{"id":"https://openalex.org/W2012474196","doi":"https://doi.org/10.1016/s0026-2714(03)00063-5","title":"The radiation sensitivity mapping of ICs using an IR pulsed laser system","display_name":"The radiation sensitivity mapping of ICs using an IR pulsed laser system","publication_year":2003,"publication_date":"2003-05-19","ids":{"openalex":"https://openalex.org/W2012474196","doi":"https://doi.org/10.1016/s0026-2714(03)00063-5","mag":"2012474196"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00063-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00063-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018514577","display_name":"B. Alpat","orcid":"https://orcid.org/0000-0002-0116-1506"},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"B. Alpat","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013442700","display_name":"R. Battiston","orcid":"https://orcid.org/0000-0002-5808-7239"},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Battiston","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034362442","display_name":"M. Bizzarri","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Bizzarri","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035399617","display_name":"Diego Caraffini","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Caraffini","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069225840","display_name":"E.M. Fiori","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Fiori","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079807888","display_name":"A. Papi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Papi","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064533361","display_name":"Marco Petasecca","orcid":"https://orcid.org/0000-0001-5958-7457"},"institutions":[{"id":"https://openalex.org/I4210163778","display_name":"Istituto Nazionale di Fisica Nucleare, Sezione di Perugia","ror":"https://ror.org/05478fx36","country_code":"IT","type":"facility","lineage":["https://openalex.org/I160013858","https://openalex.org/I4210163778"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"M. Petasecca","raw_affiliation_strings":["INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy"],"affiliations":[{"raw_affiliation_string":"INFN Sezione di Perugia, Dipartimento di Fisica dell\u2019Universita di Perugia, Via A. Pascoli 1, Perugia 06100, Italy","institution_ids":["https://openalex.org/I4210163778"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081588842","display_name":"A. Pontetti","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Pontetti","raw_affiliation_strings":["G&A Engineering, P.O. Box 59, Carsoli(AQ) 67061, Italy"],"affiliations":[{"raw_affiliation_string":"G&A Engineering, P.O. Box 59, Carsoli(AQ) 67061, Italy","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5064533361"],"corresponding_institution_ids":["https://openalex.org/I4210163778"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.7051,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.71397311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"43","issue":"6","first_page":"981","last_page":"984"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.728440523147583},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.6753373146057129},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.6384800672531128},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5570635199546814},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5437108874320984},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5003108978271484},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4855765700340271},{"id":"https://openalex.org/keywords/pulsed-laser","display_name":"Pulsed laser","score":0.4665944576263428},{"id":"https://openalex.org/keywords/nanosecond","display_name":"Nanosecond","score":0.4591275155544281},{"id":"https://openalex.org/keywords/radiation-sensitivity","display_name":"Radiation sensitivity","score":0.4265114665031433},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3966854214668274},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.36873307824134827},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3568088412284851},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3551030457019806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3362744450569153},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31485581398010254},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2738223969936371},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.24673256278038025},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.18246221542358398},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.09237605333328247}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.728440523147583},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.6753373146057129},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.6384800672531128},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5570635199546814},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5437108874320984},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5003108978271484},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4855765700340271},{"id":"https://openalex.org/C2778979257","wikidata":"https://www.wikidata.org/wiki/Q15928349","display_name":"Pulsed laser","level":3,"score":0.4665944576263428},{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.4591275155544281},{"id":"https://openalex.org/C26114605","wikidata":"https://www.wikidata.org/wiki/Q7280368","display_name":"Radiation sensitivity","level":3,"score":0.4265114665031433},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3966854214668274},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.36873307824134827},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3568088412284851},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3551030457019806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3362744450569153},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31485581398010254},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2738223969936371},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.24673256278038025},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.18246221542358398},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.09237605333328247}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(03)00063-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00063-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1535698551","https://openalex.org/W2029709875","https://openalex.org/W2050763555","https://openalex.org/W2109722177","https://openalex.org/W2131933442","https://openalex.org/W2137975278","https://openalex.org/W6632091930"],"related_works":["https://openalex.org/W1022990548","https://openalex.org/W2165367082","https://openalex.org/W1535508957","https://openalex.org/W2111485834","https://openalex.org/W1972641423","https://openalex.org/W2183559057","https://openalex.org/W8358306","https://openalex.org/W2216584887","https://openalex.org/W309165247","https://openalex.org/W2006106470"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}