{"id":"https://openalex.org/W2012296170","doi":"https://doi.org/10.1016/s0026-2714(01)00184-6","title":"Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT","display_name":"Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT","publication_year":2001,"publication_date":"2001-09-01","ids":{"openalex":"https://openalex.org/W2012296170","doi":"https://doi.org/10.1016/s0026-2714(01)00184-6","mag":"2012296170"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00184-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00184-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110684845","display_name":"C. Sydlo","orcid":null},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"C. Sydlo","raw_affiliation_strings":["Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052852053","display_name":"B. Mottet","orcid":null},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"B. Mottet","raw_affiliation_strings":["Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088029125","display_name":"H. Ganis","orcid":null},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Ganis","raw_affiliation_strings":["Faculty of Electrical Eng. & Information Sciences / Professur fuer Hochfrequenztechnik, TU-Chemnitz, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Eng. & Information Sciences / Professur fuer Hochfrequenztechnik, TU-Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112003382","display_name":"H. L. Hartnagel","orcid":null},"institutions":[{"id":"https://openalex.org/I31512782","display_name":"Technische Universit\u00e4t Darmstadt","ror":"https://ror.org/05n911h24","country_code":"DE","type":"education","lineage":["https://openalex.org/I31512782"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.L. Hartnagel","raw_affiliation_strings":["Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Inst. f\u00fcr Hochfrequenztechnik, TU-Darmstadt, Merckstr. 25, D 64283 Darmstadt, Germany E-mail: c.sydlo@ieee.org, Tel.: +49 6151 16 4562, Fax: +49 6151 16 4367,","institution_ids":["https://openalex.org/I31512782"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075640956","display_name":"Viktor Krozer","orcid":"https://orcid.org/0000-0002-2387-1947"},"institutions":[{"id":"https://openalex.org/I2610724","display_name":"Chemnitz University of Technology","ror":"https://ror.org/00a208s56","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"V. Krozer","raw_affiliation_strings":["Faculty of Electrical Eng. & Information Sciences / Professur fuer Hochfrequenztechnik, TU-Chemnitz, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Eng. & Information Sciences / Professur fuer Hochfrequenztechnik, TU-Chemnitz, Germany","institution_ids":["https://openalex.org/I2610724"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016243656","display_name":"S. L. Delage","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S.L. Delage","raw_affiliation_strings":["THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059556818","display_name":"S. Cassette","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. Cassette","raw_affiliation_strings":["THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074750596","display_name":"E. Chartier","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"E. Chartier","raw_affiliation_strings":["THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108530985","display_name":"D. Floriot","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"D. Floriot","raw_affiliation_strings":["THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"THALES-LCR, Dormaine de Corbeville, 91404 Orsay CEDEX, France,","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113527040","display_name":"S. Bland","orcid":null},"institutions":[{"id":"https://openalex.org/I2802464121","display_name":"IQE (United Kingdom)","ror":"https://ror.org/03f4vp463","country_code":"GB","type":"company","lineage":["https://openalex.org/I2802464121"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"S. Bland","raw_affiliation_strings":["IQE (Europe) Ltd., Cypress Drive, St. Mellons, Cardiff CF3 OEG Wales, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IQE (Europe) Ltd., Cypress Drive, St. Mellons, Cardiff CF3 OEG Wales, UK","institution_ids":["https://openalex.org/I2802464121"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.876,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.75902517,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"9-10","first_page":"1567","last_page":"1571"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heterojunction-bipolar-transistor","display_name":"Heterojunction bipolar transistor","score":0.8938350677490234},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7546586990356445},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5545639991760254},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5162346363067627},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.46556949615478516},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4130935072898865},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36866915225982666},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3375890254974365},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31748396158218384},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1489887535572052},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.08314162492752075},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06981664896011353},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.06353375315666199},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.057121723890304565}],"concepts":[{"id":"https://openalex.org/C173408217","wikidata":"https://www.wikidata.org/wiki/Q1428898","display_name":"Heterojunction bipolar transistor","level":5,"score":0.8938350677490234},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7546586990356445},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5545639991760254},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5162346363067627},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.46556949615478516},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4130935072898865},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36866915225982666},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3375890254974365},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31748396158218384},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1489887535572052},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.08314162492752075},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06981664896011353},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.06353375315666199},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.057121723890304565},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(01)00184-6","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00184-6","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:tubiblio.ulb.tu-darmstadt.de:17434","is_oa":false,"landing_page_url":"http://tubiblio.ulb.tu-darmstadt.de/17434/","pdf_url":null,"source":{"id":"https://openalex.org/S4377196390","display_name":"TUbilio (Technical University of Darmstadt)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I31512782","host_organization_name":"Technische Universit\u00e4t Darmstadt","host_organization_lineage":["https://openalex.org/I31512782"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":" Konferenzver\u00f6ffentlichung"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}