{"id":"https://openalex.org/W2066681669","doi":"https://doi.org/10.1016/s0026-2714(01)00028-2","title":"Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation","display_name":"Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation","publication_year":2001,"publication_date":"2001-06-01","ids":{"openalex":"https://openalex.org/W2066681669","doi":"https://doi.org/10.1016/s0026-2714(01)00028-2","mag":"2066681669"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00028-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00028-2","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064308995","display_name":"M. Schenkel","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":true,"raw_author_name":"M Schenkel","raw_affiliation_strings":["Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049227681","display_name":"Pirkko Pf\u00e4ffli","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P Pf\u00e4ffli","raw_affiliation_strings":["ISE Integrated Systems Engineering AG, Balgriststrasse 102, CH-8008 Zurich, Switzerland"],"affiliations":[{"raw_affiliation_string":"ISE Integrated Systems Engineering AG, Balgriststrasse 102, CH-8008 Zurich, Switzerland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033123220","display_name":"W. Wilkening","orcid":null},"institutions":[{"id":"https://openalex.org/I889804353","display_name":"Robert Bosch (Germany)","ror":"https://ror.org/01fe0jt45","country_code":"DE","type":"company","lineage":["https://openalex.org/I889804353"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"W Wilkening","raw_affiliation_strings":["Robert Bosch GmbH, K8/DIC1, P.O. Box 1342, D-72703 Reutlingen, Germany"],"affiliations":[{"raw_affiliation_string":"Robert Bosch GmbH, K8/DIC1, P.O. Box 1342, D-72703 Reutlingen, Germany","institution_ids":["https://openalex.org/I889804353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051127959","display_name":"D\u00f6lf Aemmer","orcid":null},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"D Aemmer","raw_affiliation_strings":["Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004540330","display_name":"Wolf F\u00efchtner","orcid":"https://orcid.org/0000-0001-6013-4674"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"W Fichtner","raw_affiliation_strings":["Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland"],"affiliations":[{"raw_affiliation_string":"Integrated Systems Laboratory, ETH Zurich, Gloriastrasse 35, CH-8092 Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5064308995"],"corresponding_institution_ids":["https://openalex.org/I35440088"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.4355,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.69467247,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"41","issue":"6","first_page":"815","last_page":"822"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6630281209945679},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.6585148572921753},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5713446140289307},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.5345315933227539},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5339898467063904},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5308725833892822},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5257830619812012},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.49404504895210266},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4902642071247101},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2823725938796997},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09025198221206665},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.07246226072311401}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6630281209945679},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.6585148572921753},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5713446140289307},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5345315933227539},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5339898467063904},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5308725833892822},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5257830619812012},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.49404504895210266},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4902642071247101},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2823725938796997},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09025198221206665},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.07246226072311401},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00028-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00028-2","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W636154059","https://openalex.org/W1529015657","https://openalex.org/W1551544000","https://openalex.org/W1605586075","https://openalex.org/W1757505365","https://openalex.org/W1969590570","https://openalex.org/W1972436362","https://openalex.org/W2009124417","https://openalex.org/W2017219891","https://openalex.org/W2093207987","https://openalex.org/W2099715127","https://openalex.org/W2102605739","https://openalex.org/W2104504640","https://openalex.org/W2118395163","https://openalex.org/W2123047567","https://openalex.org/W2129136654","https://openalex.org/W2136745187","https://openalex.org/W2150129922","https://openalex.org/W2155407321","https://openalex.org/W2180333551","https://openalex.org/W2487448771"],"related_works":["https://openalex.org/W4324123959","https://openalex.org/W2482113690","https://openalex.org/W72767096","https://openalex.org/W2134408857","https://openalex.org/W2172642361","https://openalex.org/W1994736840","https://openalex.org/W1545618670","https://openalex.org/W2389680713","https://openalex.org/W2568011255","https://openalex.org/W2141085511"],"abstract_inverted_index":null,"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}