{"id":"https://openalex.org/W2091077611","doi":"https://doi.org/10.1016/s0026-2714(02)00167-1","title":"Comprehensive failure analysis of leakage faults in bipolar transistors","display_name":"Comprehensive failure analysis of leakage faults in bipolar transistors","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2091077611","doi":"https://doi.org/10.1016/s0026-2714(02)00167-1","mag":"2091077611"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00167-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00167-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056764834","display_name":"B. Domeng\u00e8s","orcid":"https://orcid.org/0000-0002-2153-0620"},"institutions":[{"id":"https://openalex.org/I4210165709","display_name":"Philips (France)","ror":"https://ror.org/05jz46060","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"B. Domeng\u00e8s","raw_affiliation_strings":["LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France"],"affiliations":[{"raw_affiliation_string":"LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France","institution_ids":["https://openalex.org/I4210165709"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109225611","display_name":"P. Schwindenhammer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165709","display_name":"Philips (France)","ror":"https://ror.org/05jz46060","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Schwindenhammer","raw_affiliation_strings":["LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France"],"affiliations":[{"raw_affiliation_string":"LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France","institution_ids":["https://openalex.org/I4210165709"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063416179","display_name":"Patrick Poirier","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165709","display_name":"Philips (France)","ror":"https://ror.org/05jz46060","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"P. Poirier","raw_affiliation_strings":["LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France"],"affiliations":[{"raw_affiliation_string":"LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France","institution_ids":["https://openalex.org/I4210165709"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009289590","display_name":"F. Beaudoin","orcid":"https://orcid.org/0000-0002-2453-052X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"F. Beaudoin","raw_affiliation_strings":["CNES-THALES laboratory, 18 avenue Edouard Belin, 31401 Toulouse, France"],"affiliations":[{"raw_affiliation_string":"CNES-THALES laboratory, 18 avenue Edouard Belin, 31401 Toulouse, France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081001520","display_name":"Ph. Descamps","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165709","display_name":"Philips (France)","ror":"https://ror.org/05jz46060","country_code":"FR","type":"company","lineage":["https://openalex.org/I4210122849","https://openalex.org/I4210165709"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Ph. Descamps","raw_affiliation_strings":["LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France"],"affiliations":[{"raw_affiliation_string":"LAMIP, laboratoire de micro\u00e9lectronique ISMRA-Philips, 2 rue de la Girafe BP 5120, 14079 Caen Cedex 5, France","institution_ids":["https://openalex.org/I4210165709"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5056764834"],"corresponding_institution_ids":["https://openalex.org/I4210165709"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1080053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"9-11","first_page":"1449","last_page":"1452"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.6605488061904907},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6579924821853638},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.652826726436615},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39778807759284973},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37251099944114685},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.3629685640335083},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3480902910232544},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3403472900390625},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.33548587560653687},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3298018276691437},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07049331068992615}],"concepts":[{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.6605488061904907},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6579924821853638},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.652826726436615},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39778807759284973},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37251099944114685},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3629685640335083},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3480902910232544},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3403472900390625},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.33548587560653687},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3298018276691437},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07049331068992615},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00167-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00167-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1840261322","https://openalex.org/W2508166434","https://openalex.org/W2599154556","https://openalex.org/W2542337556","https://openalex.org/W1989252915","https://openalex.org/W1926336129","https://openalex.org/W1981090320","https://openalex.org/W1680798740","https://openalex.org/W2545064755","https://openalex.org/W4324123959"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}