{"id":"https://openalex.org/W2144700144","doi":"https://doi.org/10.1016/s0026-2714(01)00259-1","title":"Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs","display_name":"Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs","publication_year":2002,"publication_date":"2002-03-01","ids":{"openalex":"https://openalex.org/W2144700144","doi":"https://doi.org/10.1016/s0026-2714(01)00259-1","mag":"2144700144"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00259-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00259-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://stars.library.ucf.edu/facultybib2000/3323","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086094705","display_name":"Juin J. Liou","orcid":"https://orcid.org/0000-0002-5815-5078"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]},{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN","US"],"is_corresponding":true,"raw_author_name":"Juin J. Liou","raw_affiliation_strings":["Department of Electronics Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China","School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China","institution_ids":["https://openalex.org/I47720641"]},{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030816190","display_name":"Rozina Shireen","orcid":null},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Shireen","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089567263","display_name":"A. Ort\u00edz-Conde","orcid":"https://orcid.org/0000-0001-5073-5396"},"institutions":[{"id":"https://openalex.org/I629287","display_name":"Sim\u00f3n Bol\u00edvar University","ror":"https://ror.org/01ak5cj98","country_code":"VE","type":"education","lineage":["https://openalex.org/I629287"]}],"countries":["VE"],"is_corresponding":false,"raw_author_name":"A. Ortiz-Conde","raw_affiliation_strings":["Laboratorio de Electr\u00f3nica del Estado S\u00f3lido (LEES), Universidad Sim\u00f3n Bol\u0131\u0301var, Apartado Postal 89000, Caracas 1080A, Venezuela"],"affiliations":[{"raw_affiliation_string":"Laboratorio de Electr\u00f3nica del Estado S\u00f3lido (LEES), Universidad Sim\u00f3n Bol\u0131\u0301var, Apartado Postal 89000, Caracas 1080A, Venezuela","institution_ids":["https://openalex.org/I629287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080180972","display_name":"Francisco J. Garc\u00eda-S\u00e1nchez","orcid":"https://orcid.org/0000-0002-0868-9792"},"institutions":[{"id":"https://openalex.org/I629287","display_name":"Sim\u00f3n Bol\u00edvar University","ror":"https://ror.org/01ak5cj98","country_code":"VE","type":"education","lineage":["https://openalex.org/I629287"]}],"countries":["VE"],"is_corresponding":false,"raw_author_name":"F.J. Garc\u0131\u0301a S\u00e1nchez","raw_affiliation_strings":["Laboratorio de Electr\u00f3nica del Estado S\u00f3lido (LEES), Universidad Sim\u00f3n Bol\u0131\u0301var, Apartado Postal 89000, Caracas 1080A, Venezuela"],"affiliations":[{"raw_affiliation_string":"Laboratorio de Electr\u00f3nica del Estado S\u00f3lido (LEES), Universidad Sim\u00f3n Bol\u0131\u0301var, Apartado Postal 89000, Caracas 1080A, Venezuela","institution_ids":["https://openalex.org/I629287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043666384","display_name":"A. Cerdeira","orcid":"https://orcid.org/0000-0002-2114-2468"},"institutions":[{"id":"https://openalex.org/I68368234","display_name":"Center for Research and Advanced Studies of the National Polytechnic Institute","ror":"https://ror.org/009eqmr18","country_code":"MX","type":"facility","lineage":["https://openalex.org/I59361560","https://openalex.org/I68368234"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"A. Cerdeira","raw_affiliation_strings":["Seccio\u0301n de Electro\u0301nica del Estado So\u0301lido (SEES), Departamento de Ingenier\u0131\u0301a Ele\u0301ctrica, CINVESTAV-IPN, Avenida IPN No. 2508, Apartado Postal 14-740, 07300 DF, Mexico"],"affiliations":[{"raw_affiliation_string":"Seccio\u0301n de Electro\u0301nica del Estado So\u0301lido (SEES), Departamento de Ingenier\u0131\u0301a Ele\u0301ctrica, CINVESTAV-IPN, Avenida IPN No. 2508, Apartado Postal 14-740, 07300 DF, Mexico","institution_ids":["https://openalex.org/I68368234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050743230","display_name":"Xiaofang Gao","orcid":"https://orcid.org/0009-0003-1294-9707"},"institutions":[{"id":"https://openalex.org/I106165777","display_name":"University of Central Florida","ror":"https://ror.org/036nfer12","country_code":"US","type":"education","lineage":["https://openalex.org/I106165777"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"X. Gao","raw_affiliation_strings":["School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Computer Science, University of Central Florida, Orlando, FL 32816-2450, USA","institution_ids":["https://openalex.org/I106165777"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073441672","display_name":"Xuecheng Zou","orcid":"https://orcid.org/0000-0002-6404-5270"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xuecheng Zou","raw_affiliation_strings":["Department of Electronics Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China"],"affiliations":[{"raw_affiliation_string":"Department of Electronics Science and Technology, Huazhong University of Science and Technology, Wuhan 430074, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053201835","display_name":"Chia-Tung Ho","orcid":"https://orcid.org/0000-0002-6479-7552"},"institutions":[{"id":"https://openalex.org/I4210136179","display_name":"ProMOS Technologies (Taiwan)","ror":"https://ror.org/04d8ddk13","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210136179"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"C.S. Ho","raw_affiliation_strings":["R&D Division, ProMOS Technologies Inc., Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"R&D Division, ProMOS Technologies Inc., Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210136179"]}]}],"institutions":[],"countries_distinct_count":5,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5086094705"],"corresponding_institution_ids":["https://openalex.org/I106165777","https://openalex.org/I47720641"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.22796563,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"42","issue":"3","first_page":"343","last_page":"347"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.829767107963562},{"id":"https://openalex.org/keywords/polysilicon-depletion-effect","display_name":"Polysilicon depletion effect","score":0.6811738014221191},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.634597897529602},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6090483069419861},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5271154046058655},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4572735130786896},{"id":"https://openalex.org/keywords/subthreshold-slope","display_name":"Subthreshold slope","score":0.4513014853000641},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.43683740496635437},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.26306530833244324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2129371464252472},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.19874778389930725},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08215618133544922}],"concepts":[{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.829767107963562},{"id":"https://openalex.org/C25356406","wikidata":"https://www.wikidata.org/wiki/Q7226935","display_name":"Polysilicon depletion effect","level":5,"score":0.6811738014221191},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.634597897529602},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6090483069419861},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5271154046058655},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4572735130786896},{"id":"https://openalex.org/C103566474","wikidata":"https://www.wikidata.org/wiki/Q7632226","display_name":"Subthreshold slope","level":5,"score":0.4513014853000641},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.43683740496635437},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.26306530833244324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2129371464252472},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.19874778389930725},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08215618133544922}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1016/s0026-2714(01)00259-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00259-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-4322","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/3323","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"},{"id":"pmh:oai:stars.library.ucf.edu:scopus2000-3869","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/scopus2000/2870","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Scopus Export 2000s","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:stars.library.ucf.edu:facultybib2000-4322","is_oa":true,"landing_page_url":"https://stars.library.ucf.edu/facultybib2000/3323","pdf_url":null,"source":{"id":"https://openalex.org/S4210172555","display_name":"Journal of International Crisis and Risk Communication Research","issn_l":"2576-0017","issn":["2576-0017","2576-0025"],"is_oa":true,"is_in_doaj":false,"is_core":true,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Faculty Bibliography 2000s","raw_type":"text"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W604686829","https://openalex.org/W1238930738","https://openalex.org/W1533614470","https://openalex.org/W1979557487","https://openalex.org/W1991676338","https://openalex.org/W1996743061","https://openalex.org/W2042183812","https://openalex.org/W2097351633","https://openalex.org/W2113641153","https://openalex.org/W2129687167","https://openalex.org/W2135844638","https://openalex.org/W2166745230","https://openalex.org/W2317593644"],"related_works":["https://openalex.org/W1186362247","https://openalex.org/W1995720339","https://openalex.org/W2545890115","https://openalex.org/W2062469423","https://openalex.org/W2095078040","https://openalex.org/W2010066109","https://openalex.org/W1999741645","https://openalex.org/W2545707786","https://openalex.org/W2238105798","https://openalex.org/W2166758606"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}