{"id":"https://openalex.org/W1989429054","doi":"https://doi.org/10.1016/s0026-2714(02)00072-0","title":"Erratum to \u201cThe effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures\u201d [Microelectronics Reliability 2001;41:927\u2013931]","display_name":"Erratum to \u201cThe effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures\u201d [Microelectronics Reliability 2001;41:927\u2013931]","publication_year":2002,"publication_date":"2002-06-01","ids":{"openalex":"https://openalex.org/W1989429054","doi":"https://doi.org/10.1016/s0026-2714(02)00072-0","mag":"1989429054"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00072-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00072-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"erratum","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030186745","display_name":"Ling\u2010Feng Mao","orcid":"https://orcid.org/0000-0001-8886-2315"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lingfeng Mao","raw_affiliation_strings":["Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111773393","display_name":"Changhua Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changhua Tan","raw_affiliation_strings":["Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028367322","display_name":"Mingzhen Xu","orcid":"https://orcid.org/0000-0002-4587-7581"},"institutions":[{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]},{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingzhen Xu","raw_affiliation_strings":["Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, 100871, People's Republic of China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5030186745"],"corresponding_institution_ids":["https://openalex.org/I4210119392","https://openalex.org/I20231570"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12267845,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"6","first_page":"991","last_page":"991"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.8083888292312622},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.7606292963027954},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7562023401260376},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.475910484790802},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.46988987922668457},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46127888560295105},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.45222100615501404},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43035799264907837},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.40607237815856934},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.3483142852783203},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.34184274077415466},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23328956961631775},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22165361046791077},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.06950271129608154},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.05403062701225281}],"concepts":[{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.8083888292312622},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.7606292963027954},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7562023401260376},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.475910484790802},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.46988987922668457},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46127888560295105},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.45222100615501404},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43035799264907837},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40607237815856934},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.3483142852783203},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.34184274077415466},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23328956961631775},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22165361046791077},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.06950271129608154},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.05403062701225281}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00072-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00072-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7599999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1981400123","https://openalex.org/W3016525403","https://openalex.org/W1971021667","https://openalex.org/W1520169471","https://openalex.org/W3206835165","https://openalex.org/W2527728814","https://openalex.org/W1986765550","https://openalex.org/W2380711420","https://openalex.org/W1535188787","https://openalex.org/W653526669"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}