{"id":"https://openalex.org/W2036492122","doi":"https://doi.org/10.1016/j.microrel.2011.06.051","title":"ESD sensitivity of a GaAs MMIC microwave power amplifier","display_name":"ESD sensitivity of a GaAs MMIC microwave power amplifier","publication_year":2011,"publication_date":"2011-07-25","ids":{"openalex":"https://openalex.org/W2036492122","doi":"https://doi.org/10.1016/j.microrel.2011.06.051","mag":"2036492122"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2011.06.051","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2011.06.051","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017729184","display_name":"Augusto Tazzoli","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]},{"id":"https://openalex.org/I79576946","display_name":"University of Pennsylvania","ror":"https://ror.org/00b30xv10","country_code":"US","type":"education","lineage":["https://openalex.org/I79576946"]}],"countries":["IT","US"],"is_corresponding":true,"raw_author_name":"Augusto Tazzoli","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy","University of Pennsylvania, Dept. of Electrical and Systems Engineering, Philadelphia, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"University of Pennsylvania, Dept. of Electrical and Systems Engineering, Philadelphia, USA","institution_ids":["https://openalex.org/I79576946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085031554","display_name":"Isabella Rossetto","orcid":"https://orcid.org/0000-0002-9397-6146"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Isabella Rossetto","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"Enrico Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I4210164059","display_name":"Consorzio Nazionale Interuniversitario per la Nanoelettronica","ror":"https://ror.org/05gnna589","country_code":"IT","type":"nonprofit","lineage":["https://openalex.org/I4210164059"]},{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zanoni","raw_affiliation_strings":["Italian Universities NanoElectronics Team (IUNET), 40125 Bologna, Italy","University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Italian Universities NanoElectronics Team (IUNET), 40125 Bologna, Italy","institution_ids":["https://openalex.org/I4210164059"]},{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101674804","display_name":"Yufeng Dai","orcid":"https://orcid.org/0000-0001-9519-3164"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dai Yufeng","raw_affiliation_strings":["HUAWEI Technologies, Centro Direzionale Milano 2, Palazzo Verrocchio, 3rd floor, 20090 Segrate (MI), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HUAWEI Technologies, Centro Direzionale Milano 2, Palazzo Verrocchio, 3rd floor, 20090 Segrate (MI), Italy","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009150694","display_name":"T. Tomasi","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tiziana Tomasi","raw_affiliation_strings":["HUAWEI Technologies, Centro Direzionale Milano 2, Palazzo Verrocchio, 3rd floor, 20090 Segrate (MI), Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HUAWEI Technologies, Centro Direzionale Milano 2, Palazzo Verrocchio, 3rd floor, 20090 Segrate (MI), Italy","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I4210164059","display_name":"Consorzio Nazionale Interuniversitario per la Nanoelettronica","ror":"https://ror.org/05gnna589","country_code":"IT","type":"nonprofit","lineage":["https://openalex.org/I4210164059"]},{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gaudenzio Meneghesso","raw_affiliation_strings":["Italian Universities NanoElectronics Team (IUNET), 40125 Bologna, Italy","University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Italian Universities NanoElectronics Team (IUNET), 40125 Bologna, Italy","institution_ids":["https://openalex.org/I4210164059"]},{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5017729184"],"corresponding_institution_ids":["https://openalex.org/I138689650","https://openalex.org/I79576946"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.09748824,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":"51","issue":"9-11","first_page":"1602","last_page":"1607"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/monolithic-microwave-integrated-circuit","display_name":"Monolithic microwave integrated circuit","score":0.8177666664123535},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6242581605911255},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5796399712562561},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.5765442848205566},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5758410096168518},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.49308010935783386},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4443175196647644},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4316188097000122},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3889654278755188},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36161506175994873},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2220434546470642},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.20572969317436218},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.08555027842521667}],"concepts":[{"id":"https://openalex.org/C128450285","wikidata":"https://www.wikidata.org/wiki/Q1945036","display_name":"Monolithic microwave integrated circuit","level":4,"score":0.8177666664123535},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6242581605911255},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5796399712562561},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.5765442848205566},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5758410096168518},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.49308010935783386},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4443175196647644},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4316188097000122},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3889654278755188},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36161506175994873},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2220434546470642},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.20572969317436218},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.08555027842521667},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.microrel.2011.06.051","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2011.06.051","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:www.research.unipd.it:11577/2477945","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2477945","pdf_url":null,"source":{"id":"https://openalex.org/S4306402547","display_name":"Padua Research Archive (University of Padova)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8700000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320313987","display_name":"Universit\u00e0 degli Studi di Cagliari","ror":"https://ror.org/003109y17"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1543631479","https://openalex.org/W1992272945","https://openalex.org/W2016163214","https://openalex.org/W2096711383","https://openalex.org/W2099355000","https://openalex.org/W2133295877","https://openalex.org/W2151281247","https://openalex.org/W2156602059","https://openalex.org/W2171346200","https://openalex.org/W4229741765","https://openalex.org/W4298033106","https://openalex.org/W6685200739"],"related_works":["https://openalex.org/W2062992686","https://openalex.org/W2216175200","https://openalex.org/W4281691147","https://openalex.org/W1723990645","https://openalex.org/W1669736425","https://openalex.org/W2600196889","https://openalex.org/W3176365265","https://openalex.org/W2269509687","https://openalex.org/W3012336578","https://openalex.org/W2135814299"],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-05-08T15:41:06.802602","created_date":"2025-10-10T00:00:00"}