{"id":"https://openalex.org/W2063748802","doi":"https://doi.org/10.1016/s0026-2692(03)00188-5","title":"Design considerations for 6.5 kV IGBT devices","display_name":"Design considerations for 6.5 kV IGBT devices","publication_year":2003,"publication_date":"2003-11-15","ids":{"openalex":"https://openalex.org/W2063748802","doi":"https://doi.org/10.1016/s0026-2692(03)00188-5","mag":"2063748802"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2692(03)00188-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00188-5","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009741194","display_name":"M. Vellveh\u0131\u0301","orcid":"https://orcid.org/0000-0002-0127-4690"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"M. Vellveh\u0131\u0301","raw_affiliation_strings":["Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080777500","display_name":"D. Flores","orcid":"https://orcid.org/0000-0001-6469-1849"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"D. Flores","raw_affiliation_strings":["Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035526543","display_name":"X. Jord\u00e0","orcid":"https://orcid.org/0000-0003-1967-610X"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"X. Jord\u00e0","raw_affiliation_strings":["Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077461338","display_name":"S. Hidalgo","orcid":"https://orcid.org/0000-0002-8070-3499"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"S. Hidalgo","raw_affiliation_strings":["Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081760403","display_name":"J. Rebollo","orcid":"https://orcid.org/0000-0002-4833-737X"},"institutions":[{"id":"https://openalex.org/I4210147934","display_name":"Centro Nacional de Microelectr\u00f3nica","ror":"https://ror.org/03ycqrz18","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Rebollo","raw_affiliation_strings":["Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain"],"affiliations":[{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica (CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]},{"raw_affiliation_string":"Centro Nacional de Microelectr\u00f3nica, CNM-CSIC, Campus UAB, 08193 Bellaterra, Barcelona, Spain","institution_ids":["https://openalex.org/I4210147934"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014876502","display_name":"L. Coulbeck","orcid":null},"institutions":[{"id":"https://openalex.org/I22513266","display_name":"Dynex Semiconductor (United Kingdom)","ror":"https://ror.org/03210bg97","country_code":"GB","type":"company","lineage":["https://openalex.org/I22513266"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"L. Coulbeck","raw_affiliation_strings":["Dynex Semiconductor, Doddington Road, Lindon LinLN6 3LF, UK"],"affiliations":[{"raw_affiliation_string":"Dynex Semiconductor, Doddington Road, Lindon LinLN6 3LF, UK","institution_ids":["https://openalex.org/I22513266"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035840112","display_name":"P. Waind","orcid":null},"institutions":[{"id":"https://openalex.org/I22513266","display_name":"Dynex Semiconductor (United Kingdom)","ror":"https://ror.org/03210bg97","country_code":"GB","type":"company","lineage":["https://openalex.org/I22513266"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"P. Waind","raw_affiliation_strings":["Dynex Semiconductor, Doddington Road, Lindon LinLN6 3LF, UK"],"affiliations":[{"raw_affiliation_string":"Dynex Semiconductor, Doddington Road, Lindon LinLN6 3LF, UK","institution_ids":["https://openalex.org/I22513266"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5009741194"],"corresponding_institution_ids":["https://openalex.org/I4210147934"],"apc_list":{"value":2370,"currency":"USD","value_usd":2370},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.15271907,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"35","issue":"3","first_page":"269","last_page":"275"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9883999824523926,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.967118501663208},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5868105292320251},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.5720831751823425},{"id":"https://openalex.org/keywords/current-injection-technique","display_name":"Current injection technique","score":0.5427056550979614},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5297195911407471},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.520645797252655},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.49588045477867126},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4894320070743561},{"id":"https://openalex.org/keywords/gate-driver","display_name":"Gate driver","score":0.44472256302833557},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4311065375804901},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4215601980686188},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.41373342275619507},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3909006118774414},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.28795942664146423},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.22256794571876526}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.967118501663208},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5868105292320251},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.5720831751823425},{"id":"https://openalex.org/C25230419","wikidata":"https://www.wikidata.org/wiki/Q5195101","display_name":"Current injection technique","level":5,"score":0.5427056550979614},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5297195911407471},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.520645797252655},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.49588045477867126},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4894320070743561},{"id":"https://openalex.org/C179141203","wikidata":"https://www.wikidata.org/wiki/Q1495747","display_name":"Gate driver","level":3,"score":0.44472256302833557},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4311065375804901},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4215601980686188},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.41373342275619507},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3909006118774414},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.28795942664146423},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.22256794571876526},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2692(03)00188-5","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00188-5","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8399999737739563,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G3715799578","display_name":null,"funder_award_id":"TIC98-0825","funder_id":"https://openalex.org/F4320324278","funder_display_name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda"},{"id":"https://openalex.org/G7527138357","display_name":null,"funder_award_id":"TIC99-1834-CE","funder_id":"https://openalex.org/F4320324278","funder_display_name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda"}],"funders":[{"id":"https://openalex.org/F4320324278","display_name":"Comisi\u00f3n Interministerial de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/034900433"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2036756656","https://openalex.org/W2103371586","https://openalex.org/W2109437811","https://openalex.org/W2129483357","https://openalex.org/W2171366302","https://openalex.org/W6685784524"],"related_works":["https://openalex.org/W2378831118","https://openalex.org/W1524401369","https://openalex.org/W3171210226","https://openalex.org/W1900689440","https://openalex.org/W2366807798","https://openalex.org/W2178533142","https://openalex.org/W2062551440","https://openalex.org/W2113560421","https://openalex.org/W1550813695","https://openalex.org/W2203765578"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}