{"id":"https://openalex.org/W2078024907","doi":"https://doi.org/10.1016/j.microrel.2004.05.029","title":"Single event transient effects in a voltage reference","display_name":"Single event transient effects in a voltage reference","publication_year":2004,"publication_date":"2004-11-11","ids":{"openalex":"https://openalex.org/W2078024907","doi":"https://doi.org/10.1016/j.microrel.2004.05.029","mag":"2078024907"},"language":"en","primary_location":{"id":"doi:10.1016/j.microrel.2004.05.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2004.05.029","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019512644","display_name":"Philippe C. Adell","orcid":"https://orcid.org/0000-0001-9270-5021"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"P.C. Adell","raw_affiliation_strings":["Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035965053","display_name":"Ronald D. Schrimpf","orcid":"https://orcid.org/0000-0001-7419-2701"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.D. Schrimpf","raw_affiliation_strings":["Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053860550","display_name":"C.R. Cirba","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C.R. Cirba","raw_affiliation_strings":["Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105361090","display_name":"W.T. Holman","orcid":null},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W.T. Holman","raw_affiliation_strings":["Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091105788","display_name":"Xiao\u2010Wei Zhu","orcid":"https://orcid.org/0000-0002-3495-9178"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"X. Zhu","raw_affiliation_strings":["Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA"],"affiliations":[{"raw_affiliation_string":"Vanderbilt University, Box 1825 Station B, Nashville, TN37235 1825, USA","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075047270","display_name":"Hugh Barnaby","orcid":"https://orcid.org/0000-0002-8136-1849"},"institutions":[{"id":"https://openalex.org/I138006243","display_name":"University of Arizona","ror":"https://ror.org/03m2x1q45","country_code":"US","type":"education","lineage":["https://openalex.org/I138006243"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"H.J. Barnaby","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Arizona University, Tucson AZ, 85721-0104, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Arizona University, Tucson AZ, 85721-0104, USA","institution_ids":["https://openalex.org/I138006243"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091821513","display_name":"O. Mion","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"O. Mion","raw_affiliation_strings":["Alcatel Space, 100 Bd du Midi BP 99, 06156 Cannes La Bocca, France"],"affiliations":[{"raw_affiliation_string":"Alcatel Space, 100 Bd du Midi BP 99, 06156 Cannes La Bocca, France","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5019512644"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":{"value":2190,"currency":"USD","value_usd":2190},"apc_paid":null,"fwci":0.6726,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.72436715,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"45","issue":"2","first_page":"355","last_page":"359"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7864804863929749},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6832116842269897},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6090410351753235},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4831189811229706},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47928088903427124},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46648529171943665},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.46595507860183716},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4655251204967499},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.4339168071746826},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3707859516143799},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2819889783859253},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19338259100914001}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7864804863929749},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6832116842269897},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6090410351753235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4831189811229706},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47928088903427124},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46648529171943665},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.46595507860183716},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4655251204967499},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.4339168071746826},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3707859516143799},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2819889783859253},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19338259100914001},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.microrel.2004.05.029","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.microrel.2004.05.029","pdf_url":null,"source":{"id":"https://openalex.org/S133646729","display_name":"Microelectronics Reliability","issn_l":"0026-2714","issn":["0026-2714","1872-941X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Reliability","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320332186","display_name":"Defense Threat Reduction Agency","ror":"https://ror.org/04tz64554"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1479828413","https://openalex.org/W1949199885","https://openalex.org/W2055881008","https://openalex.org/W2124245581","https://openalex.org/W2144932784","https://openalex.org/W2987637782"],"related_works":["https://openalex.org/W2358137648","https://openalex.org/W3128819368","https://openalex.org/W2014796125","https://openalex.org/W2131408766","https://openalex.org/W2669128877","https://openalex.org/W1985471711","https://openalex.org/W4200253173","https://openalex.org/W2917980287","https://openalex.org/W2039258743","https://openalex.org/W2059875667"],"abstract_inverted_index":null,"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2013,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}