{"id":"https://openalex.org/W7140200894","doi":"https://doi.org/10.1016/j.engappai.2026.113982","title":"Enhancing within-batch quality prediction by cyber-physical latent state models and incomplete first-principles","display_name":"Enhancing within-batch quality prediction by cyber-physical latent state models and incomplete first-principles","publication_year":2026,"publication_date":"2026-03-24","ids":{"openalex":"https://openalex.org/W7140200894","doi":"https://doi.org/10.1016/j.engappai.2026.113982"},"language":"en","primary_location":{"id":"doi:10.1016/j.engappai.2026.113982","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.engappai.2026.113982","pdf_url":null,"source":{"id":"https://openalex.org/S900972176","display_name":"Engineering Applications of Artificial Intelligence","issn_l":"0952-1976","issn":["0952-1976","1873-6769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engineering Applications of Artificial Intelligence","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"YiShan Lee","orcid":"https://orcid.org/0000-0002-7321-1701"},"institutions":[{"id":"https://openalex.org/I44119531","display_name":"Ministry of Manpower","ror":"https://ror.org/036gvnq39","country_code":"SG","type":"government","lineage":["https://openalex.org/I44119531"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"YiShan Lee","raw_affiliation_strings":["VisionPower Semiconductor Manufacturing Company, Tampanise Industrial Ave 1, Singapore"],"raw_orcid":"https://orcid.org/0000-0002-7321-1701","affiliations":[{"raw_affiliation_string":"VisionPower Semiconductor Manufacturing Company, Tampanise Industrial Ave 1, Singapore","institution_ids":["https://openalex.org/I44119531"]}]},{"author_position":"last","author":{"id":null,"display_name":"Junghui Chen","orcid":"https://orcid.org/0000-0002-9994-839X"},"institutions":[{"id":"https://openalex.org/I151221077","display_name":"Chung Yuan Christian University","ror":"https://ror.org/02w8ws377","country_code":"TW","type":"education","lineage":["https://openalex.org/I151221077"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Junghui Chen","raw_affiliation_strings":["R&D Center for Membrane Technology and Department of Chemical Engineering, Chung-Yuan Christian University, Chung-Li, Taoyuan, 32023, Taiwan, Republic of China"],"raw_orcid":"https://orcid.org/0000-0002-9994-839X","affiliations":[{"raw_affiliation_string":"R&D Center for Membrane Technology and Department of Chemical Engineering, Chung-Yuan Christian University, Chung-Li, Taoyuan, 32023, Taiwan, Republic of China","institution_ids":["https://openalex.org/I151221077"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I151221077"],"apc_list":{"value":3170,"currency":"USD","value_usd":3170},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.65944559,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"174","issue":null,"first_page":"113982","last_page":"113982"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9114000201225281,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9114000201225281,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.05530000105500221,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10763","display_name":"Digital Transformation in Industry","score":0.0027000000700354576,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.5827999711036682},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5188000202178955},{"id":"https://openalex.org/keywords/missing-data","display_name":"Missing data","score":0.512499988079071},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.459199994802475},{"id":"https://openalex.org/keywords/process-modeling","display_name":"Process modeling","score":0.41029998660087585},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.3774000108242035},{"id":"https://openalex.org/keywords/data-quality","display_name":"Data quality","score":0.36579999327659607},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.3564999997615814}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8432000279426575},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.6241999864578247},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.5827999711036682},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5555999875068665},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5188000202178955},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.512499988079071},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.459199994802475},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4494999945163727},{"id":"https://openalex.org/C76956256","wikidata":"https://www.wikidata.org/wiki/Q27610560","display_name":"Process modeling","level":3,"score":0.41029998660087585},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.3774000108242035},{"id":"https://openalex.org/C24756922","wikidata":"https://www.wikidata.org/wiki/Q1757694","display_name":"Data quality","level":3,"score":0.36579999327659607},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.3564999997615814},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.34940001368522644},{"id":"https://openalex.org/C183560197","wikidata":"https://www.wikidata.org/wiki/Q7247302","display_name":"Process state","level":3,"score":0.30660000443458557},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.3061000108718872},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.3052000105381012},{"id":"https://openalex.org/C172658912","wikidata":"https://www.wikidata.org/wiki/Q661613","display_name":"Batch processing","level":2,"score":0.3043000102043152},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.303600013256073},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.2831999957561493},{"id":"https://openalex.org/C92446256","wikidata":"https://www.wikidata.org/wiki/Q3306762","display_name":"Data validation","level":2,"score":0.26829999685287476},{"id":"https://openalex.org/C114289077","wikidata":"https://www.wikidata.org/wiki/Q3284399","display_name":"Statistical model","level":2,"score":0.2628999948501587},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.26249998807907104},{"id":"https://openalex.org/C97385483","wikidata":"https://www.wikidata.org/wiki/Q16954980","display_name":"Deep belief network","level":3,"score":0.26010000705718994},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.2574000060558319}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.engappai.2026.113982","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.engappai.2026.113982","pdf_url":null,"source":{"id":"https://openalex.org/S900972176","display_name":"Engineering Applications of Artificial Intelligence","issn_l":"0952-1976","issn":["0952-1976","1873-6769"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Engineering Applications of Artificial Intelligence","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1991445954","https://openalex.org/W2889017122","https://openalex.org/W2920714358","https://openalex.org/W2979184896","https://openalex.org/W3015966228","https://openalex.org/W3111796587","https://openalex.org/W3134326136","https://openalex.org/W3186439822","https://openalex.org/W3198619382","https://openalex.org/W3207983328","https://openalex.org/W4200484503","https://openalex.org/W4206660023","https://openalex.org/W4289745017","https://openalex.org/W4294663829","https://openalex.org/W4304889569","https://openalex.org/W4308194133","https://openalex.org/W4308266156","https://openalex.org/W4312105465","https://openalex.org/W4321350776","https://openalex.org/W4323825336","https://openalex.org/W4353048130","https://openalex.org/W4388888602","https://openalex.org/W4392432799"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2026-03-25T00:00:00"}