{"id":"https://openalex.org/W1984461022","doi":"https://doi.org/10.1016/s0026-2714(00)00215-8","title":"Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems","display_name":"Highly reliable spot-size converter integrated laser diodes over a wide temperature range for access network systems","publication_year":2001,"publication_date":"2001-01-01","ids":{"openalex":"https://openalex.org/W1984461022","doi":"https://doi.org/10.1016/s0026-2714(00)00215-8","mag":"1984461022"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(00)00215-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(00)00215-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005037949","display_name":"H. Oohashi","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"H Oohashi","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017990535","display_name":"Mitsuo Fukuda","orcid":"https://orcid.org/0000-0002-1458-281X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M Fukuda","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110432729","display_name":"Y. Kondo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y Kondo","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047858866","display_name":"Masaaki Yamamoto","orcid":"https://orcid.org/0000-0002-8309-8669"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"M Yamamoto","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110076620","display_name":"Y. Kadota","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y Kadota","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010319607","display_name":"Yasuyuki Kawaguchi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y Kawaguchi","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089125718","display_name":"Kenji Kishi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K Kishi","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111446170","display_name":"Y. Tohmori","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y Tohmori","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006150695","display_name":"K. Yokoyama","orcid":"https://orcid.org/0000-0003-0286-2416"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K Yokoyama","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110076619","display_name":"Y. Itaya","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Y Itaya","raw_affiliation_strings":["NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Photonics Laboratories, 3-1 Morinosato Wakamiya, Atsugi-shi, Kanagawa Pref. 243 0198, Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5005037949"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.4355,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.6660803,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"41","issue":"1","first_page":"111","last_page":"118"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.6987941265106201},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.6960791945457458},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.6695853471755981},{"id":"https://openalex.org/keywords/metalorganic-vapour-phase-epitaxy","display_name":"Metalorganic vapour phase epitaxy","score":0.6490066051483154},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6380553245544434},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6359237432479858},{"id":"https://openalex.org/keywords/bar","display_name":"Bar (unit)","score":0.5487575531005859},{"id":"https://openalex.org/keywords/laser-diode","display_name":"Laser diode","score":0.49159249663352966},{"id":"https://openalex.org/keywords/etching","display_name":"Etching (microfabrication)","score":0.4835360050201416},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45172446966171265},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4148138761520386},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.4109737277030945},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.3572460114955902},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2602706551551819},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1433260440826416},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.13263586163520813},{"id":"https://openalex.org/keywords/epitaxy","display_name":"Epitaxy","score":0.08187940716743469}],"concepts":[{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.6987941265106201},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.6960791945457458},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.6695853471755981},{"id":"https://openalex.org/C175665537","wikidata":"https://www.wikidata.org/wiki/Q1924991","display_name":"Metalorganic vapour phase epitaxy","level":4,"score":0.6490066051483154},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6380553245544434},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6359237432479858},{"id":"https://openalex.org/C188721877","wikidata":"https://www.wikidata.org/wiki/Q103510","display_name":"Bar (unit)","level":2,"score":0.5487575531005859},{"id":"https://openalex.org/C2777048131","wikidata":"https://www.wikidata.org/wiki/Q321098","display_name":"Laser diode","level":3,"score":0.49159249663352966},{"id":"https://openalex.org/C100460472","wikidata":"https://www.wikidata.org/wiki/Q2368605","display_name":"Etching (microfabrication)","level":3,"score":0.4835360050201416},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45172446966171265},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4148138761520386},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.4109737277030945},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3572460114955902},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2602706551551819},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1433260440826416},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.13263586163520813},{"id":"https://openalex.org/C110738630","wikidata":"https://www.wikidata.org/wiki/Q1135540","display_name":"Epitaxy","level":3,"score":0.08187940716743469},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(00)00215-8","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(00)00215-8","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1578728877","https://openalex.org/W1590365846","https://openalex.org/W1972135283","https://openalex.org/W2004412721","https://openalex.org/W2095616516","https://openalex.org/W2108640329","https://openalex.org/W2128776995","https://openalex.org/W2155137363","https://openalex.org/W2170538308","https://openalex.org/W2249100018","https://openalex.org/W6634704787","https://openalex.org/W6635609780","https://openalex.org/W6674388909"],"related_works":["https://openalex.org/W4366087129","https://openalex.org/W2078142174","https://openalex.org/W8191155","https://openalex.org/W2358461634","https://openalex.org/W3128440725","https://openalex.org/W4362730893","https://openalex.org/W2357965514","https://openalex.org/W2588244836","https://openalex.org/W161822665","https://openalex.org/W2468451732"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}