{"id":"https://openalex.org/W2094612565","doi":"https://doi.org/10.1016/s0026-2714(02)00160-9","title":"Statistical aspects of the degradation of LDD nMOSFETs","display_name":"Statistical aspects of the degradation of LDD nMOSFETs","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2094612565","doi":"https://doi.org/10.1016/s0026-2714(02)00160-9","mag":"2094612565"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00160-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00160-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008041479","display_name":"E. Andries","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127597","display_name":"Transnational University Limburg","ror":"https://ror.org/02xyaf767","country_code":"BE","type":"education","lineage":["https://openalex.org/I4210127597"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"E. Andries","raw_affiliation_strings":["Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium"],"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I4210127597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050998500","display_name":"R. Dreesen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210129335","display_name":"International Association of Public Transport","ror":"https://ror.org/036e7je91","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210129335"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"R. Dreesen","raw_affiliation_strings":["XPEQT, Transportstraat 1, 3980 Tessenderlo, Belgium"],"affiliations":[{"raw_affiliation_string":"XPEQT, Transportstraat 1, 3980 Tessenderlo, Belgium","institution_ids":["https://openalex.org/I4210129335"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080591280","display_name":"Kristof Croes","orcid":"https://orcid.org/0000-0002-3955-0638"},"institutions":[{"id":"https://openalex.org/I4210129335","display_name":"International Association of Public Transport","ror":"https://ror.org/036e7je91","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210129335"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"K. Croes","raw_affiliation_strings":["XPEQT, Transportstraat 1, 3980 Tessenderlo, Belgium"],"affiliations":[{"raw_affiliation_string":"XPEQT, Transportstraat 1, 3980 Tessenderlo, Belgium","institution_ids":["https://openalex.org/I4210129335"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043327590","display_name":"W. De Ceuninck","orcid":"https://orcid.org/0000-0002-4630-5569"},"institutions":[{"id":"https://openalex.org/I4210127597","display_name":"Transnational University Limburg","ror":"https://ror.org/02xyaf767","country_code":"BE","type":"education","lineage":["https://openalex.org/I4210127597"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"W. De Ceuninck","raw_affiliation_strings":["Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium"],"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I4210127597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113705715","display_name":"L. De Schepper","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127597","display_name":"Transnational University Limburg","ror":"https://ror.org/02xyaf767","country_code":"BE","type":"education","lineage":["https://openalex.org/I4210127597"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"L. De Schepper","raw_affiliation_strings":["Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium"],"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I4210127597"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020367935","display_name":"G. Groeseneken","orcid":"https://orcid.org/0000-0003-3763-2098"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Groeseneken","raw_affiliation_strings":["IMEC, Kapeldreef 75, 3001 Heverlee, Belgium","IMEC, Kapeldreef 75, 3001, Heverlee, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001 Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"IMEC, Kapeldreef 75, 3001, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110185369","display_name":"K.F. Lo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K.F. Lo","raw_affiliation_strings":["Chartered Semiconductor Manufactering Ltd, 60 Woodlands Industrial ParkD, Street 2, 738406 Singapore"],"affiliations":[{"raw_affiliation_string":"Chartered Semiconductor Manufactering Ltd, 60 Woodlands Industrial ParkD, Street 2, 738406 Singapore","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089672581","display_name":"M. D\u2019Olieslaeger","orcid":"https://orcid.org/0000-0001-7951-8037"},"institutions":[{"id":"https://openalex.org/I4210127597","display_name":"Transnational University Limburg","ror":"https://ror.org/02xyaf767","country_code":"BE","type":"education","lineage":["https://openalex.org/I4210127597"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. D\u2019Olieslaeger","raw_affiliation_strings":["Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium"],"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I4210127597"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087263677","display_name":"Jan D\u2019Haen","orcid":"https://orcid.org/0000-0003-4487-3885"},"institutions":[{"id":"https://openalex.org/I4210127597","display_name":"Transnational University Limburg","ror":"https://ror.org/02xyaf767","country_code":"BE","type":"education","lineage":["https://openalex.org/I4210127597"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. D\u2019Haen","raw_affiliation_strings":["Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium"],"affiliations":[{"raw_affiliation_string":"Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, 3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I4210127597"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5008041479"],"corresponding_institution_ids":["https://openalex.org/I4210127597"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15974252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"42","issue":"9-11","first_page":"1409","last_page":"1413"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9882000088691711,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.47092336416244507},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.4118187427520752},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3590509295463562},{"id":"https://openalex.org/keywords/humanities","display_name":"Humanities","score":0.32181185483932495},{"id":"https://openalex.org/keywords/art","display_name":"Art","score":0.31626635789871216},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3025206923484802},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.23128613829612732},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.18033376336097717},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.13352099061012268}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.47092336416244507},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.4118187427520752},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3590509295463562},{"id":"https://openalex.org/C15708023","wikidata":"https://www.wikidata.org/wiki/Q80083","display_name":"Humanities","level":1,"score":0.32181185483932495},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.31626635789871216},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3025206923484802},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.23128613829612732},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.18033376336097717},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.13352099061012268}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(02)00160-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00160-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:documentserver.uhasselt.be:1942/2511","is_oa":false,"landing_page_url":"http://hdl.handle.net/1942/2511","pdf_url":null,"source":{"id":"https://openalex.org/S4306401926","display_name":"Document Server@UHasselt (UHasselt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I878454856","host_organization_name":"Hasselt University","host_organization_lineage":["https://openalex.org/I878454856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4387497383","https://openalex.org/W3183948672","https://openalex.org/W3173606202","https://openalex.org/W3110381201","https://openalex.org/W2948807893","https://openalex.org/W2935909890","https://openalex.org/W2778153218","https://openalex.org/W2758277628","https://openalex.org/W2748952813","https://openalex.org/W1531601525"],"abstract_inverted_index":null,"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}