{"id":"https://openalex.org/W2017451375","doi":"https://doi.org/10.1016/s0026-2714(02)00289-5","title":"Fabrication, characterisation and modelling of integrated on-silicon inductors","display_name":"Fabrication, characterisation and modelling of integrated on-silicon inductors","publication_year":2003,"publication_date":"2003-01-30","ids":{"openalex":"https://openalex.org/W2017451375","doi":"https://doi.org/10.1016/s0026-2714(02)00289-5","mag":"2017451375"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00289-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00289-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076645259","display_name":"Roberto S. Murphy\u2010Arteaga","orcid":"https://orcid.org/0000-0001-9664-9207"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"R Murphy-Arteaga","raw_affiliation_strings":["Department of Electronics, National Institute for Research on Astrophysics, Optics and Electronics (INAOE), Tonantzintla, Puebla 72840, Mexico"],"affiliations":[{"raw_affiliation_string":"Department of Electronics, National Institute for Research on Astrophysics, Optics and Electronics (INAOE), Tonantzintla, Puebla 72840, Mexico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5076645259"],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.3525,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.62068593,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"43","issue":"2","first_page":"195","last_page":"201"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.7288022041320801},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.5666776299476624},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4847531020641327},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.44780102372169495},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4045308828353882},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.351378858089447},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.32846108078956604},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.28900474309921265},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2721940279006958},{"id":"https://openalex.org/keywords/medicine","display_name":"Medicine","score":0.06480464339256287}],"concepts":[{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.7288022041320801},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.5666776299476624},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4847531020641327},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44780102372169495},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4045308828353882},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.351378858089447},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.32846108078956604},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.28900474309921265},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2721940279006958},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.06480464339256287},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00289-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00289-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4099999964237213,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321739","display_name":"Consejo Nacional de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/059ex5q34"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1486280429","https://openalex.org/W1554836583","https://openalex.org/W1569638374","https://openalex.org/W2010234719","https://openalex.org/W2015780315","https://openalex.org/W2102096768","https://openalex.org/W2109832933","https://openalex.org/W2128201718","https://openalex.org/W2131007377","https://openalex.org/W2133682407","https://openalex.org/W2137810177","https://openalex.org/W2145986836","https://openalex.org/W2160428624","https://openalex.org/W2169990802","https://openalex.org/W2170893069"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2027630214","https://openalex.org/W2082914599","https://openalex.org/W2756570351","https://openalex.org/W2165645320","https://openalex.org/W2080420513","https://openalex.org/W2048093852","https://openalex.org/W2118835423","https://openalex.org/W2068272758","https://openalex.org/W2384315251"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}