{"id":"https://openalex.org/W2004026764","doi":"https://doi.org/10.1016/s0026-2714(01)00030-0","title":"Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies","display_name":"Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies","publication_year":2001,"publication_date":"2001-11-01","ids":{"openalex":"https://openalex.org/W2004026764","doi":"https://doi.org/10.1016/s0026-2714(01)00030-0","mag":"2004026764"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00030-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00030-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040779982","display_name":"K. Verhaege","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Koen G Verhaege","raw_affiliation_strings":["Integrated Circuit Systems Laboratory, Sarnoff Corporation, 201 Washington Road, CN5300, Princeton, NJ-08543-5300, USA"],"affiliations":[{"raw_affiliation_string":"Integrated Circuit Systems Laboratory, Sarnoff Corporation, 201 Washington Road, CN5300, Princeton, NJ-08543-5300, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5114248303","display_name":"Christian Russ","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Christian C Russ","raw_affiliation_strings":["Integrated Circuit Systems Laboratory, Sarnoff Corporation, 201 Washington Road, CN5300, Princeton, NJ-08543-5300, USA"],"affiliations":[{"raw_affiliation_string":"Integrated Circuit Systems Laboratory, Sarnoff Corporation, 201 Washington Road, CN5300, Princeton, NJ-08543-5300, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5040779982"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.10022617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"11","first_page":"1739","last_page":"1749"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6469646096229553},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5480756759643555},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.47965171933174133},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4014820158481598}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6469646096229553},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5480756759643555},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.47965171933174133},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4014820158481598}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00030-0","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00030-0","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4699999988079071,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1488055143","https://openalex.org/W1507469170","https://openalex.org/W1513206610","https://openalex.org/W1529542507","https://openalex.org/W1543631479","https://openalex.org/W1568573568","https://openalex.org/W1593643388","https://openalex.org/W1604920263","https://openalex.org/W2021683099","https://openalex.org/W2082154877","https://openalex.org/W2085036024","https://openalex.org/W2088871164","https://openalex.org/W2097928422","https://openalex.org/W2109171270","https://openalex.org/W2111228273","https://openalex.org/W2111729875","https://openalex.org/W2130390619","https://openalex.org/W2132118564","https://openalex.org/W2154938055","https://openalex.org/W2163648919","https://openalex.org/W2538008384","https://openalex.org/W2561751490","https://openalex.org/W2561994235","https://openalex.org/W6676630770"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2089791793","https://openalex.org/W2038858740","https://openalex.org/W2109445684"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}