{"id":"https://openalex.org/W2518866599","doi":"https://doi.org/10.1016/j.microrel.2016.07.107","title":"Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop","display_name":"Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2518866599","doi":"https://doi.org/10.1016/j.microrel.2016.07.107","mag":"2518866599"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2016.07.107","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.07.107","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110223257","display_name":"C. T. Chua","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"C.T. Chua","raw_affiliation_strings":["School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090497397","display_name":"H G Ong","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"H.G. Ong","raw_affiliation_strings":["Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore"],"affiliations":[{"raw_affiliation_string":"Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056528553","display_name":"Kevin J. Sanchez","orcid":"https://orcid.org/0000-0003-4456-0918"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"K. Sanchez","raw_affiliation_strings":["CNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France"],"affiliations":[{"raw_affiliation_string":"CNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111876180","display_name":"P. Perdu","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"P. Perdu","raw_affiliation_strings":["CNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France","Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore"],"affiliations":[{"raw_affiliation_string":"CNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France","institution_ids":[]},{"raw_affiliation_string":"Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006684936","display_name":"Chee Lip Gan","orcid":"https://orcid.org/0000-0002-8420-3168"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"C.L. Gan","raw_affiliation_strings":["School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore","Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore"],"affiliations":[{"raw_affiliation_string":"School of Materials Science and Engineering, Nanyang Technological University, Singapore 639798, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Temasek Laboratories@NTU, Nanyang Technological University, Singapore 637553, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5006684936"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.08453595,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":"64","issue":null,"first_page":"199","last_page":"203"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.8193942308425903},{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.7643794417381287},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.70196533203125},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6845260262489319},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.6226632595062256},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5844437479972839},{"id":"https://openalex.org/keywords/cross-section","display_name":"Cross section (physics)","score":0.5588130354881287},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5561662912368774},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.5450960397720337},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5046292543411255},{"id":"https://openalex.org/keywords/schmitt-trigger","display_name":"Schmitt trigger","score":0.47888892889022827},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.388557106256485},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3822716176509857},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2844622731208801},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.23722806572914124},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22238299250602722},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.16046902537345886},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08699464797973633}],"concepts":[{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.8193942308425903},{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.7643794417381287},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.70196533203125},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6845260262489319},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.6226632595062256},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5844437479972839},{"id":"https://openalex.org/C52234038","wikidata":"https://www.wikidata.org/wiki/Q17128025","display_name":"Cross section (physics)","level":2,"score":0.5588130354881287},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5561662912368774},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5450960397720337},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5046292543411255},{"id":"https://openalex.org/C90201813","wikidata":"https://www.wikidata.org/wiki/Q202957","display_name":"Schmitt trigger","level":3,"score":0.47888892889022827},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.388557106256485},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3822716176509857},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2844622731208801},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.23722806572914124},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22238299250602722},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.16046902537345886},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08699464797973633},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.microrel.2016.07.107","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2016.07.107","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320313549","display_name":"Providence Health Care","ror":"https://ror.org/03qqdf793"},{"id":"https://openalex.org/F4320321519","display_name":"Centre National d\u2019Etudes Spatiales","ror":"https://ror.org/04h1h0y33"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W51893710","https://openalex.org/W1977106413","https://openalex.org/W2005511786","https://openalex.org/W2024603343","https://openalex.org/W2062874667","https://openalex.org/W2078738795","https://openalex.org/W2103902557","https://openalex.org/W2127658067","https://openalex.org/W2138558164","https://openalex.org/W2141923856","https://openalex.org/W2144309898","https://openalex.org/W2160155636","https://openalex.org/W2167123894","https://openalex.org/W2170761164","https://openalex.org/W2536322740","https://openalex.org/W2605524227","https://openalex.org/W2618098076","https://openalex.org/W4255048102","https://openalex.org/W4298023278","https://openalex.org/W6602084073","https://openalex.org/W6728688800","https://openalex.org/W6732308636"],"related_works":["https://openalex.org/W2351372921","https://openalex.org/W3003392923","https://openalex.org/W1999009572","https://openalex.org/W2528378834","https://openalex.org/W2560368994","https://openalex.org/W2206746378","https://openalex.org/W2065669439","https://openalex.org/W2005533750","https://openalex.org/W2125174273","https://openalex.org/W2387427186","https://openalex.org/W2612100098","https://openalex.org/W3007996546","https://openalex.org/W2149032943","https://openalex.org/W2021790157","https://openalex.org/W2011683918","https://openalex.org/W1978084718","https://openalex.org/W2160415334","https://openalex.org/W2950837032","https://openalex.org/W2161917951","https://openalex.org/W2154051034"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}