{"id":"https://openalex.org/W1973700564","doi":"https://doi.org/10.1016/s0026-2714(02)00021-5","title":"High temperature reliability testing of aluminum and tantalum electrolytic capacitors","display_name":"High temperature reliability testing of aluminum and tantalum electrolytic capacitors","publication_year":2002,"publication_date":"2002-06-01","ids":{"openalex":"https://openalex.org/W1973700564","doi":"https://doi.org/10.1016/s0026-2714(02)00021-5","mag":"1973700564"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(02)00021-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00021-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065779558","display_name":"A. Dehbi","orcid":null},"institutions":[{"id":"https://openalex.org/I891521709","display_name":"Daimler (Germany)","ror":"https://ror.org/00m0j3d84","country_code":"DE","type":"company","lineage":["https://openalex.org/I891521709"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"A. Dehbi","raw_affiliation_strings":["Daimler Chrysler AG Research and Technology, Goldsteinstrasse 235, D-60528 Frankfurt am Main, Germany"],"affiliations":[{"raw_affiliation_string":"Daimler Chrysler AG Research and Technology, Goldsteinstrasse 235, D-60528 Frankfurt am Main, Germany","institution_ids":["https://openalex.org/I891521709"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020791185","display_name":"W. Wondrak","orcid":null},"institutions":[{"id":"https://openalex.org/I891521709","display_name":"Daimler (Germany)","ror":"https://ror.org/00m0j3d84","country_code":"DE","type":"company","lineage":["https://openalex.org/I891521709"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W. Wondrak","raw_affiliation_strings":["Daimler Chrysler AG Research and Technology, Goldsteinstrasse 235, D-60528 Frankfurt am Main, Germany"],"affiliations":[{"raw_affiliation_string":"Daimler Chrysler AG Research and Technology, Goldsteinstrasse 235, D-60528 Frankfurt am Main, Germany","institution_ids":["https://openalex.org/I891521709"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043837649","display_name":"Yves Ousten","orcid":"https://orcid.org/0000-0002-3315-057X"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Y. Ousten","raw_affiliation_strings":["Universit\u00e9 de Bordeaux 1\u2013\u2013CNRS UMR 5818\u2013\u2013ENSEIRB France IXL 351, Cours de la lib\u00e9ration, 33405 Talence C\u00e9dex, France"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 de Bordeaux 1\u2013\u2013CNRS UMR 5818\u2013\u2013ENSEIRB France IXL 351, Cours de la lib\u00e9ration, 33405 Talence C\u00e9dex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I1294671590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108505439","display_name":"Y. Danto","orcid":null},"institutions":[{"id":"https://openalex.org/I15057530","display_name":"Universit\u00e9 de Bordeaux","ror":"https://ror.org/057qpr032","country_code":"FR","type":"education","lineage":["https://openalex.org/I15057530"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Y. Danto","raw_affiliation_strings":["Universit\u00e9 de Bordeaux 1\u2013\u2013CNRS UMR 5818\u2013\u2013ENSEIRB France IXL 351, Cours de la lib\u00e9ration, 33405 Talence C\u00e9dex, France"],"affiliations":[{"raw_affiliation_string":"Universit\u00e9 de Bordeaux 1\u2013\u2013CNRS UMR 5818\u2013\u2013ENSEIRB France IXL 351, Cours de la lib\u00e9ration, 33405 Talence C\u00e9dex, France","institution_ids":["https://openalex.org/I15057530","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5065779558"],"corresponding_institution_ids":["https://openalex.org/I891521709"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.11843281,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"42","issue":"6","first_page":"835","last_page":"840"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9757000207901001,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9599999785423279,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tantalum-capacitor","display_name":"Tantalum capacitor","score":0.9219164252281189},{"id":"https://openalex.org/keywords/electrolytic-capacitor","display_name":"Electrolytic capacitor","score":0.9209713339805603},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.849647045135498},{"id":"https://openalex.org/keywords/tantalum","display_name":"Tantalum","score":0.7116051316261292},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6734161376953125},{"id":"https://openalex.org/keywords/film-capacitor","display_name":"Film capacitor","score":0.5749973058700562},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.4990088939666748},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.47817689180374146},{"id":"https://openalex.org/keywords/accelerated-life-testing","display_name":"Accelerated life testing","score":0.47773832082748413},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43772587180137634},{"id":"https://openalex.org/keywords/aluminium","display_name":"Aluminium","score":0.42297104001045227},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.38712453842163086},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38650381565093994},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.32773154973983765},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2975369095802307},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.27321919798851013},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.16164591908454895}],"concepts":[{"id":"https://openalex.org/C51968632","wikidata":"https://www.wikidata.org/wiki/Q357010","display_name":"Tantalum capacitor","level":5,"score":0.9219164252281189},{"id":"https://openalex.org/C79100374","wikidata":"https://www.wikidata.org/wiki/Q1326992","display_name":"Electrolytic capacitor","level":4,"score":0.9209713339805603},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.849647045135498},{"id":"https://openalex.org/C514619126","wikidata":"https://www.wikidata.org/wiki/Q1123","display_name":"Tantalum","level":2,"score":0.7116051316261292},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6734161376953125},{"id":"https://openalex.org/C6432897","wikidata":"https://www.wikidata.org/wiki/Q145796","display_name":"Film capacitor","level":4,"score":0.5749973058700562},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.4990088939666748},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.47817689180374146},{"id":"https://openalex.org/C158379689","wikidata":"https://www.wikidata.org/wiki/Q3533504","display_name":"Accelerated life testing","level":3,"score":0.47773832082748413},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43772587180137634},{"id":"https://openalex.org/C513153333","wikidata":"https://www.wikidata.org/wiki/Q663","display_name":"Aluminium","level":2,"score":0.42297104001045227},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.38712453842163086},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38650381565093994},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.32773154973983765},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2975369095802307},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.27321919798851013},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.16164591908454895},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C101433766","wikidata":"https://www.wikidata.org/wiki/Q3543263","display_name":"Maturity (psychological)","level":2,"score":0.0},{"id":"https://openalex.org/C138496976","wikidata":"https://www.wikidata.org/wiki/Q175002","display_name":"Developmental psychology","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(02)00021-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(02)00021-5","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5600000023841858,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1987543050","https://openalex.org/W4200396216","https://openalex.org/W2055471543","https://openalex.org/W2039437343","https://openalex.org/W2138552090","https://openalex.org/W4229562063","https://openalex.org/W3088020675","https://openalex.org/W1965104664","https://openalex.org/W2062710868","https://openalex.org/W2302135577"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":4},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}