{"id":"https://openalex.org/W2001884510","doi":"https://doi.org/10.1016/j.microrel.2010.07.028","title":"Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65nm technology platform","display_name":"Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65nm technology platform","publication_year":2010,"publication_date":"2010-08-09","ids":{"openalex":"https://openalex.org/W2001884510","doi":"https://doi.org/10.1016/j.microrel.2010.07.028","mag":"2001884510"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2010.07.028","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.028","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004685403","display_name":"A. Tazzoli","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"A. Tazzoli","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071166991","display_name":"Martina Cordoni","orcid":"https://orcid.org/0009-0005-9353-4320"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Cordoni","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza (MI), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza (MI), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032009641","display_name":"Paolo Colombo","orcid":"https://orcid.org/0000-0001-8005-6618"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Colombo","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza (MI), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza (MI), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069692600","display_name":"C. Bergonzoni","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. Bergonzoni","raw_affiliation_strings":["STMicroelectronics, Agrate Brianza (MI), Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Agrate Brianza (MI), Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Meneghesso","raw_affiliation_strings":["University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova, Department of Information Engineering, Via Gradenigo 6/b, 35100 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5004685403"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08320353,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"50","issue":"9-11","first_page":"1373","last_page":"1378"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.6473585367202759},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6077186465263367},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.5628554821014404},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5092602968215942},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.46506598591804504},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4641581177711487},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.4232552647590637},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4132625460624695},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4003898501396179},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3565164804458618},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3377837538719177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3333565592765808},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1744784116744995},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0956261157989502}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.6473585367202759},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6077186465263367},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.5628554821014404},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5092602968215942},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.46506598591804504},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4641581177711487},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.4232552647590637},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4132625460624695},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4003898501396179},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3565164804458618},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3377837538719177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3333565592765808},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1744784116744995},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0956261157989502},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.microrel.2010.07.028","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2010.07.028","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:www.research.unipd.it:11577/2425525","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2425525","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.699999988079071,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1608682701","https://openalex.org/W1944171008","https://openalex.org/W2106281406","https://openalex.org/W2137040915","https://openalex.org/W2568298254","https://openalex.org/W4251109733","https://openalex.org/W4298033106"],"related_works":["https://openalex.org/W2116397085","https://openalex.org/W2017101954","https://openalex.org/W4292829129","https://openalex.org/W2134039168","https://openalex.org/W2537636062","https://openalex.org/W1594494193","https://openalex.org/W2378293894","https://openalex.org/W2135436866","https://openalex.org/W1994190181","https://openalex.org/W2613072279"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}