{"id":"https://openalex.org/W2047999515","doi":"https://doi.org/10.1016/s0026-2714(02)00243-3","title":"An analytical effective channel-length modulation model for velocity overshoot in submicron MOSFETs based on energy-balance formulation","display_name":"An analytical effective channel-length modulation model for velocity overshoot in submicron MOSFETs based on energy-balance formulation","publication_year":2002,"publication_date":"2002-11-11","ids":{"openalex":"https://openalex.org/W2047999515","doi":"https://doi.org/10.1016/s0026-2714(02)00243-3","mag":"2047999515"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00243-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00243-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007029790","display_name":"Kenneth Y. T. Lim","orcid":"https://orcid.org/0000-0003-3756-6625"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K.Y. Lim","raw_affiliation_strings":["Chartered Semiconductor Manufacturing Ltd., 60 Woodlands, Industrial Park D, Street 2, Singapore 738406","Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D Street 2 Singapore 738406"],"affiliations":[{"raw_affiliation_string":"Chartered Semiconductor Manufacturing Ltd., 60 Woodlands, Industrial Park D, Street 2, Singapore 738406","institution_ids":[]},{"raw_affiliation_string":"Chartered Semiconductor Manufacturing Ltd, 60 Woodlands Industrial Park D Street 2 Singapore 738406","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101851241","display_name":"Xing Zhou","orcid":"https://orcid.org/0000-0003-2509-6726"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"X. Zhou","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, South Spine, Block S1 Nanyang Avenue, Singapore 639798, Singapore","School of Electrical and Electronic Engineering, Nanyang Technological University, South Spine, Block S1, Nanyang Avenue, Singapore 639798, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, South Spine, Block S1 Nanyang Avenue, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, South Spine, Block S1, Nanyang Avenue, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5101851241"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":1.7124,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.8402978,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"42","issue":"12","first_page":"1857","last_page":"1864"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/channel-length-modulation","display_name":"Channel length modulation","score":0.7349457740783691},{"id":"https://openalex.org/keywords/velocity-saturation","display_name":"Velocity saturation","score":0.7230539917945862},{"id":"https://openalex.org/keywords/velocity-overshoot","display_name":"Velocity overshoot","score":0.7075809240341187},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.559341549873352},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5398818850517273},{"id":"https://openalex.org/keywords/saturation-velocity","display_name":"Saturation velocity","score":0.4938850998878479},{"id":"https://openalex.org/keywords/effective-mass","display_name":"Effective mass (spring\u2013mass system)","score":0.4921559691429138},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.48395541310310364},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.4595145285129547},{"id":"https://openalex.org/keywords/boltzmann-equation","display_name":"Boltzmann equation","score":0.45819103717803955},{"id":"https://openalex.org/keywords/saturation","display_name":"Saturation (graph theory)","score":0.45370548963546753},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.44790858030319214},{"id":"https://openalex.org/keywords/short-channel-effect","display_name":"Short-channel effect","score":0.43241095542907715},{"id":"https://openalex.org/keywords/momentum","display_name":"Momentum (technical analysis)","score":0.42831069231033325},{"id":"https://openalex.org/keywords/energy-balance","display_name":"Energy balance","score":0.42781710624694824},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4168641269207001},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4126489460468292},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.3905262351036072},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.29519617557525635},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2656121551990509},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2433897852897644},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2240568995475769},{"id":"https://openalex.org/keywords/classical-mechanics","display_name":"Classical mechanics","score":0.16852596402168274},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.14537924528121948},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.09599730372428894},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.0890345573425293}],"concepts":[{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.7349457740783691},{"id":"https://openalex.org/C187370908","wikidata":"https://www.wikidata.org/wiki/Q7426597","display_name":"Velocity saturation","level":5,"score":0.7230539917945862},{"id":"https://openalex.org/C2779364907","wikidata":"https://www.wikidata.org/wiki/Q2512560","display_name":"Velocity overshoot","level":3,"score":0.7075809240341187},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.559341549873352},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5398818850517273},{"id":"https://openalex.org/C151431374","wikidata":"https://www.wikidata.org/wiki/Q7426597","display_name":"Saturation velocity","level":4,"score":0.4938850998878479},{"id":"https://openalex.org/C179764930","wikidata":"https://www.wikidata.org/wiki/Q3509437","display_name":"Effective mass (spring\u2013mass system)","level":2,"score":0.4921559691429138},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.48395541310310364},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.4595145285129547},{"id":"https://openalex.org/C165995430","wikidata":"https://www.wikidata.org/wiki/Q891653","display_name":"Boltzmann equation","level":2,"score":0.45819103717803955},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.45370548963546753},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.44790858030319214},{"id":"https://openalex.org/C11918236","wikidata":"https://www.wikidata.org/wiki/Q7501554","display_name":"Short-channel effect","level":5,"score":0.43241095542907715},{"id":"https://openalex.org/C60718061","wikidata":"https://www.wikidata.org/wiki/Q1414747","display_name":"Momentum (technical analysis)","level":2,"score":0.42831069231033325},{"id":"https://openalex.org/C2777423268","wikidata":"https://www.wikidata.org/wiki/Q3663116","display_name":"Energy balance","level":2,"score":0.42781710624694824},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4168641269207001},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4126489460468292},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.3905262351036072},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.29519617557525635},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2656121551990509},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2433897852897644},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2240568995475769},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.16852596402168274},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.14537924528121948},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.09599730372428894},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0890345573425293},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00243-3","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00243-3","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W28442029","https://openalex.org/W1533614470","https://openalex.org/W1555969351","https://openalex.org/W2040374961","https://openalex.org/W2083044164","https://openalex.org/W2083202708","https://openalex.org/W2100039051","https://openalex.org/W2111758240","https://openalex.org/W2115282592","https://openalex.org/W2118199775","https://openalex.org/W2127907275","https://openalex.org/W2143170485","https://openalex.org/W2170023501","https://openalex.org/W2172056977","https://openalex.org/W4256041942"],"related_works":["https://openalex.org/W1983187918","https://openalex.org/W1975197272","https://openalex.org/W19431536","https://openalex.org/W2169508122","https://openalex.org/W1973589220","https://openalex.org/W1545743055","https://openalex.org/W2087816533","https://openalex.org/W2031773651","https://openalex.org/W2075070740","https://openalex.org/W2143024227"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":5},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}