{"id":"https://openalex.org/W2043430061","doi":"https://doi.org/10.1016/j.microrel.2009.07.018","title":"Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test","display_name":"Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test","publication_year":2009,"publication_date":"2009-08-09","ids":{"openalex":"https://openalex.org/W2043430061","doi":"https://doi.org/10.1016/j.microrel.2009.07.018","mag":"2043430061"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2009.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2009.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059829317","display_name":"N. Ronchi","orcid":"https://orcid.org/0000-0002-7961-4077"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"N. Ronchi","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003797022","display_name":"Franco Zanon","orcid":"https://orcid.org/0000-0003-2277-4579"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"F. Zanon","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054459896","display_name":"Antonio Stocco","orcid":"https://orcid.org/0000-0002-5524-4323"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Stocco","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004685403","display_name":"A. Tazzoli","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Tazzoli","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"Enrico Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"E. Zanoni","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"G. Meneghesso","raw_affiliation_strings":["Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Information Engineering, University of Padova, Via Gradenigo 6/B, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering , University of Padova , via Gradenigo 6/b 35131, Padova , Italy","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5059829317"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.7862,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.70316365,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"49","issue":"9-11","first_page":"1207","last_page":"1210"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/high-electron-mobility-transistor","display_name":"High-electron-mobility transistor","score":0.9347339868545532},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7627257108688354},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7489233613014221},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6710576415061951},{"id":"https://openalex.org/keywords/composite-number","display_name":"Composite number","score":0.6410553455352783},{"id":"https://openalex.org/keywords/substrate","display_name":"Substrate (aquarium)","score":0.5287786722183228},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.5053399205207825},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4430096745491028},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.44044598937034607},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35794201493263245},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3576124310493469},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.3073483109474182},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2935652732849121},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.20785874128341675},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1551523506641388},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.08338576555252075},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05916288495063782},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.052944332361221313}],"concepts":[{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.9347339868545532},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7627257108688354},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7489233613014221},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6710576415061951},{"id":"https://openalex.org/C104779481","wikidata":"https://www.wikidata.org/wiki/Q50707","display_name":"Composite number","level":2,"score":0.6410553455352783},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.5287786722183228},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.5053399205207825},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4430096745491028},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.44044598937034607},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35794201493263245},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3576124310493469},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3073483109474182},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2935652732849121},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.20785874128341675},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1551523506641388},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.08338576555252075},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05916288495063782},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.052944332361221313},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1016/j.microrel.2009.07.018","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2009.07.018","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:www.research.unipd.it:11577/2440606","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2440606","pdf_url":null,"source":{"id":"https://openalex.org/S4306402547","display_name":"Padua Research Archive (University of Padova)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1964520850","https://openalex.org/W2159824107","https://openalex.org/W2163194368"],"related_works":["https://openalex.org/W2472160638","https://openalex.org/W3209950509","https://openalex.org/W2559825181","https://openalex.org/W1975307200","https://openalex.org/W4377089489","https://openalex.org/W3088454288","https://openalex.org/W4313611767","https://openalex.org/W2613044742","https://openalex.org/W4385217635","https://openalex.org/W2466508933"],"abstract_inverted_index":null,"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2014,"cited_by_count":4},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-28T07:46:37.118299","created_date":"2025-10-10T00:00:00"}