{"id":"https://openalex.org/W2082660695","doi":"https://doi.org/10.1016/s0026-2714(01)00056-7","title":"Impact of the As dose in m EEPROM technology: characterization and modeling","display_name":"Impact of the As dose in m EEPROM technology: characterization and modeling","publication_year":2001,"publication_date":"2001-07-01","ids":{"openalex":"https://openalex.org/W2082660695","doi":"https://doi.org/10.1016/s0026-2714(01)00056-7","mag":"2082660695"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00056-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00056-7","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11380/307264","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084713069","display_name":"N. Galbiati","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"N. Galbiati","raw_affiliation_strings":["ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035694704","display_name":"G. Ghidini","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Ghidini","raw_affiliation_strings":["ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035800514","display_name":"C. Cremonesi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Cremonesi","raw_affiliation_strings":["ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST Microelectronics, Via C. Olivetti, 2, 20141 Agrate Brianza, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003731777","display_name":"Luca Larcher","orcid":"https://orcid.org/0000-0002-9139-349X"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Larcher","raw_affiliation_strings":["Dipartimento di Scienza dell'Ingegneria, Universita' di Modena e Reggio Emilia, Via Vignolese 905, 41100 Modena, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dipartimento di Scienza dell'Ingegneria, Universita' di Modena e Reggio Emilia, Via Vignolese 905, 41100 Modena, Italy","institution_ids":["https://openalex.org/I122346577"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5084713069"],"corresponding_institution_ids":["https://openalex.org/I4210154781"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15399481,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"7","first_page":"999","last_page":"1002"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eeprom","display_name":"EEPROM","score":0.9741541147232056},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6416219472885132},{"id":"https://openalex.org/keywords/eprom","display_name":"EPROM","score":0.6253505349159241},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.5979887247085571},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.5787562727928162},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.573276937007904},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.572437584400177},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.49005401134490967},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4769403040409088},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42110493779182434},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.41531819105148315},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34201741218566895},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2653883993625641},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16930794715881348},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12754571437835693},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.0754740834236145}],"concepts":[{"id":"https://openalex.org/C27699510","wikidata":"https://www.wikidata.org/wiki/Q205908","display_name":"EEPROM","level":2,"score":0.9741541147232056},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6416219472885132},{"id":"https://openalex.org/C163980746","wikidata":"https://www.wikidata.org/wiki/Q378210","display_name":"EPROM","level":2,"score":0.6253505349159241},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.5979887247085571},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5787562727928162},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.573276937007904},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.572437584400177},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.49005401134490967},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4769403040409088},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42110493779182434},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.41531819105148315},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34201741218566895},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2653883993625641},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16930794715881348},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12754571437835693},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0754740834236145},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2714(01)00056-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00056-7","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:iris.unimore.it:11380/307264","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/307264","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/307264","is_oa":true,"landing_page_url":"http://hdl.handle.net/11380/307264","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2172198958"],"related_works":["https://openalex.org/W1562544819","https://openalex.org/W1588693492","https://openalex.org/W1963966819","https://openalex.org/W2167477530","https://openalex.org/W2062000758","https://openalex.org/W2115912089","https://openalex.org/W3148257175","https://openalex.org/W3148390583","https://openalex.org/W2285034525","https://openalex.org/W1526162000"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-05-30T09:04:40.226872","created_date":"2025-10-10T00:00:00"}