{"id":"https://openalex.org/W7161776817","doi":"https://doi.org/10.1016/j.ress.2026.112903","title":"An improved GO-FLOW model for reliability analysis and prediction of cold-standby systems","display_name":"An improved GO-FLOW model for reliability analysis and prediction of cold-standby systems","publication_year":2026,"publication_date":"2026-05-20","ids":{"openalex":"https://openalex.org/W7161776817","doi":"https://doi.org/10.1016/j.ress.2026.112903"},"language":"en","primary_location":{"id":"doi:10.1016/j.ress.2026.112903","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ress.2026.112903","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1016/j.ress.2026.112903","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109492481","display_name":"Chenyu Jiang","orcid":"https://orcid.org/0009-0004-3699-1974"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenyu Jiang","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0004-3699-1974","affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121739643","display_name":"Baimao Lei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Baimao Lei","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5136551933","display_name":"Qiang Chen Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Chen","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124065860","display_name":"Runchao Wei","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runchao Wei","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0004-4572-7243","affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou, China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101197505","display_name":"Zhanyu He","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]},{"id":"https://openalex.org/I890469752","display_name":"Ministry of Industry and Information Technology","ror":"https://ror.org/0385nmy68","country_code":"CN","type":"government","lineage":["https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhanyu He","raw_affiliation_strings":["China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","Ministry of Industry and Information Technology Key Laboratory of Quality and Reliability Engineering Technology of Civil Aircraft and Aero-Engin, Guangzhou, China"],"raw_orcid":"https://orcid.org/0009-0004-5574-4506","affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environmental Testing Research Institute (China CEPREI Laboratory), China","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"Ministry of Industry and Information Technology Key Laboratory of Quality and Reliability Engineering Technology of Civil Aircraft and Aero-Engin, Guangzhou, China","institution_ids":["https://openalex.org/I890469752"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5136555512","display_name":"Jun Yang","orcid":"https://orcid.org/0009-0002-7294-0221"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jun Yang","raw_affiliation_strings":["School of Electric Power Engineering, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-8499-9074","affiliations":[{"raw_affiliation_string":"School of Electric Power Engineering, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5121739643"],"corresponding_institution_ids":["https://openalex.org/I4210113818"],"apc_list":{"value":4190,"currency":"USD","value_usd":4190},"apc_paid":{"value":4190,"currency":"USD","value_usd":4190},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.75358379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"276","issue":null,"first_page":"112903","last_page":"112903"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.17090000212192535,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.17090000212192535,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12560","display_name":"Nuclear Engineering Thermal-Hydraulics","score":0.08900000154972076,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.08569999784231186,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7070000171661377},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.311599999666214},{"id":"https://openalex.org/keywords/component","display_name":"Component (thermodynamics)","score":0.23499999940395355},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.2062000036239624},{"id":"https://openalex.org/keywords/statistical-analysis","display_name":"Statistical analysis","score":0.20559999346733093}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7070000171661377},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6930000185966492},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5824000239372253},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.311599999666214},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2874000072479248},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.26589998602867126},{"id":"https://openalex.org/C168167062","wikidata":"https://www.wikidata.org/wiki/Q1117970","display_name":"Component (thermodynamics)","level":2,"score":0.23499999940395355},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.2062000036239624},{"id":"https://openalex.org/C2986587452","wikidata":"https://www.wikidata.org/wiki/Q938438","display_name":"Statistical analysis","level":2,"score":0.20559999346733093},{"id":"https://openalex.org/C3019813237","wikidata":"https://www.wikidata.org/wiki/Q65089264","display_name":"Model validation","level":2,"score":0.20069999992847443}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ress.2026.112903","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ress.2026.112903","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1016/j.ress.2026.112903","is_oa":true,"landing_page_url":"https://doi.org/10.1016/j.ress.2026.112903","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323970","display_name":"Ministry of Industry and Information Technology of the People's Republic of China","ror":"https://ror.org/0385nmy68"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1947190698","https://openalex.org/W1970414345","https://openalex.org/W2092903177","https://openalex.org/W2317066319","https://openalex.org/W2382751631","https://openalex.org/W2895320029","https://openalex.org/W2906395402","https://openalex.org/W2962754400","https://openalex.org/W3011802626","https://openalex.org/W3178005505","https://openalex.org/W3211077771","https://openalex.org/W4292820483","https://openalex.org/W4316039357","https://openalex.org/W4317935263","https://openalex.org/W4382559819","https://openalex.org/W4385779303","https://openalex.org/W4387233014","https://openalex.org/W4389368688","https://openalex.org/W4389681595","https://openalex.org/W4391781237","https://openalex.org/W4407866984","https://openalex.org/W4410109017","https://openalex.org/W4410278299","https://openalex.org/W4413332650","https://openalex.org/W4415496272"],"related_works":[],"abstract_inverted_index":{"Cold-standby,":[0],"serving":[1],"as":[2,93],"typical":[3],"methods":[4],"to":[5,25,34,56,97,131,170],"enhance":[6],"system":[7,166],"reliability,":[8],"are":[9,141],"extensively":[10],"utilized":[11],"in":[12,35,83,114,149],"a":[13,72,154,158],"wide":[14],"range":[15],"of":[16,47,75,102,119,137,157,176],"systems":[17,139],"that":[18,29,140],"necessitate":[19],"high":[20],"mission":[21],"reliability.":[22],"However,":[23],"owing":[24],"the":[26,30,43,50,84,87,99,103,115,117,133,150,172,177],"varying":[27],"stresses":[28],"equipment":[31],"is":[32,54],"subjected":[33],"its":[36],"standby":[37],"and":[38,113,161,174],"operational":[39],"states,":[40],"coupled":[41],"with":[42,146],"potentially":[44],"complex":[45],"structures":[46],"cold-standby":[48,138],"systems,":[49],"current":[51],"GO-FLOW":[52,69,76],"model":[53,70,90],"found":[55],"be":[57],"inadequate":[58],"for":[59],"addressing":[60],"such":[61],"scenarios.":[62],"To":[63],"address":[64,132],"this":[65],"issue,":[66],"an":[67],"improved":[68],"containing":[71],"novel":[73],"type":[74],"operator":[77,107],"(the":[78],"Type-45":[79,106],"operator)":[80],"was":[81,91,127,168],"proposed":[82,178],"paper,":[85,116],"where":[86],"discrete":[88],"Markov":[89],"employed":[92],"intrinsic":[94],"computational":[95],"logic":[96],"calculate":[98],"output":[100,111,125],"signal":[101],"operator.":[104],"The":[105],"integrates":[108],"two":[109,124],"distinct":[110],"modes,":[112],"process":[118],"reliability":[120,134],"modeling":[121,135],"utilizing":[122],"these":[123],"modes":[126],"elaborated":[128],"upon,":[129],"aiming":[130],"challenges":[136],"relatively":[142],"independent":[143],"or":[144],"associated":[145],"other":[147],"devices":[148],"whole":[151],"system.":[152],"Finally,":[153],"numerical":[155],"example":[156],"hypothetical":[159],"four-active-unit":[160],"one-standby-unit":[162],"variable":[163],"frequency":[164],"drive":[165],"(FOVFDS)":[167],"provided":[169],"illustrate":[171],"feasibility":[173],"accuracy":[175],"method.":[179]},"counts_by_year":[],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2026-05-21T00:00:00"}