{"id":"https://openalex.org/W2037960720","doi":"https://doi.org/10.1016/s0026-2714(03)00024-6","title":"MAGFET based current sensing for power integrated circuit","display_name":"MAGFET based current sensing for power integrated circuit","publication_year":2003,"publication_date":"2003-04-01","ids":{"openalex":"https://openalex.org/W2037960720","doi":"https://doi.org/10.1016/s0026-2714(03)00024-6","mag":"2037960720"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(03)00024-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00024-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018535961","display_name":"G. Busatto","orcid":"https://orcid.org/0000-0002-9558-2562"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Giovanni Busatto","raw_affiliation_strings":["Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015498295","display_name":"Roberto La Capruccia","orcid":null},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto La Capruccia","raw_affiliation_strings":["Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008783393","display_name":"Francesco Iannuzzo","orcid":"https://orcid.org/0000-0003-3949-2172"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Iannuzzo","raw_affiliation_strings":["Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041005052","display_name":"F. Velardi","orcid":"https://orcid.org/0000-0002-9422-4560"},"institutions":[{"id":"https://openalex.org/I186995768","display_name":"Universit\u00e0 degli studi di Cassino e del Lazio Meridionale","ror":"https://ror.org/04nxkaq16","country_code":"IT","type":"education","lineage":["https://openalex.org/I186995768"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Velardi","raw_affiliation_strings":["Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Automation, Electromagnetics, Information Engineering and Industrial Mathematics, DAEIMI, University of Cassino, Via G. Di Biasio, 43, 03043 Cassino, Italy","institution_ids":["https://openalex.org/I186995768"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027666807","display_name":"Roberto Roncella","orcid":"https://orcid.org/0000-0003-4087-9761"},"institutions":[{"id":"https://openalex.org/I108290504","display_name":"University of Pisa","ror":"https://ror.org/03ad39j10","country_code":"IT","type":"education","lineage":["https://openalex.org/I108290504"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Roberto Roncella","raw_affiliation_strings":["Department of Information Engineering, University of Pisa, Via Diotisalvi 2, Pisa, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Pisa, Via Diotisalvi 2, Pisa, Italy","institution_ids":["https://openalex.org/I108290504"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5018535961"],"corresponding_institution_ids":["https://openalex.org/I186995768"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":2.4677,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.88864113,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"43","issue":"4","first_page":"577","last_page":"583"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Plasma Diagnostics and Applications","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.74965500831604},{"id":"https://openalex.org/keywords/bicmos","display_name":"BiCMOS","score":0.7097695469856262},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6454418897628784},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5498521327972412},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5428183078765869},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.539713442325592},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5321651697158813},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5295615792274475},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5097100734710693},{"id":"https://openalex.org/keywords/power-mosfet","display_name":"Power MOSFET","score":0.49595698714256287},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.48501941561698914},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4563801884651184},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4424741566181183},{"id":"https://openalex.org/keywords/current-mirror","display_name":"Current mirror","score":0.4113457202911377},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3477397561073303},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.23527804017066956},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11381012201309204}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.74965500831604},{"id":"https://openalex.org/C62427370","wikidata":"https://www.wikidata.org/wiki/Q173416","display_name":"BiCMOS","level":4,"score":0.7097695469856262},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6454418897628784},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5498521327972412},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5428183078765869},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.539713442325592},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5321651697158813},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5295615792274475},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5097100734710693},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.49595698714256287},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.48501941561698914},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4563801884651184},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4424741566181183},{"id":"https://openalex.org/C173966970","wikidata":"https://www.wikidata.org/wiki/Q786012","display_name":"Current mirror","level":4,"score":0.4113457202911377},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3477397561073303},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.23527804017066956},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11381012201309204},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(03)00024-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(03)00024-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:arpi.unipi.it:11568/81577","is_oa":false,"landing_page_url":"http://hdl.handle.net/11568/81577","pdf_url":null,"source":{"id":"https://openalex.org/S4377196265","display_name":"CINECA IRIS Institutial research information system (University of Pisa)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I108290504","host_organization_name":"University of Pisa","host_organization_lineage":["https://openalex.org/I108290504"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1537774006","https://openalex.org/W1998592623","https://openalex.org/W2124683003","https://openalex.org/W2128881711","https://openalex.org/W2138043036","https://openalex.org/W2150080009","https://openalex.org/W6632335059","https://openalex.org/W6680633817","https://openalex.org/W6682190000"],"related_works":["https://openalex.org/W2160122484","https://openalex.org/W2184860653","https://openalex.org/W1992627288","https://openalex.org/W2167134364","https://openalex.org/W2217307244","https://openalex.org/W2124484215","https://openalex.org/W2111968304","https://openalex.org/W2047091966","https://openalex.org/W1923914176","https://openalex.org/W2542826540"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2016-06-24T00:00:00"}