{"id":"https://openalex.org/W7165685603","doi":"https://doi.org/10.1016/j.mejo.2026.107340","title":"A heterojunction short-gate dual-channel SiC MOSFET with reduced reverse cut-in voltage and switching loss","display_name":"A heterojunction short-gate dual-channel SiC MOSFET with reduced reverse cut-in voltage and switching loss","publication_year":2026,"publication_date":"2026-06-23","ids":{"openalex":"https://openalex.org/W7165685603","doi":"https://doi.org/10.1016/j.mejo.2026.107340"},"language":"en","primary_location":{"id":"doi:10.1016/j.mejo.2026.107340","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mejo.2026.107340","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5139202846","display_name":"Lilu Feng","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lilu Feng","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127633990","display_name":"Peng Sun","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Sun","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065676144","display_name":"Yuxi Liang","orcid":"https://orcid.org/0009-0007-9322-1839"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxi Liang","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139200292","display_name":"Huayang Zheng","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huayang Zheng","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5121092387","display_name":"Ningyi Li","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ningyi Li","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087820025","display_name":"Mingrui Zou","orcid":"https://orcid.org/0009-0001-4740-5916"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingrui Zou","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103048753","display_name":"Jiakun Gong","orcid":"https://orcid.org/0009-0007-0454-3570"},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiakun Gong","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127450129","display_name":"Ruihong Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruihong Luo","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5139143020","display_name":"Zheng Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I158842170","display_name":"Chongqing University","ror":"https://ror.org/023rhb549","country_code":"CN","type":"education","lineage":["https://openalex.org/I158842170"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zheng Zeng","raw_affiliation_strings":["Chongqing University, Chongqing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chongqing University, Chongqing, China","institution_ids":["https://openalex.org/I158842170"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5139143020"],"corresponding_institution_ids":["https://openalex.org/I158842170"],"apc_list":{"value":2370,"currency":"USD","value_usd":2370},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.77073363,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"175","issue":null,"first_page":"107340","last_page":"107340"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.6171000003814697},{"id":"https://openalex.org/keywords/thermal-conduction","display_name":"Thermal conduction","score":0.5806000232696533},{"id":"https://openalex.org/keywords/heterojunction","display_name":"Heterojunction","score":0.5799999833106995},{"id":"https://openalex.org/keywords/trench","display_name":"Trench","score":0.5623000264167786},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.539900004863739},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5368000268936157},{"id":"https://openalex.org/keywords/switching-time","display_name":"Switching time","score":0.4763000011444092},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4074999988079071}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8385000228881836},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6969000101089478},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.6171000003814697},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.5806000232696533},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.5799999833106995},{"id":"https://openalex.org/C155310634","wikidata":"https://www.wikidata.org/wiki/Q1852785","display_name":"Trench","level":3,"score":0.5623000264167786},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.539900004863739},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5368000268936157},{"id":"https://openalex.org/C199310435","wikidata":"https://www.wikidata.org/wiki/Q7659121","display_name":"Switching time","level":2,"score":0.4763000011444092},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4074999988079071},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.3702999949455261},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36399999260902405},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.36000001430511475},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.3377000093460083},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.326200008392334},{"id":"https://openalex.org/C52236655","wikidata":"https://www.wikidata.org/wiki/Q2628074","display_name":"PIN diode","level":3,"score":0.32269999384880066},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.31859999895095825},{"id":"https://openalex.org/C11918236","wikidata":"https://www.wikidata.org/wiki/Q7501554","display_name":"Short-channel effect","level":5,"score":0.31279999017715454},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2994999885559082},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2824999988079071},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.2809000015258789},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.2711000144481659},{"id":"https://openalex.org/C10418432","wikidata":"https://www.wikidata.org/wiki/Q560370","display_name":"AND gate","level":3,"score":0.2639000117778778},{"id":"https://openalex.org/C166869088","wikidata":"https://www.wikidata.org/wiki/Q888791","display_name":"Flyback diode","level":5,"score":0.25859999656677246}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.mejo.2026.107340","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.mejo.2026.107340","pdf_url":null,"source":{"id":"https://openalex.org/S98831239","display_name":"Microelectronics Journal","issn_l":"1879-2391","issn":["1879-2391"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Microelectronics Journal","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7851001024246216,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1517890617","https://openalex.org/W1973592577","https://openalex.org/W1978446612","https://openalex.org/W2008912262","https://openalex.org/W2085804909","https://openalex.org/W2115699921","https://openalex.org/W2136250228","https://openalex.org/W2224773456","https://openalex.org/W2403746207","https://openalex.org/W2532011496","https://openalex.org/W2577976329","https://openalex.org/W2594414033","https://openalex.org/W2607826193","https://openalex.org/W2766796456","https://openalex.org/W2774472115","https://openalex.org/W2786692520","https://openalex.org/W2904255447","https://openalex.org/W2927910681","https://openalex.org/W2949728079","https://openalex.org/W4283764914","https://openalex.org/W4312055813","https://openalex.org/W4364321734","https://openalex.org/W4376606712","https://openalex.org/W4387885620","https://openalex.org/W4403261115","https://openalex.org/W4403761789","https://openalex.org/W4407981320","https://openalex.org/W4409761186","https://openalex.org/W4412999330"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-25T06:16:34.145877","created_date":"2026-06-24T00:00:00"}