{"id":"https://openalex.org/W2038756093","doi":"https://doi.org/10.1016/s0026-2714(00)00203-1","title":"Unifying the thermal\u2013chemical and anode-hole-injection gate-oxide breakdown models","display_name":"Unifying the thermal\u2013chemical and anode-hole-injection gate-oxide breakdown models","publication_year":2001,"publication_date":"2001-02-01","ids":{"openalex":"https://openalex.org/W2038756093","doi":"https://doi.org/10.1016/s0026-2714(00)00203-1","mag":"2038756093"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2714(00)00203-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(00)00203-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023990409","display_name":"Kin P. Cheung","orcid":"https://orcid.org/0000-0003-2210-9907"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Kin P. Cheung","raw_affiliation_strings":["Bell Laboratories, Lucent Technologies, Room 1B217, 600 Mountain Avenue, Murray Hill, NJ 07974, USA"],"affiliations":[{"raw_affiliation_string":"Bell Laboratories, Lucent Technologies, Room 1B217, 600 Mountain Avenue, Murray Hill, NJ 07974, USA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5023990409"],"corresponding_institution_ids":[],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":2.1773,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.87126543,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"41","issue":"2","first_page":"193","last_page":"199"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12588","display_name":"Electronic and Structural Properties of Oxides","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/anode","display_name":"Anode","score":0.7064434289932251},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.62889564037323},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5548325181007385},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5060054659843445},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4890371263027191},{"id":"https://openalex.org/keywords/electron","display_name":"Electron","score":0.45071208477020264},{"id":"https://openalex.org/keywords/cathode","display_name":"Cathode","score":0.42831793427467346},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4105120897293091},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3418247103691101},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.31740498542785645},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.31310853362083435},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.15615153312683105},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.12716194987297058},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.09957733750343323},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.07813313603401184},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07103055715560913},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.06565392017364502}],"concepts":[{"id":"https://openalex.org/C89395315","wikidata":"https://www.wikidata.org/wiki/Q181232","display_name":"Anode","level":3,"score":0.7064434289932251},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.62889564037323},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5548325181007385},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5060054659843445},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4890371263027191},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.45071208477020264},{"id":"https://openalex.org/C49110097","wikidata":"https://www.wikidata.org/wiki/Q175233","display_name":"Cathode","level":2,"score":0.42831793427467346},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4105120897293091},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3418247103691101},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.31740498542785645},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.31310853362083435},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.15615153312683105},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.12716194987297058},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.09957733750343323},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.07813313603401184},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07103055715560913},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.06565392017364502}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2714(00)00203-1","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2714(00)00203-1","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1906329715","https://openalex.org/W1925913808","https://openalex.org/W1958623508","https://openalex.org/W1967543872","https://openalex.org/W1981102502","https://openalex.org/W1984954888","https://openalex.org/W1994505637","https://openalex.org/W2034933458","https://openalex.org/W2055254782","https://openalex.org/W2081048183","https://openalex.org/W2084294692","https://openalex.org/W2101031263","https://openalex.org/W2107374481","https://openalex.org/W2110335574","https://openalex.org/W2114931562","https://openalex.org/W2126345079","https://openalex.org/W2134085389","https://openalex.org/W2136455663","https://openalex.org/W2538792188","https://openalex.org/W4242351989"],"related_works":["https://openalex.org/W2374930937","https://openalex.org/W2602150962","https://openalex.org/W2328053366","https://openalex.org/W3003741000","https://openalex.org/W4249028082","https://openalex.org/W3106365267","https://openalex.org/W2743157761","https://openalex.org/W2051018604","https://openalex.org/W2059154287","https://openalex.org/W2079776368"],"abstract_inverted_index":null,"counts_by_year":[{"year":2018,"cited_by_count":2},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}