{"id":"https://openalex.org/W2094469645","doi":"https://doi.org/10.1016/j.microrel.2007.01.008","title":"Ionising radiation and electrical stress on nanocrystal memory cell array","display_name":"Ionising radiation and electrical stress on nanocrystal memory cell array","publication_year":2007,"publication_date":"2007-02-23","ids":{"openalex":"https://openalex.org/W2094469645","doi":"https://doi.org/10.1016/j.microrel.2007.01.008","mag":"2094469645"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2007.01.008","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2007.01.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050762849","display_name":"Andrea Cester","orcid":"https://orcid.org/0000-0001-6583-1735"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"A. Cester","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040459635","display_name":"Alberto Gasperin","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Gasperin","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066945890","display_name":"Nicola Wrachien","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"N. Wrachien","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032762366","display_name":"A. Paccagnella","orcid":"https://orcid.org/0000-0002-6850-4286"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Paccagnella","raw_affiliation_strings":["Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Ingegneria dell\u2019Informazione, Universit\u00e0 di Padova, via Gradenigo 6a, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Dipartimento di Ingegneria dell'Informazione, Universit\u00e0 di Padova. Via Gradenigo 6A, 35131 Padova, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055364283","display_name":"Valentina Ancarani","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]},{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"V. Ancarani","raw_affiliation_strings":["ST Microelectronics, Stradale Primosole 50, 95121 Catania, Italy","ST Microelectronics, Stradale Primosole, 50, 95121 Catania, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Stradale Primosole 50, 95121 Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST Microelectronics, Stradale Primosole, 50, 95121 Catania, Italy#TAB#","institution_ids":["https://openalex.org/I131827901"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058830907","display_name":"C. Gerardi","orcid":"https://orcid.org/0000-0001-6270-2727"},"institutions":[{"id":"https://openalex.org/I131827901","display_name":"STMicroelectronics (Switzerland)","ror":"https://ror.org/00wm3b005","country_code":"CH","type":"company","lineage":["https://openalex.org/I131827901"]},{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["CH","IT"],"is_corresponding":false,"raw_author_name":"C. Gerardi","raw_affiliation_strings":["ST Microelectronics, Stradale Primosole 50, 95121 Catania, Italy","ST Microelectronics, Stradale Primosole, 50, 95121 Catania, Italy#TAB#"],"affiliations":[{"raw_affiliation_string":"ST Microelectronics, Stradale Primosole 50, 95121 Catania, Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"ST Microelectronics, Stradale Primosole, 50, 95121 Catania, Italy#TAB#","institution_ids":["https://openalex.org/I131827901"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5050762849"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.7176,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.74480578,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"47","issue":"4-5","first_page":"602","last_page":"605"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanocrystal","display_name":"Nanocrystal","score":0.8182149529457092},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.7564260959625244},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.695931077003479},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.6816828846931458},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6161868572235107},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5841798782348633},{"id":"https://openalex.org/keywords/nitride","display_name":"Nitride","score":0.5207967162132263},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.4837903678417206},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4731496572494507},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.35741353034973145},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.3192867934703827},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2636706829071045},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2042209804058075},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07603400945663452},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.06259840726852417},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.05536267161369324}],"concepts":[{"id":"https://openalex.org/C175854130","wikidata":"https://www.wikidata.org/wiki/Q98276914","display_name":"Nanocrystal","level":2,"score":0.8182149529457092},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.7564260959625244},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.695931077003479},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6816828846931458},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6161868572235107},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5841798782348633},{"id":"https://openalex.org/C194760766","wikidata":"https://www.wikidata.org/wiki/Q410851","display_name":"Nitride","level":3,"score":0.5207967162132263},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.4837903678417206},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4731496572494507},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.35741353034973145},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.3192867934703827},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2636706829071045},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2042209804058075},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07603400945663452},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.06259840726852417},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.05536267161369324},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1016/j.microrel.2007.01.008","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2007.01.008","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},{"id":"pmh:oai:www.research.unipd.it:11577/1555895","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/1555895","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:www.research.unipd.it:11577/2430294","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/2430294","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1969170269","https://openalex.org/W2008100644","https://openalex.org/W2049015133","https://openalex.org/W2106903391","https://openalex.org/W2122491682","https://openalex.org/W2137685144","https://openalex.org/W2156114814","https://openalex.org/W2162303635","https://openalex.org/W2166916040","https://openalex.org/W2169925409","https://openalex.org/W2541769529"],"related_works":["https://openalex.org/W2063944086","https://openalex.org/W3004246895","https://openalex.org/W1981589971","https://openalex.org/W3151666176","https://openalex.org/W2046382749","https://openalex.org/W2086631798","https://openalex.org/W4389453731","https://openalex.org/W1564970384","https://openalex.org/W1990781930","https://openalex.org/W2977879447"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}