{"id":"https://openalex.org/W2088384327","doi":"https://doi.org/10.1016/s0026-2692(03)00205-2","title":"Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions","display_name":"Experimental validation of a thermal modelling method dedicated to multichip power modules in operating conditions","publication_year":2003,"publication_date":"2003-11-14","ids":{"openalex":"https://openalex.org/W2088384327","doi":"https://doi.org/10.1016/s0026-2692(03)00205-2","mag":"2088384327"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2692(03)00205-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00205-2","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006364116","display_name":"S. Carubelli","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"S. Carubelli","raw_affiliation_strings":["Institut National de Recherche sur les Transports et leur S\u00e9curit\u00e9-Laboratoire des Technologies Nouvelles, 2 Av. du G\u00e9n\u00e9ral Malleret-Joinville, 94114 Arcueil Cedex-France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut National de Recherche sur les Transports et leur S\u00e9curit\u00e9-Laboratoire des Technologies Nouvelles, 2 Av. du G\u00e9n\u00e9ral Malleret-Joinville, 94114 Arcueil Cedex-France","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060126716","display_name":"Zoubir Khatir","orcid":"https://orcid.org/0000-0002-3026-1346"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Z. Khatir","raw_affiliation_strings":["Institut National de Recherche sur les Transports et leur S\u00e9curit\u00e9-Laboratoire des Technologies Nouvelles, 2 Av. du G\u00e9n\u00e9ral Malleret-Joinville, 94114 Arcueil Cedex-France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institut National de Recherche sur les Transports et leur S\u00e9curit\u00e9-Laboratoire des Technologies Nouvelles, 2 Av. du G\u00e9n\u00e9ral Malleret-Joinville, 94114 Arcueil Cedex-France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":["https://openalex.org/A5006364116"],"corresponding_institution_ids":[],"apc_list":{"value":2370,"currency":"USD","value_usd":2370},"apc_paid":null,"fwci":0.7063,"has_fulltext":false,"cited_by_count":51,"citation_normalized_percentile":{"value":0.72787317,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"34","issue":"12","first_page":"1143","last_page":"1151"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.7154247760772705},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.6979035139083862},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5879712700843811},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5580673217773438},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4272730350494385},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41909900307655334},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.398581326007843},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24094167351722717},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12380185723304749},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09440639615058899}],"concepts":[{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.7154247760772705},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.6979035139083862},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5879712700843811},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5580673217773438},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4272730350494385},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41909900307655334},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.398581326007843},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24094167351722717},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12380185723304749},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09440639615058899},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/s0026-2692(03)00205-2","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00205-2","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"},{"id":"pmh:oai:HAL:hal-04154627v1","is_oa":false,"landing_page_url":"https://hal.science/hal-04154627","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Microelectronics Journal, 2003, 34 (12), pp.1143-1151. ⟨10.1016/S0026-2692(03)00205-2⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W631105943","https://openalex.org/W1546486571","https://openalex.org/W1850990523","https://openalex.org/W1901855160","https://openalex.org/W1995725852","https://openalex.org/W2037639362","https://openalex.org/W2095682932","https://openalex.org/W2102319213","https://openalex.org/W2105548077","https://openalex.org/W2156047413","https://openalex.org/W4245645167","https://openalex.org/W6675354668","https://openalex.org/W6683415417"],"related_works":["https://openalex.org/W4231775656","https://openalex.org/W2046435967","https://openalex.org/W2383646825","https://openalex.org/W2371018915","https://openalex.org/W2354191502","https://openalex.org/W1972225038","https://openalex.org/W3134658850","https://openalex.org/W2355938171","https://openalex.org/W2780079842","https://openalex.org/W814988660"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":9},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":7},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}