{"id":"https://openalex.org/W1969270456","doi":"https://doi.org/10.1016/s0026-2714(01)00079-8","title":"Threshold energies in the light emission characteristics of silicon MOS tunnel diodes","display_name":"Threshold energies in the light emission characteristics of silicon MOS tunnel diodes","publication_year":2001,"publication_date":"2001-07-01","ids":{"openalex":"https://openalex.org/W1969270456","doi":"https://doi.org/10.1016/s0026-2714(01)00079-8","mag":"1969270456"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00079-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00079-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089711074","display_name":"Noor Asnida Asli","orcid":"https://orcid.org/0000-0001-9426-9227"},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"N. Asli","raw_affiliation_strings":["Lehrstuhl f\u00fcr Halbleitertechnik, Christian-Albrechts-Universit\u00e4t, Kaiserstrasse 2, 24143 Kiel, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lehrstuhl f\u00fcr Halbleitertechnik, Christian-Albrechts-Universit\u00e4t, Kaiserstrasse 2, 24143 Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008733416","display_name":"M. I. Vexler","orcid":"https://orcid.org/0000-0002-9966-520X"},"institutions":[{"id":"https://openalex.org/I4210120482","display_name":"Physico-Technical Institute","ror":"https://ror.org/02jj4k517","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210119369","https://openalex.org/I4210120482"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M.I. Vexler","raw_affiliation_strings":["A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia","institution_ids":["https://openalex.org/I4210120482"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064775071","display_name":"A. F. Shulekin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120482","display_name":"Physico-Technical Institute","ror":"https://ror.org/02jj4k517","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210119369","https://openalex.org/I4210120482"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A.F. Shulekin","raw_affiliation_strings":["A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia","institution_ids":["https://openalex.org/I4210120482"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039460005","display_name":"P. Douglas Yoder","orcid":"https://orcid.org/0000-0001-7462-9416"},"institutions":[{"id":"https://openalex.org/I72090969","display_name":"Nokia (United States)","ror":"https://ror.org/038km2573","country_code":"US","type":"company","lineage":["https://openalex.org/I2738502077","https://openalex.org/I72090969"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.D. Yoder","raw_affiliation_strings":["Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974, USA","Bell Laboratories//600 Mountain Avenue//Murray Hill, NJ 07974 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bell Laboratories, 600 Mountain Avenue, Murray Hill, NJ 07974, USA","institution_ids":[]},{"raw_affiliation_string":"Bell Laboratories//600 Mountain Avenue//Murray Hill, NJ 07974 USA","institution_ids":["https://openalex.org/I72090969"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056941218","display_name":"I. V. Grekhov","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120482","display_name":"Physico-Technical Institute","ror":"https://ror.org/02jj4k517","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I4210119369","https://openalex.org/I4210120482"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"I.V. Grekhov","raw_affiliation_strings":["A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A.F. Ioffe Physicotechnical Institute, 194021 St.-Petersburg, Russia","institution_ids":["https://openalex.org/I4210120482"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027444955","display_name":"P. Seegebrecht","orcid":null},"institutions":[{"id":"https://openalex.org/I32021983","display_name":"Christian-Albrechts-Universit\u00e4t zu Kiel","ror":"https://ror.org/04v76ef78","country_code":"DE","type":"education","lineage":["https://openalex.org/I32021983"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"P. Seegebrecht","raw_affiliation_strings":["Lehrstuhl f\u00fcr Halbleitertechnik, Christian-Albrechts-Universit\u00e4t, Kaiserstrasse 2, 24143 Kiel, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Lehrstuhl f\u00fcr Halbleitertechnik, Christian-Albrechts-Universit\u00e4t, Kaiserstrasse 2, 24143 Kiel, Germany","institution_ids":["https://openalex.org/I32021983"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5089711074"],"corresponding_institution_ids":["https://openalex.org/I32021983"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":1.3078,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.7989396,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"41","issue":"7","first_page":"1071","last_page":"1076"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/luminescence","display_name":"Luminescence","score":0.7713766098022461},{"id":"https://openalex.org/keywords/wavelength","display_name":"Wavelength","score":0.6397593021392822},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6104316711425781},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6001068353652954},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.5899784564971924},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5805826783180237},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5521907210350037},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.52458256483078},{"id":"https://openalex.org/keywords/spectral-line","display_name":"Spectral line","score":0.44663873314857483},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.4396998882293701},{"id":"https://openalex.org/keywords/radiant-intensity","display_name":"Radiant intensity","score":0.43644657731056213},{"id":"https://openalex.org/keywords/intensity","display_name":"Intensity (physics)","score":0.4353763163089752},{"id":"https://openalex.org/keywords/light-emission","display_name":"Light emission","score":0.423258513212204},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.41553056240081787},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.41397011280059814},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3580982983112335},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.20342659950256348}],"concepts":[{"id":"https://openalex.org/C148869448","wikidata":"https://www.wikidata.org/wiki/Q184240","display_name":"Luminescence","level":2,"score":0.7713766098022461},{"id":"https://openalex.org/C6260449","wikidata":"https://www.wikidata.org/wiki/Q41364","display_name":"Wavelength","level":2,"score":0.6397593021392822},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6104316711425781},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6001068353652954},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5899784564971924},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5805826783180237},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5521907210350037},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.52458256483078},{"id":"https://openalex.org/C4839761","wikidata":"https://www.wikidata.org/wiki/Q212111","display_name":"Spectral line","level":2,"score":0.44663873314857483},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.4396998882293701},{"id":"https://openalex.org/C163752227","wikidata":"https://www.wikidata.org/wiki/Q1253365","display_name":"Radiant intensity","level":3,"score":0.43644657731056213},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.4353763163089752},{"id":"https://openalex.org/C2985930086","wikidata":"https://www.wikidata.org/wiki/Q65037198","display_name":"Light emission","level":2,"score":0.423258513212204},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.41553056240081787},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.41397011280059814},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3580982983112335},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.20342659950256348},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00079-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00079-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8500000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320308269","display_name":"Alexander von Humboldt-Stiftung","ror":"https://ror.org/012kf4317"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W1988006360","https://openalex.org/W2024014137"],"related_works":["https://openalex.org/W2038940150","https://openalex.org/W2035154462","https://openalex.org/W2382498118","https://openalex.org/W2379751805","https://openalex.org/W2051745476","https://openalex.org/W2033675229","https://openalex.org/W2357402201","https://openalex.org/W2011856235","https://openalex.org/W3187297728","https://openalex.org/W2374974008"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}