{"id":"https://openalex.org/W7161843546","doi":"https://doi.org/10.1016/j.neucom.2026.133944","title":"TAD-ILFD: A transformer-guided dual-branch framework for incremental fault diagnosis","display_name":"TAD-ILFD: A transformer-guided dual-branch framework for incremental fault diagnosis","publication_year":2026,"publication_date":"2026-05-20","ids":{"openalex":"https://openalex.org/W7161843546","doi":"https://doi.org/10.1016/j.neucom.2026.133944"},"language":"en","primary_location":{"id":"doi:10.1016/j.neucom.2026.133944","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.neucom.2026.133944","pdf_url":null,"source":{"id":"https://openalex.org/S45693802","display_name":"Neurocomputing","issn_l":"0925-2312","issn":["0925-2312","1872-8286"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neurocomputing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103205302","display_name":"Yiwen Cui","orcid":"https://orcid.org/0000-0002-7588-1063"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yiwen Cui","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100457141","display_name":"Jin Cui","orcid":"https://orcid.org/0000-0001-5530-4843"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiwen Cui","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100457141","display_name":"Jin Cui","orcid":"https://orcid.org/0000-0001-5530-4843"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jin Cui","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":null,"display_name":"Mei Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I159389169","display_name":"Ningbo University of Technology","ror":"https://ror.org/037dym702","country_code":"CN","type":"education","lineage":["https://openalex.org/I159389169"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mei Yuan","raw_affiliation_strings":["Ningbo Institute of Technology, Beihang University, Ningbo 315800, China","School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ningbo Institute of Technology, Beihang University, Ningbo 315800, China","institution_ids":["https://openalex.org/I159389169","https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, 37 Xueyuan Road, Haidian, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100457141","https://openalex.org/A5103205302"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":2470,"currency":"USD","value_usd":2470},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.5298782,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"695","issue":null,"first_page":"133944","last_page":"133944"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.8234999775886536,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.8234999775886536,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","score":0.04039999842643738,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.020899999886751175,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.7024999856948853},{"id":"https://openalex.org/keywords/adaptability","display_name":"Adaptability","score":0.6176999807357788},{"id":"https://openalex.org/keywords/incremental-learning","display_name":"Incremental learning","score":0.5554999709129333},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4796000123023987},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4542999863624573},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.37389999628067017},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.3531000018119812}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.786300003528595},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7024999856948853},{"id":"https://openalex.org/C177606310","wikidata":"https://www.wikidata.org/wiki/Q5674297","display_name":"Adaptability","level":2,"score":0.6176999807357788},{"id":"https://openalex.org/C2780735816","wikidata":"https://www.wikidata.org/wiki/Q28324931","display_name":"Incremental learning","level":2,"score":0.5554999709129333},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5220000147819519},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4796000123023987},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4650999903678894},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45829999446868896},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4542999863624573},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.37389999628067017},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.3531000018119812},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.3467999994754791},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.2928999960422516},{"id":"https://openalex.org/C4554734","wikidata":"https://www.wikidata.org/wiki/Q593744","display_name":"Knowledge base","level":2,"score":0.28060001134872437},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.28029999136924744},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.27959999442100525},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.271699994802475},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.26579999923706055},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.2648000121116638},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.2549999952316284}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.neucom.2026.133944","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.neucom.2026.133944","pdf_url":null,"source":{"id":"https://openalex.org/S45693802","display_name":"Neurocomputing","issn_l":"0925-2312","issn":["0925-2312","1872-8286"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Neurocomputing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G932247082","display_name":null,"funder_award_id":"2022YFB3305603","funder_id":"https://openalex.org/F4320335774","funder_display_name":"Key Technologies Research and Development Program"}],"funders":[{"id":"https://openalex.org/F4320335774","display_name":"Key Technologies Research and Development Program","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2006523447","https://openalex.org/W2035398862","https://openalex.org/W2139833307","https://openalex.org/W2788388592","https://openalex.org/W2789515102","https://openalex.org/W2965875348","https://openalex.org/W3174488350","https://openalex.org/W3194185277","https://openalex.org/W3196119092","https://openalex.org/W4221129249","https://openalex.org/W4225407267","https://openalex.org/W4226269423","https://openalex.org/W4286377585","https://openalex.org/W4293004936","https://openalex.org/W4390955332","https://openalex.org/W4401014205","https://openalex.org/W4405618343","https://openalex.org/W4407615641","https://openalex.org/W4410934777","https://openalex.org/W4412623380"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2026-05-21T00:00:00"}