{"id":"https://openalex.org/W2139473798","doi":"https://doi.org/10.1016/s0026-2714(01)00135-4","title":"A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels","display_name":"A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels","publication_year":2002,"publication_date":"2002-03-01","ids":{"openalex":"https://openalex.org/W2139473798","doi":"https://doi.org/10.1016/s0026-2714(01)00135-4","mag":"2139473798"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00135-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00135-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034045101","display_name":"Didier Cottet","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"Didier Cottet","raw_affiliation_strings":["Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland"],"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","institution_ids":["https://openalex.org/I35440088"]},{"raw_affiliation_string":"Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067940404","display_name":"Michael Scheffler","orcid":"https://orcid.org/0000-0001-5509-1868"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Michael Scheffler","raw_affiliation_strings":["Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland"],"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","institution_ids":["https://openalex.org/I35440088"]},{"raw_affiliation_string":"Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017473656","display_name":"Gerhard Tr\u00f6ster","orcid":"https://orcid.org/0000-0002-9278-1638"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Gerhard Tr\u00f6ster","raw_affiliation_strings":["Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland"],"affiliations":[{"raw_affiliation_string":"Electronics Laboratory, ETH Z\u00fcrich, Gloriastrasse 35, CH-8092 Z\u00fcrich, Switzerland","institution_ids":["https://openalex.org/I35440088"]},{"raw_affiliation_string":"Electronics Laboratory; ETH Z\u00fcrich; Gloriastrasse 35 CH-8092 Z\u00fcrich Switzerland","institution_ids":["https://openalex.org/I35440088"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5034045101"],"corresponding_institution_ids":["https://openalex.org/I35440088"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23916533,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"3","first_page":"417","last_page":"426"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12080","display_name":"Injection Molding Process and Properties","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.7246651649475098},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.49551665782928467},{"id":"https://openalex.org/keywords/control-area","display_name":"Control area","score":0.4899441599845886},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.4676010012626648},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4312435984611511},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42896515130996704},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4199712872505188},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.41266676783561707},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.36616888642311096},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.3511063754558563},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34502553939819336},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07046765089035034}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.7246651649475098},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.49551665782928467},{"id":"https://openalex.org/C191373421","wikidata":"https://www.wikidata.org/wiki/Q3931948","display_name":"Control area","level":3,"score":0.4899441599845886},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.4676010012626648},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4312435984611511},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42896515130996704},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4199712872505188},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.41266676783561707},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.36616888642311096},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.3511063754558563},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34502553939819336},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07046765089035034},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00135-4","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00135-4","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.5,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1215788773","https://openalex.org/W2103207160","https://openalex.org/W2120040435","https://openalex.org/W2127381279","https://openalex.org/W2138754449","https://openalex.org/W2140488499","https://openalex.org/W2151684012","https://openalex.org/W3025728421","https://openalex.org/W3048831212","https://openalex.org/W4252226401","https://openalex.org/W4285719527","https://openalex.org/W4301910031"],"related_works":["https://openalex.org/W2532234348","https://openalex.org/W108084911","https://openalex.org/W2393440248","https://openalex.org/W2415963984","https://openalex.org/W2673314300","https://openalex.org/W1979716082","https://openalex.org/W4384785625","https://openalex.org/W4242594920","https://openalex.org/W2074668432","https://openalex.org/W2812758604"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}