{"id":"https://openalex.org/W2021338955","doi":"https://doi.org/10.1016/s0026-2714(01)00237-2","title":"Novel design of driver and ESD transistors with significantly reduced silicon area","display_name":"Novel design of driver and ESD transistors with significantly reduced silicon area","publication_year":2002,"publication_date":"2002-01-01","ids":{"openalex":"https://openalex.org/W2021338955","doi":"https://doi.org/10.1016/s0026-2714(01)00237-2","mag":"2021338955"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00237-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00237-2","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040779982","display_name":"K. Verhaege","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Koen G Verhaege","raw_affiliation_strings":["Sarnoff Corporation, 201 Washington Road, Princeton, NJ 08543, USA"],"affiliations":[{"raw_affiliation_string":"Sarnoff Corporation, 201 Washington Road, Princeton, NJ 08543, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009419159","display_name":"M. Mergens","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Markus Mergens","raw_affiliation_strings":["Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA"],"affiliations":[{"raw_affiliation_string":"Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114248303","display_name":"Christian Russ","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christian Russ","raw_affiliation_strings":["Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA"],"affiliations":[{"raw_affiliation_string":"Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015152775","display_name":"J. Armer","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"John Armer","raw_affiliation_strings":["Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA"],"affiliations":[{"raw_affiliation_string":"Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023192359","display_name":"P. Jozwiak","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Phillip Jozwiak","raw_affiliation_strings":["Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA"],"affiliations":[{"raw_affiliation_string":"Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5040779982"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.13365086,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"1","first_page":"3","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5871568918228149},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.5227366089820862},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39455515146255493},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.388803631067276},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.37224358320236206},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.34920626878738403},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05138245224952698}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5871568918228149},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.5227366089820862},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39455515146255493},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.388803631067276},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.37224358320236206},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.34920626878738403},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05138245224952698}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(01)00237-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00237-2","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.454.6318","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.454.6318","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.sofics.com/files/paper/2000 ESD BEB X.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1480970403","https://openalex.org/W1488617323","https://openalex.org/W1513778749","https://openalex.org/W1533190300","https://openalex.org/W1543631479","https://openalex.org/W1604920263","https://openalex.org/W2021683099","https://openalex.org/W2027518897","https://openalex.org/W2068441986","https://openalex.org/W2082154877","https://openalex.org/W2097928422","https://openalex.org/W2111729875","https://openalex.org/W2117735243","https://openalex.org/W2132118564","https://openalex.org/W2154938055","https://openalex.org/W2248906070","https://openalex.org/W2538008384","https://openalex.org/W2561751490","https://openalex.org/W4231334470"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W3011831393","https://openalex.org/W2518845051","https://openalex.org/W2389680235","https://openalex.org/W2895059647","https://openalex.org/W2366625390","https://openalex.org/W2115046010","https://openalex.org/W2038256311","https://openalex.org/W2002449369"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}