{"id":"https://openalex.org/W2093053019","doi":"https://doi.org/10.1016/s0026-2692(03)00072-7","title":"Electrical characterization of InGaN quantum well p\u2013n heterostructures","display_name":"Electrical characterization of InGaN quantum well p\u2013n heterostructures","publication_year":2003,"publication_date":"2003-04-23","ids":{"openalex":"https://openalex.org/W2093053019","doi":"https://doi.org/10.1016/s0026-2692(03)00072-7","mag":"2093053019"},"language":"en","primary_location":{"id":"doi:10.1016/s0026-2692(03)00072-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00072-7","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054868616","display_name":"J. C. Gonz\u00e1lez","orcid":"https://orcid.org/0000-0002-9375-1430"},"institutions":[{"id":"https://openalex.org/I4210106422","display_name":"Brazilian Synchrotron Light Laboratory","ror":"https://ror.org/01p6gzq21","country_code":"BR","type":"facility","lineage":["https://openalex.org/I4210106422","https://openalex.org/I4210151455","https://openalex.org/I4210152696"]}],"countries":["BR"],"is_corresponding":true,"raw_author_name":"J.C. Gonz\u00e1lez","raw_affiliation_strings":["Laborat\u00f3rio de Microscopia Eletr\u00f4nica, Laborat\u00f3rio Nacional de Luz Sincrotron, Caixa Postal 6192, 13081-970 Campinas, S\u00e3o Paulo, Brazil"],"affiliations":[{"raw_affiliation_string":"Laborat\u00f3rio de Microscopia Eletr\u00f4nica, Laborat\u00f3rio Nacional de Luz Sincrotron, Caixa Postal 6192, 13081-970 Campinas, S\u00e3o Paulo, Brazil","institution_ids":["https://openalex.org/I4210106422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072820169","display_name":"M.I.N. da Silva","orcid":null},"institutions":[{"id":"https://openalex.org/I181391015","display_name":"Universidade Estadual de Campinas (UNICAMP)","ror":"https://ror.org/04wffgt70","country_code":"BR","type":"education","lineage":["https://openalex.org/I181391015"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"M.I.N. da Silva","raw_affiliation_strings":["Instituto de F\u0131\u0301sica \u201cGleb Wataghin\u201d, Universidade Estadual de Campinas,Caixa Postal 6165, 13081-970 Campinas, S\u00e3o Paulo, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de F\u0131\u0301sica \u201cGleb Wataghin\u201d, Universidade Estadual de Campinas,Caixa Postal 6165, 13081-970 Campinas, S\u00e3o Paulo, Brazil","institution_ids":["https://openalex.org/I181391015"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110237106","display_name":"KL Bunker","orcid":null},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K.L. Bunker","raw_affiliation_strings":["Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA"],"affiliations":[{"raw_affiliation_string":"Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108389948","display_name":"A.D. Batchelor","orcid":null},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A.D. Batchelor","raw_affiliation_strings":["Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA"],"affiliations":[{"raw_affiliation_string":"Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110483373","display_name":"P. E. Russell","orcid":null},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P.E. Russell","raw_affiliation_strings":["Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA"],"affiliations":[{"raw_affiliation_string":"Analytical Instrumentation Facility, North Carolina State University, Box 7531, 27695-7531 Raleigh, NC, USA","institution_ids":["https://openalex.org/I137902535"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5054868616"],"corresponding_institution_ids":["https://openalex.org/I4210106422"],"apc_list":{"value":2370,"currency":"USD","value_usd":2370},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.15049692,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"34","issue":"5-8","first_page":"455","last_page":"457"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.8161165714263916},{"id":"https://openalex.org/keywords/electron-beam-induced-current","display_name":"Electron beam-induced current","score":0.7708020806312561},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7208095192909241},{"id":"https://openalex.org/keywords/quantum-well","display_name":"Quantum well","score":0.6834561824798584},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6179231405258179},{"id":"https://openalex.org/keywords/transmission-electron-microscopy","display_name":"Transmission electron microscopy","score":0.6152280569076538},{"id":"https://openalex.org/keywords/scanning-transmission-electron-microscopy","display_name":"Scanning transmission electron microscopy","score":0.546280562877655},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5452095866203308},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.5104645490646362},{"id":"https://openalex.org/keywords/nanometre","display_name":"Nanometre","score":0.41787034273147583},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.33949756622314453},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2675509452819824},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12531977891921997},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.0538293719291687}],"concepts":[{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.8161165714263916},{"id":"https://openalex.org/C2779162123","wikidata":"https://www.wikidata.org/wiki/Q3717138","display_name":"Electron beam-induced current","level":3,"score":0.7708020806312561},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7208095192909241},{"id":"https://openalex.org/C29169072","wikidata":"https://www.wikidata.org/wiki/Q521166","display_name":"Quantum well","level":3,"score":0.6834561824798584},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6179231405258179},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.6152280569076538},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.546280562877655},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5452095866203308},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5104645490646362},{"id":"https://openalex.org/C77066764","wikidata":"https://www.wikidata.org/wiki/Q178674","display_name":"Nanometre","level":2,"score":0.41787034273147583},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.33949756622314453},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2675509452819824},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12531977891921997},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0538293719291687},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/s0026-2692(03)00072-7","is_oa":false,"landing_page_url":"https://doi.org/10.1016/s0026-2692(03)00072-7","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.7300000190734863}],"awards":[],"funders":[{"id":"https://openalex.org/F4320320997","display_name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo","ror":"https://ror.org/02ddkpn78"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2006932952","https://openalex.org/W2020492420","https://openalex.org/W2031208731","https://openalex.org/W2032670028","https://openalex.org/W2044251350","https://openalex.org/W2050109021","https://openalex.org/W2072181732","https://openalex.org/W2081645005","https://openalex.org/W4301664068","https://openalex.org/W6845193961"],"related_works":["https://openalex.org/W2040216612","https://openalex.org/W3034770378","https://openalex.org/W4301664068","https://openalex.org/W2898911036","https://openalex.org/W4281780874","https://openalex.org/W4225523426","https://openalex.org/W3146794325","https://openalex.org/W4221144450","https://openalex.org/W2090597661","https://openalex.org/W4281902284"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}