{"id":"https://openalex.org/W2054971883","doi":"https://doi.org/10.1016/s0026-2714(02)00146-4","title":"How reliable are reliability tests?","display_name":"How reliable are reliability tests?","publication_year":2002,"publication_date":"2002-09-01","ids":{"openalex":"https://openalex.org/W2054971883","doi":"https://doi.org/10.1016/s0026-2714(02)00146-4","mag":"2054971883"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00146-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00146-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5024142611","display_name":"L. Tielemans","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"L. Tielemans","raw_affiliation_strings":["Chiron Pte Ltd, 21 Woodlands Industrial Park El #02-06, Singapore 757720, Singapore","ESE bvba, Voorteinde 45, B-2260 Westerlo, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chiron Pte Ltd, 21 Woodlands Industrial Park El #02-06, Singapore 757720, Singapore","institution_ids":[]},{"raw_affiliation_string":"ESE bvba, Voorteinde 45, B-2260 Westerlo, Belgium","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003892450","display_name":"R.T.H. Rongen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210122849","display_name":"Philips (Netherlands)","ror":"https://ror.org/02p2bgp27","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R. Rongen","raw_affiliation_strings":["Philips, Gerstweg, NL-6534 AE Nijmegen, Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Philips, Gerstweg, NL-6534 AE Nijmegen, Netherlands","institution_ids":["https://openalex.org/I4210122849"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043327590","display_name":"W. De Ceuninck","orcid":"https://orcid.org/0000-0002-4630-5569"},"institutions":[{"id":"https://openalex.org/I878454856","display_name":"Hasselt University","ror":"https://ror.org/04nbhqj75","country_code":"BE","type":"education","lineage":["https://openalex.org/I878454856"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"W. De Ceuninck","raw_affiliation_strings":["LUC-IMO, Wetenschapsparkl, B-3590 Diepenbeek, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"LUC-IMO, Wetenschapsparkl, B-3590 Diepenbeek, Belgium","institution_ids":["https://openalex.org/I878454856"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5024142611"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.20344502,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"42","issue":"9-11","first_page":"1339","last_page":"1345"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.696399986743927,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.696399986743927,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7966892719268799},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6784153580665588},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47922569513320923},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2581152021884918},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07233399152755737}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7966892719268799},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6784153580665588},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47922569513320923},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2581152021884918},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07233399152755737},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(02)00146-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00146-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:documentserver.uhasselt.be:1942/2536","is_oa":false,"landing_page_url":"http://hdl.handle.net/1942/2536","pdf_url":null,"source":{"id":"https://openalex.org/S4306401926","display_name":"Document Server@UHasselt (UHasselt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I878454856","host_organization_name":"Hasselt University","host_organization_lineage":["https://openalex.org/I878454856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4000000059604645,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":null,"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}