{"id":"https://openalex.org/W2033259020","doi":"https://doi.org/10.1016/s0026-2714(03)00093-3","title":"Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations","display_name":"Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations","publication_year":2003,"publication_date":"2003-05-19","ids":{"openalex":"https://openalex.org/W2033259020","doi":"https://doi.org/10.1016/s0026-2714(03)00093-3","mag":"2033259020"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00093-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00093-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103728309","display_name":"Takeshi Yanagisawa","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Takeshi Yanagisawa","raw_affiliation_strings":["Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan"],"affiliations":[{"raw_affiliation_string":"Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103525627","display_name":"Takeshi Kojima","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Kojima","raw_affiliation_strings":["Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan"],"affiliations":[{"raw_affiliation_string":"Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"Energy Electronics Institute, National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba-shi, Ibaraki 305-8568, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5103728309"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.2703,"has_fulltext":false,"cited_by_count":34,"citation_normalized_percentile":{"value":0.54839091,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"43","issue":"6","first_page":"977","last_page":"980"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.7162666916847229},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6672414541244507},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.663250744342804},{"id":"https://openalex.org/keywords/pulse","display_name":"Pulse (music)","score":0.6518863439559937},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6241863965988159},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.5586792230606079},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.46153295040130615},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.4461308419704437},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.44428056478500366},{"id":"https://openalex.org/keywords/blue-light","display_name":"Blue light","score":0.4387189745903015},{"id":"https://openalex.org/keywords/pulse-duration","display_name":"Pulse duration","score":0.425048828125},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25355640053749084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.24613675475120544},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.17702743411064148},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1759524941444397},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1448664665222168},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0618758499622345}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7162666916847229},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6672414541244507},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.663250744342804},{"id":"https://openalex.org/C2780167933","wikidata":"https://www.wikidata.org/wiki/Q1550652","display_name":"Pulse (music)","level":3,"score":0.6518863439559937},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6241863965988159},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.5586792230606079},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.46153295040130615},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4461308419704437},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44428056478500366},{"id":"https://openalex.org/C3017965124","wikidata":"https://www.wikidata.org/wiki/Q4929359","display_name":"Blue light","level":2,"score":0.4387189745903015},{"id":"https://openalex.org/C169150495","wikidata":"https://www.wikidata.org/wiki/Q7259675","display_name":"Pulse duration","level":3,"score":0.425048828125},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25355640053749084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.24613675475120544},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.17702743411064148},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1759524941444397},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1448664665222168},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0618758499622345},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00093-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00093-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2016743467","https://openalex.org/W2025202925","https://openalex.org/W2044827063","https://openalex.org/W2047330926","https://openalex.org/W2049026149","https://openalex.org/W2054227182","https://openalex.org/W2086172777"],"related_works":["https://openalex.org/W4281681099","https://openalex.org/W2371298155","https://openalex.org/W2359102146","https://openalex.org/W3035855245","https://openalex.org/W2071884304","https://openalex.org/W2090679090","https://openalex.org/W2157903899","https://openalex.org/W1646776797","https://openalex.org/W1991322549","https://openalex.org/W4388473605"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":2},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}