{"id":"https://openalex.org/W2093848899","doi":"https://doi.org/10.1016/s0026-2714(02)00126-9","title":"Integrated process capability analysis with an application in backlight module","display_name":"Integrated process capability analysis with an application in backlight module","publication_year":2002,"publication_date":"2002-11-11","ids":{"openalex":"https://openalex.org/W2093848899","doi":"https://doi.org/10.1016/s0026-2714(02)00126-9","mag":"2093848899"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00126-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00126-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077824437","display_name":"Mao Lin Huang","orcid":"https://orcid.org/0000-0002-6896-6480"},"institutions":[{"id":"https://openalex.org/I65446980","display_name":"National Chin-Yi University of Technology","ror":"https://ror.org/040bs6h16","country_code":"TW","type":"education","lineage":["https://openalex.org/I65446980"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"M.L. Huang","raw_affiliation_strings":["Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC","institution_ids":["https://openalex.org/I65446980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082024932","display_name":"Kuen\u2010Suan Chen","orcid":"https://orcid.org/0000-0002-1091-6392"},"institutions":[{"id":"https://openalex.org/I65446980","display_name":"National Chin-Yi University of Technology","ror":"https://ror.org/040bs6h16","country_code":"TW","type":"education","lineage":["https://openalex.org/I65446980"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"K.S. Chen","raw_affiliation_strings":["Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC","institution_ids":["https://openalex.org/I65446980"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085848841","display_name":"Yu-Cherng Hung","orcid":"https://orcid.org/0000-0002-1604-5022"},"institutions":[{"id":"https://openalex.org/I65446980","display_name":"National Chin-Yi University of Technology","ror":"https://ror.org/040bs6h16","country_code":"TW","type":"education","lineage":["https://openalex.org/I65446980"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Y.H. Hung","raw_affiliation_strings":["Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering and Management, National Chin-Yi Institute of Technology, 35, Lane 215, Sec. 1, Chung san Rd, Taiping, Taichung 411, Taiwan, ROC","institution_ids":["https://openalex.org/I65446980"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077824437"],"corresponding_institution_ids":["https://openalex.org/I65446980"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":2.5803,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.90971988,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"42","issue":"12","first_page":"2009","last_page":"2014"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11798","display_name":"Optimal Experimental Design Methods","score":0.9839000105857849,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/backlight","display_name":"Backlight","score":0.9817074537277222},{"id":"https://openalex.org/keywords/process-capability-index","display_name":"Process capability index","score":0.7688770890235901},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.7416878938674927},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.7387441396713257},{"id":"https://openalex.org/keywords/process-capability","display_name":"Process capability","score":0.47635698318481445},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4414594769477844},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.42609232664108276},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4250166714191437},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4198070764541626},{"id":"https://openalex.org/keywords/fluorescent-lamp","display_name":"Fluorescent lamp","score":0.4135863184928894},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3657037615776062},{"id":"https://openalex.org/keywords/work-in-process","display_name":"Work in process","score":0.2561679780483246},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18318146467208862},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1324440836906433},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1262868046760559},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.07163092494010925}],"concepts":[{"id":"https://openalex.org/C171107226","wikidata":"https://www.wikidata.org/wiki/Q574291","display_name":"Backlight","level":3,"score":0.9817074537277222},{"id":"https://openalex.org/C190190378","wikidata":"https://www.wikidata.org/wiki/Q1192625","display_name":"Process capability index","level":3,"score":0.7688770890235901},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.7416878938674927},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.7387441396713257},{"id":"https://openalex.org/C91439571","wikidata":"https://www.wikidata.org/wiki/Q1279773","display_name":"Process capability","level":3,"score":0.47635698318481445},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4414594769477844},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.42609232664108276},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4250166714191437},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4198070764541626},{"id":"https://openalex.org/C2776018380","wikidata":"https://www.wikidata.org/wiki/Q182925","display_name":"Fluorescent lamp","level":2,"score":0.4135863184928894},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3657037615776062},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.2561679780483246},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18318146467208862},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1324440836906433},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1262868046760559},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.07163092494010925},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00126-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00126-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6499999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W62760974","https://openalex.org/W152569421","https://openalex.org/W1530884268","https://openalex.org/W1593449005","https://openalex.org/W1964010339","https://openalex.org/W1975975526","https://openalex.org/W1982417185","https://openalex.org/W2005140506","https://openalex.org/W2018330930","https://openalex.org/W2029554895","https://openalex.org/W2031255662","https://openalex.org/W2128701490","https://openalex.org/W2163904704","https://openalex.org/W2170789143","https://openalex.org/W2979075442","https://openalex.org/W4230917442","https://openalex.org/W4235581671","https://openalex.org/W6768886949"],"related_works":["https://openalex.org/W2076311047","https://openalex.org/W1549701406","https://openalex.org/W159189194","https://openalex.org/W1966013504","https://openalex.org/W2170887335","https://openalex.org/W2057254578","https://openalex.org/W2210286149","https://openalex.org/W2200240284","https://openalex.org/W1586108808","https://openalex.org/W2113432892"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":3}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}