruy\u00e8re","raw_affiliation_strings":["STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085479051","display_name":"F. Monsieur","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"F. Monsieur","raw_affiliation_strings":["IMEP/ENSERG, UMR CNRS 5531, 23 rue des Martyrs, BP257, 38016 Grenoble, France","STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","STMicroelectronics, Central R&D labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","IMEP/ENSERG, UMR CNRS 5531, 23 rue des Martyrs, BP257 38016, Grenoble, France"],"affiliations":[{"raw_affiliation_string":"IMEP/ENSERG, UMR CNRS 5531, 23 rue des Martyrs, BP257, 38016 Grenoble, France","institution_ids":["https://openalex.org/I1294671590"]},{"raw_affiliation_string":"STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics, Central R&D labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"IMEP/ENSERG, UMR CNRS 5531, 23 rue des Martyrs, BP257 38016, Grenoble, France","institution_ids":["https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077755540","display_name":"D. Roy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"D. Roy","raw_affiliation_strings":["STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210104693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109198256","display_name":"V. Huard","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},{"id":"https://openalex.org/I4210165709","display_name":"Philips (France)","ror":"https://ror.org/05jz46060","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]}],"countries":["FR","NL"],"is_corresponding":false,"raw_author_name":"V. Huard","raw_affiliation_strings":["Philips Semiconductors, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","Philips Semiconductors, Central R&D labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France#TAB#"],"affiliations":[{"raw_affiliation_string":"Philips Semiconductors, Central R&D Labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France","institution_ids":["https://openalex.org/I4210165709"]},{"raw_affiliation_string":"Philips Semiconductors, Central R&D labs, 850 rue Jean Monnet, BP16, 38926 Crolles, France#TAB#","institution_ids":["https://openalex.org/I109147379"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5108775755"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.7051,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.72038806,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"43","issue":"8","first_page":"1211","last_page":"1214"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/activation-energy","display_name":"Activation energy","score":0.8331671953201294},{"id":"https://openalex.org/keywords/extrapolation","display_name":"Extrapolation","score":0.8254523277282715},{"id":"https://openalex.org/keywords/arrhenius-equation","display_name":"Arrhenius equation","score":0.7194215059280396},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.6371771693229675},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5653608441352844},{"id":"https://openalex.org/keywords/acceleration","display_name":"Acceleration","score":0.5653517246246338},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5638611316680908},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.5376667976379395},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5164023041725159},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.5055437088012695},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.48533597588539124},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.47647473216056824},{"id":"https://openalex.org/keywords/arrhenius-plot","display_name":"Arrhenius plot","score":0.4737342596054077},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.4630579650402069},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4370180666446686},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.36644071340560913},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33166810870170593},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.28370463848114014},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.2790316343307495},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.22760194540023804},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19813930988311768},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13518333435058594},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10512247681617737},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.09402003884315491},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08852207660675049},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.06661444902420044}],"concepts":[{"id":"https://openalex.org/C95121573","wikidata":"https://www.wikidata.org/wiki/Q190474","display_name":"Activation energy","level":2,"score":0.8331671953201294},{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.8254523277282715},{"id":"https://openalex.org/C86183883","wikidata":"https://www.wikidata.org/wiki/Q507505","display_name":"Arrhenius equation","level":3,"score":0.7194215059280396},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.6371771693229675},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5653608441352844},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.5653517246246338},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5638611316680908},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.5376667976379395},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5164023041725159},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.5055437088012695},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.48533597588539124},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.47647473216056824},{"id":"https://openalex.org/C8739425","wikidata":"https://www.wikidata.org/wiki/Q695171","display_name":"Arrhenius plot","level":3,"score":0.4737342596054077},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.4630579650402069},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4370180666446686},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.36644071340560913},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33166810870170593},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.28370463848114014},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.2790316343307495},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.22760194540023804},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19813930988311768},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13518333435058594},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10512247681617737},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.09402003884315491},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08852207660675049},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.06661444902420044},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00174-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00174-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2017694301","https://openalex.org/W2068172948","https://openalex.org/W2088225352","https://openalex.org/W2089797849","https://openalex.org/W2104139718"],"related_works":["https://openalex.org/W2093092532","https://openalex.org/W3215959151","https://openalex.org/W3127121085","https://openalex.org/W2072627505","https://openalex.org/W3089239053","https://openalex.org/W3123577906","https://openalex.org/W2088855430","https://openalex.org/W2076279650","https://openalex.org/W1976189486","https://openalex.org/W2077462785"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}