{"id":"https://openalex.org/W1988321315","doi":"https://doi.org/10.1016/s0026-2714(01)00092-0","title":"Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement","display_name":"Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement","publication_year":2001,"publication_date":"2001-12-01","ids":{"openalex":"https://openalex.org/W1988321315","doi":"https://doi.org/10.1016/s0026-2714(01)00092-0","mag":"1988321315"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00092-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00092-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067555783","display_name":"M. Blyzniuk","orcid":"https://orcid.org/0000-0002-8339-4118"},"institutions":[{"id":"https://openalex.org/I98435010","display_name":"Lviv Polytechnic National University","ror":"https://ror.org/0542q3127","country_code":"UA","type":"education","lineage":["https://openalex.org/I98435010"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"M. Blyzniuk","raw_affiliation_strings":["CAD Department and Radio-Engineering Department, Lviv Polytechnic National University, 12 Bandera St, 79013 Lviv, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CAD Department and Radio-Engineering Department, Lviv Polytechnic National University, 12 Bandera St, 79013 Lviv, Ukraine","institution_ids":["https://openalex.org/I98435010"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051942554","display_name":"Iryna Kazymyra","orcid":"https://orcid.org/0000-0003-1597-5647"},"institutions":[{"id":"https://openalex.org/I98435010","display_name":"Lviv Polytechnic National University","ror":"https://ror.org/0542q3127","country_code":"UA","type":"education","lineage":["https://openalex.org/I98435010"]}],"countries":["UA"],"is_corresponding":false,"raw_author_name":"I. Kazymyra","raw_affiliation_strings":["CAD Department and Radio-Engineering Department, Lviv Polytechnic National University, 12 Bandera St, 79013 Lviv, Ukraine"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CAD Department and Radio-Engineering Department, Lviv Polytechnic National University, 12 Bandera St, 79013 Lviv, Ukraine","institution_ids":["https://openalex.org/I98435010"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030763424","display_name":"W. Ku\u017amicz","orcid":"https://orcid.org/0000-0001-5201-2503"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"W. Kuzmicz","raw_affiliation_strings":["Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, 75 Koszykowa St, 00-662 Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, 75 Koszykowa St, 00-662 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056589147","display_name":"Witold A. Pleskacz","orcid":"https://orcid.org/0000-0001-7064-503X"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"W.A. Pleskacz","raw_affiliation_strings":["Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, 75 Koszykowa St, 00-662 Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Microelectronics and Optoelectronics, Warsaw University of Technology, 75 Koszykowa St, 00-662 Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"J. Raik","raw_affiliation_strings":["Computer Engineering Department, Tallinn Technical University, 5 Ehitajate Tee, EE0026 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Tallinn Technical University, 5 Ehitajate Tee, EE0026 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"R. Ubar","raw_affiliation_strings":["Computer Engineering Department, Tallinn Technical University, 5 Ehitajate Tee, EE0026 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Tallinn Technical University, 5 Ehitajate Tee, EE0026 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":1.3729,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.81882086,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"41","issue":"12","first_page":"2023","last_page":"2040"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9911999702453613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.7949111461639404},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6610633134841919},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5931750535964966},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.495479941368103},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4712669849395752},{"id":"https://openalex.org/keywords/physical-design","display_name":"Physical design","score":0.4640238881111145},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.43897685408592224},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40435585379600525},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.30794185400009155},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.25110286474227905},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17900383472442627},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09888285398483276}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.7949111461639404},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6610633134841919},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5931750535964966},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.495479941368103},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4712669849395752},{"id":"https://openalex.org/C188817802","wikidata":"https://www.wikidata.org/wiki/Q13426855","display_name":"Physical design","level":3,"score":0.4640238881111145},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.43897685408592224},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40435585379600525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30794185400009155},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.25110286474227905},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17900383472442627},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09888285398483276}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00092-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00092-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W59256056","https://openalex.org/W126937498","https://openalex.org/W611894530","https://openalex.org/W1497833252","https://openalex.org/W1644695985","https://openalex.org/W1896671528","https://openalex.org/W2041090186","https://openalex.org/W2070552259","https://openalex.org/W2083844511","https://openalex.org/W2098112833","https://openalex.org/W2102612856","https://openalex.org/W2115753067","https://openalex.org/W2129555080","https://openalex.org/W2130300051","https://openalex.org/W2143842308","https://openalex.org/W2145401040","https://openalex.org/W2146208290","https://openalex.org/W2152813777","https://openalex.org/W2156994515","https://openalex.org/W2170867550","https://openalex.org/W2534049282","https://openalex.org/W2535422787","https://openalex.org/W2900256418","https://openalex.org/W4244127716","https://openalex.org/W4245928206","https://openalex.org/W6604783342","https://openalex.org/W6605178140","https://openalex.org/W6679268027"],"related_works":["https://openalex.org/W2181385951","https://openalex.org/W2389800961","https://openalex.org/W1727049600","https://openalex.org/W2183812348","https://openalex.org/W1995389502","https://openalex.org/W1481897060","https://openalex.org/W4313890168","https://openalex.org/W2358255476","https://openalex.org/W3015807029","https://openalex.org/W1886723318"],"abstract_inverted_index":null,"counts_by_year":[{"year":2020,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}