{"id":"https://openalex.org/W1991713205","doi":"https://doi.org/10.1016/s0026-2714(01)00026-9","title":"Trap generation and breakdown processes in very thin gate oxides","display_name":"Trap generation and breakdown processes in very thin gate oxides","publication_year":2001,"publication_date":"2001-05-01","ids":{"openalex":"https://openalex.org/W1991713205","doi":"https://doi.org/10.1016/s0026-2714(01)00026-9","mag":"1991713205"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(01)00026-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00026-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019748322","display_name":"Elyse Rosenbaum","orcid":"https://orcid.org/0000-0002-3919-9833"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Elyse Rosenbaum","raw_affiliation_strings":["Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039815679","display_name":"Jie Wu","orcid":"https://orcid.org/0000-0001-6969-7190"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jie Wu","raw_affiliation_strings":["Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and the Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 W. Main Street, Urbana, IL 61801, USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5019748322"],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":1.3064,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.80228402,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"41","issue":"5","first_page":"625","last_page":"632"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silc","display_name":"SILC","score":0.9515098333358765},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.6764982342720032},{"id":"https://openalex.org/keywords/cathode","display_name":"Cathode","score":0.6273636817932129},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.5935910940170288},{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.5899184942245483},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5644809007644653},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.5630189776420593},{"id":"https://openalex.org/keywords/penning-trap","display_name":"Penning trap","score":0.5474057197570801},{"id":"https://openalex.org/keywords/trapping","display_name":"Trapping","score":0.508653461933136},{"id":"https://openalex.org/keywords/annealing","display_name":"Annealing (glass)","score":0.4936719834804535},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.46972811222076416},{"id":"https://openalex.org/keywords/hydrogen","display_name":"Hydrogen","score":0.4646932780742645},{"id":"https://openalex.org/keywords/time-dependent-gate-oxide-breakdown","display_name":"Time-dependent gate oxide breakdown","score":0.44513237476348877},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.42051059007644653},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.37628060579299927},{"id":"https://openalex.org/keywords/chemical-physics","display_name":"Chemical physics","score":0.35009583830833435},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.3349795937538147},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18761885166168213},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.14018970727920532},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.09194040298461914},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0864824652671814},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.08388105034828186}],"concepts":[{"id":"https://openalex.org/C86642149","wikidata":"https://www.wikidata.org/wiki/Q7390375","display_name":"SILC","level":3,"score":0.9515098333358765},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.6764982342720032},{"id":"https://openalex.org/C49110097","wikidata":"https://www.wikidata.org/wiki/Q175233","display_name":"Cathode","level":2,"score":0.6273636817932129},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.5935910940170288},{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.5899184942245483},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5644809007644653},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.5630189776420593},{"id":"https://openalex.org/C143873397","wikidata":"https://www.wikidata.org/wiki/Q1755716","display_name":"Penning trap","level":3,"score":0.5474057197570801},{"id":"https://openalex.org/C2777924906","wikidata":"https://www.wikidata.org/wiki/Q34168","display_name":"Trapping","level":2,"score":0.508653461933136},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.4936719834804535},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.46972811222076416},{"id":"https://openalex.org/C512968161","wikidata":"https://www.wikidata.org/wiki/Q556","display_name":"Hydrogen","level":2,"score":0.4646932780742645},{"id":"https://openalex.org/C152909973","wikidata":"https://www.wikidata.org/wiki/Q7804816","display_name":"Time-dependent gate oxide breakdown","level":5,"score":0.44513237476348877},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.42051059007644653},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.37628060579299927},{"id":"https://openalex.org/C159467904","wikidata":"https://www.wikidata.org/wiki/Q2001702","display_name":"Chemical physics","level":1,"score":0.35009583830833435},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.3349795937538147},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18761885166168213},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.14018970727920532},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.09194040298461914},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0864824652671814},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.08388105034828186},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(01)00026-9","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(01)00026-9","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"display_name":"Clean water and sanitation","id":"https://metadata.un.org/sdg/6"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1534768196","https://openalex.org/W1589467559","https://openalex.org/W1964818675","https://openalex.org/W1979616199","https://openalex.org/W1980584607","https://openalex.org/W1995270869","https://openalex.org/W2021750186","https://openalex.org/W2035802984","https://openalex.org/W2036858306","https://openalex.org/W2073090060","https://openalex.org/W2074646080","https://openalex.org/W2082309656","https://openalex.org/W2113488650","https://openalex.org/W2117810651","https://openalex.org/W2123046419","https://openalex.org/W2123400089","https://openalex.org/W2124810356","https://openalex.org/W2124961243","https://openalex.org/W2130770701","https://openalex.org/W2136455663","https://openalex.org/W2147991137","https://openalex.org/W2152874453","https://openalex.org/W2153931076","https://openalex.org/W2155891660","https://openalex.org/W2172025368","https://openalex.org/W2532269869","https://openalex.org/W2532934857","https://openalex.org/W2533616880","https://openalex.org/W2538792188","https://openalex.org/W2542325530","https://openalex.org/W2543944507","https://openalex.org/W6649189962"],"related_works":["https://openalex.org/W1997588041","https://openalex.org/W2539595190","https://openalex.org/W4250401117","https://openalex.org/W2044576152","https://openalex.org/W2097915293","https://openalex.org/W2147178768","https://openalex.org/W2056032851","https://openalex.org/W2088113479","https://openalex.org/W1954343641","https://openalex.org/W2120727748"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}