{"id":"https://openalex.org/W7128918400","doi":"https://doi.org/10.1016/j.ress.2026.112395","title":"Data-driven time-variant reliability analysis using deep Gaussian processes","display_name":"Data-driven time-variant reliability analysis using deep Gaussian processes","publication_year":2026,"publication_date":"2026-02-14","ids":{"openalex":"https://openalex.org/W7128918400","doi":"https://doi.org/10.1016/j.ress.2026.112395"},"language":"en","primary_location":{"id":"doi:10.1016/j.ress.2026.112395","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ress.2026.112395","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074811273","display_name":"Yongsu Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I94588446","display_name":"Hongik University","ror":"https://ror.org/00egdv862","country_code":"KR","type":"education","lineage":["https://openalex.org/I94588446"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongsu Jung","raw_affiliation_strings":["Department of Mechanical and Design Engineering, Hongik University, 94 Wausan-ro Mapo-gu, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical and Design Engineering, Hongik University, 94 Wausan-ro Mapo-gu, Seoul, South Korea","institution_ids":["https://openalex.org/I94588446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016305134","display_name":"Mingyu Lee","orcid":"https://orcid.org/0009-0007-9594-0837"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mingyu Lee","raw_affiliation_strings":["KAIST InnoCORE PRISM-AI Center, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0009-0007-9594-0837","affiliations":[{"raw_affiliation_string":"KAIST InnoCORE PRISM-AI Center, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063004167","display_name":"I.K. Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Ikjin Lee","raw_affiliation_strings":["Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea","KAIST InnoCORE PRISM-AI Center, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"KAIST InnoCORE PRISM-AI Center, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong District, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5063004167"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":{"value":4190,"currency":"USD","value_usd":4190},"apc_paid":null,"fwci":19.0805,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.98312914,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"274","issue":null,"first_page":"112395","last_page":"112395"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9093999862670898,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9093999862670898,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.028300000354647636,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.025800000876188278,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/uncertainty-quantification","display_name":"Uncertainty quantification","score":0.7269999980926514},{"id":"https://openalex.org/keywords/bootstrapping","display_name":"Bootstrapping (finance)","score":0.6887999773025513},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.6762999892234802},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6323000192642212},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.5292999744415283},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.48980000615119934},{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.4535999894142151},{"id":"https://openalex.org/keywords/kernel-density-estimation","display_name":"Kernel density estimation","score":0.44530001282691956},{"id":"https://openalex.org/keywords/kernel","display_name":"Kernel (algebra)","score":0.43070000410079956},{"id":"https://openalex.org/keywords/probability-distribution","display_name":"Probability distribution","score":0.4174000024795532}],"concepts":[{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.7269999980926514},{"id":"https://openalex.org/C207609745","wikidata":"https://www.wikidata.org/wiki/Q4944086","display_name":"Bootstrapping (finance)","level":2,"score":0.6887999773025513},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.6762999892234802},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6323000192642212},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5789999961853027},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.5292999744415283},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.48980000615119934},{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.4535999894142151},{"id":"https://openalex.org/C71134354","wikidata":"https://www.wikidata.org/wiki/Q458825","display_name":"Kernel density estimation","level":3,"score":0.44530001282691956},{"id":"https://openalex.org/C74193536","wikidata":"https://www.wikidata.org/wiki/Q574844","display_name":"Kernel (algebra)","level":2,"score":0.43070000410079956},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.4174000024795532},{"id":"https://openalex.org/C161584116","wikidata":"https://www.wikidata.org/wiki/Q1952580","display_name":"Multivariate statistics","level":2,"score":0.41519999504089355},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.39329999685287476},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3707999885082245},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.3686000108718872},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.3522999882698059},{"id":"https://openalex.org/C81692654","wikidata":"https://www.wikidata.org/wiki/Q225926","display_name":"Kriging","level":2,"score":0.3375000059604645},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.3325999975204468},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.328000009059906},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.32429999113082886},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.32330000400543213},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.31869998574256897},{"id":"https://openalex.org/C177384507","wikidata":"https://www.wikidata.org/wiki/Q1149000","display_name":"Multivariate normal distribution","level":3,"score":0.3167000114917755},{"id":"https://openalex.org/C47822265","wikidata":"https://www.wikidata.org/wiki/Q854457","display_name":"Complex system","level":2,"score":0.3149000108242035},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3001999855041504},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2976999878883362},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29089999198913574},{"id":"https://openalex.org/C122203268","wikidata":"https://www.wikidata.org/wiki/Q5862903","display_name":"Probability theory","level":2,"score":0.2904999852180481},{"id":"https://openalex.org/C73722673","wikidata":"https://www.wikidata.org/wiki/Q1082833","display_name":"Probabilistic risk assessment","level":3,"score":0.28859999775886536},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.28839999437332153},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.28369998931884766},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2750999927520752},{"id":"https://openalex.org/C24404364","wikidata":"https://www.wikidata.org/wiki/Q7246846","display_name":"Probabilistic analysis of algorithms","level":3,"score":0.27250000834465027},{"id":"https://openalex.org/C56672385","wikidata":"https://www.wikidata.org/wiki/Q17157111","display_name":"Mixture distribution","level":3,"score":0.27059999108314514},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.260699987411499},{"id":"https://openalex.org/C141547133","wikidata":"https://www.wikidata.org/wiki/Q7291996","display_name":"Random variate","level":3,"score":0.2587999999523163},{"id":"https://openalex.org/C130402806","wikidata":"https://www.wikidata.org/wiki/Q5361768","display_name":"Random field","level":2,"score":0.25600001215934753},{"id":"https://openalex.org/C18653775","wikidata":"https://www.wikidata.org/wiki/Q1333358","display_name":"Joint probability distribution","level":2,"score":0.25360000133514404}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ress.2026.112395","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ress.2026.112395","pdf_url":null,"source":{"id":"https://openalex.org/S202403813","display_name":"Reliability Engineering & System Safety","issn_l":"0951-8320","issn":["0951-8320","1879-0836"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Reliability Engineering & System Safety","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7597955465316772,"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":58,"referenced_works":["https://openalex.org/W427458198","https://openalex.org/W1667981649","https://openalex.org/W1928195746","https://openalex.org/W1963504402","https://openalex.org/W1975369035","https://openalex.org/W2000774120","https://openalex.org/W2018655422","https://openalex.org/W2025720061","https://openalex.org/W2059070214","https://openalex.org/W2069233750","https://openalex.org/W2070098157","https://openalex.org/W2072897170","https://openalex.org/W2075005436","https://openalex.org/W2075967518","https://openalex.org/W2078429918","https://openalex.org/W2081287822","https://openalex.org/W2114509411","https://openalex.org/W2155117533","https://openalex.org/W2297009022","https://openalex.org/W2338207464","https://openalex.org/W2417006653","https://openalex.org/W2428285201","https://openalex.org/W2532950076","https://openalex.org/W2581983241","https://openalex.org/W2613925154","https://openalex.org/W2642384746","https://openalex.org/W2920383587","https://openalex.org/W2953822436","https://openalex.org/W2955851813","https://openalex.org/W2970151564","https://openalex.org/W3044858088","https://openalex.org/W3047165269","https://openalex.org/W3159013477","https://openalex.org/W3177862100","https://openalex.org/W4206070193","https://openalex.org/W4236807389","https://openalex.org/W4293385652","https://openalex.org/W4313215092","https://openalex.org/W4379144785","https://openalex.org/W4387005891","https://openalex.org/W4387469341","https://openalex.org/W4388914448","https://openalex.org/W4389118156","https://openalex.org/W4390168862","https://openalex.org/W4396793063","https://openalex.org/W4398243208","https://openalex.org/W4400391038","https://openalex.org/W4401877413","https://openalex.org/W4402241103","https://openalex.org/W4403118780","https://openalex.org/W4403364324","https://openalex.org/W4404958664","https://openalex.org/W4408328309","https://openalex.org/W4408854923","https://openalex.org/W4410230532","https://openalex.org/W4411200988","https://openalex.org/W4413020193","https://openalex.org/W4415225666"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-02-26T06:29:33.603293","created_date":"2026-02-15T00:00:00"}