{"id":"https://openalex.org/W7138876029","doi":"https://doi.org/10.1016/j.engappai.2026.114527","title":"In-situ three-dimensional profilometry in high-temperature environment via laser structured light with conditional generative adversarial network-based adaptive speckle denoising","display_name":"In-situ three-dimensional profilometry in high-temperature environment via laser structured light with conditional generative adversarial network-based adaptive speckle denoising","publication_year":2026,"publication_date":"2026-03-18","ids":{"openalex":"https://openalex.org/W7138876029","doi":"https://doi.org/10.1016/j.engappai.2026.114527"},"language":"en","primary_location":{"id":"doi:10.1016/j.engappai.2026.114527","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.engappai.2026.114527","pdf_url":null,"source":{"id":"https://openalex.org/S900972176","display_name":"Engineering Applications of Artificial Intelligence","issn_l":"0952-1976","issn":["0952-1976","1873-6769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engineering Applications of Artificial Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5130045784","display_name":"Hongsen Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongsen Wang","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5129789252","display_name":"Fujia Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fujia Liu","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","Technical Support Center for Prevention and Control of Disastrous Accidents in Metal Smelting, University of Science and Technology Beijing, Beijing, 100083, PR China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]},{"raw_affiliation_string":"Technical Support Center for Prevention and Control of Disastrous Accidents in Metal Smelting, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jianhong Yang","orcid":"https://orcid.org/0000-0001-5908-8041"},"institutions":[{"id":"https://openalex.org/I4210141165","display_name":"Ministry of Education","ror":"https://ror.org/03m01yf64","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210141165","https://openalex.org/I4405257903"]},{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN","TW"],"is_corresponding":true,"raw_author_name":"Jianhong Yang","raw_affiliation_strings":["Key Laboratory of Fluid Interaction with Material, Ministry of Education, Beijing, 100083, PR China","School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","Technical Support Center for Prevention and Control of Disastrous Accidents in Metal Smelting, University of Science and Technology Beijing, Beijing, 100083, PR China"],"raw_orcid":"https://orcid.org/0000-0001-5908-8041","affiliations":[{"raw_affiliation_string":"Key Laboratory of Fluid Interaction with Material, Ministry of Education, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I4210141165"]},{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]},{"raw_affiliation_string":"Technical Support Center for Prevention and Control of Disastrous Accidents in Metal Smelting, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5123640869","display_name":"Yuxuan Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091171","display_name":"Beijing Zhenxing Metrology & Measurement Institute","ror":"https://ror.org/00cd12q64","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210091171"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxuan Jiang","raw_affiliation_strings":["Zhenxing Institute of Metrology and Measurement, Beijing, 100074, PR China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhenxing Institute of Metrology and Measurement, Beijing, 100074, PR China","institution_ids":["https://openalex.org/I4210091171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014102750","display_name":"C. Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chaoyang Duan","raw_affiliation_strings":["School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, University of Science and Technology Beijing, Beijing, 100083, PR China","institution_ids":["https://openalex.org/I92403157"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5129994271","display_name":"Yang Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113795","display_name":"Hubei University of Arts and Science","ror":"https://ror.org/0212jcf64","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210113795"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["Xiangyang Auto Vocational Technical College, Intelligent Manufacturing College, Xiangyang, Hubei, 441021, PR China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xiangyang Auto Vocational Technical College, Intelligent Manufacturing College, Xiangyang, Hubei, 441021, PR China","institution_ids":["https://openalex.org/I4210113795"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210141165","https://openalex.org/I92403157"],"apc_list":{"value":3170,"currency":"USD","value_usd":3170},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.55604873,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"174","issue":null,"first_page":"114527","last_page":"114527"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8407999873161316,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8407999873161316,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.032999999821186066,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.023099999874830246,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/structured-light","display_name":"Structured light","score":0.7781999707221985},{"id":"https://openalex.org/keywords/speckle-pattern","display_name":"Speckle pattern","score":0.6657999753952026},{"id":"https://openalex.org/keywords/discriminator","display_name":"Discriminator","score":0.6043000221252441},{"id":"https://openalex.org/keywords/profilometer","display_name":"Profilometer","score":0.5530999898910522},{"id":"https://openalex.org/keywords/speckle-noise","display_name":"Speckle noise","score":0.5454000234603882},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.4512999951839447},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4474000036716461},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.41339999437332153}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8015000224113464},{"id":"https://openalex.org/C193581530","wikidata":"https://www.wikidata.org/wiki/Q683778","display_name":"Structured light","level":2,"score":0.7781999707221985},{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.6657999753952026},{"id":"https://openalex.org/C2779803651","wikidata":"https://www.wikidata.org/wiki/Q5282088","display_name":"Discriminator","level":3,"score":0.6043000221252441},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5748000144958496},{"id":"https://openalex.org/C79261456","wikidata":"https://www.wikidata.org/wiki/Q443756","display_name":"Profilometer","level":3,"score":0.5530999898910522},{"id":"https://openalex.org/C180940675","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle noise","level":3,"score":0.5454000234603882},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.4512999951839447},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4505999982357025},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4474000036716461},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.41339999437332153},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.3504999876022339},{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.3443000018596649},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.33469998836517334},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.3264999985694885},{"id":"https://openalex.org/C2776865275","wikidata":"https://www.wikidata.org/wiki/Q311666","display_name":"Projector","level":2,"score":0.32190001010894775},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.3124000132083893},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.27140000462532043},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.26589998602867126},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.2606000006198883},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.25200000405311584},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.2506999969482422}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.engappai.2026.114527","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.engappai.2026.114527","pdf_url":null,"source":{"id":"https://openalex.org/S900972176","display_name":"Engineering Applications of Artificial Intelligence","issn_l":"0952-1976","issn":["0952-1976","1873-6769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engineering Applications of Artificial Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.6488615274429321}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2156155065","https://openalex.org/W2508457857","https://openalex.org/W2557183932","https://openalex.org/W2743780012","https://openalex.org/W2905995769","https://openalex.org/W2908755547","https://openalex.org/W2922559641","https://openalex.org/W2971218913","https://openalex.org/W3002380821","https://openalex.org/W3003536107","https://openalex.org/W3014641072","https://openalex.org/W3040278715","https://openalex.org/W3048891246","https://openalex.org/W3211054674","https://openalex.org/W4226162332","https://openalex.org/W4280519866","https://openalex.org/W4296062161","https://openalex.org/W4296193306","https://openalex.org/W4306646039","https://openalex.org/W4378804949","https://openalex.org/W4379261182","https://openalex.org/W4387730199","https://openalex.org/W4389134880","https://openalex.org/W4393241094","https://openalex.org/W4401357093","https://openalex.org/W4402481432","https://openalex.org/W4409683211","https://openalex.org/W4411172359","https://openalex.org/W4412696279","https://openalex.org/W4416364475"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-20T20:54:20.808490","created_date":"2026-03-20T00:00:00"}