{"id":"https://openalex.org/W7160212435","doi":"https://doi.org/10.1016/j.dsp.2026.106211","title":"A robust model for fast and reliable surface defect detection in Micro-LED production","display_name":"A robust model for fast and reliable surface defect detection in Micro-LED production","publication_year":2026,"publication_date":"2026-04-30","ids":{"openalex":"https://openalex.org/W7160212435","doi":"https://doi.org/10.1016/j.dsp.2026.106211"},"language":"en","primary_location":{"id":"doi:10.1016/j.dsp.2026.106211","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.dsp.2026.106211","pdf_url":null,"source":{"id":"https://openalex.org/S64117906","display_name":"Digital Signal Processing","issn_l":"1051-2004","issn":["1051-2004","1095-4333"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digital Signal Processing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5135140524","display_name":"Yuantao Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]},{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuantao Chen","raw_affiliation_strings":["Institute of Semiconductors, Guangdong Academy of Science, No.363 Changxing Road, Guangzhou 610650, China","School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Guangdong Academy of Science, No.363 Changxing Road, Guangzhou 610650, China","institution_ids":["https://openalex.org/I4210149211"]},{"raw_affiliation_string":"School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135225864","display_name":"Yian Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yian Yin","raw_affiliation_strings":["School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135164477","display_name":"YuQian Song","orcid":null},"institutions":[{"id":"https://openalex.org/I187400657","display_name":"South China Normal University","ror":"https://ror.org/01kq0pv72","country_code":"CN","type":"education","lineage":["https://openalex.org/I187400657"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"YuQian Song","raw_affiliation_strings":["School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Science and Engineering (School of Microelectronics), South China Normal University,Guangzhou 510631, China","institution_ids":["https://openalex.org/I187400657"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5135232652","display_name":"Zheng Gong","orcid":"https://orcid.org/0000-0001-6651-5582"},"institutions":[{"id":"https://openalex.org/I4210149211","display_name":"Institute of Semiconductors","ror":"https://ror.org/048dd0611","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zheng Gong","raw_affiliation_strings":["Institute of Semiconductors, Guangdong Academy of Science, No.363 Changxing Road, Guangzhou 610650, China"],"raw_orcid":"https://orcid.org/0000-0001-6651-5582","affiliations":[{"raw_affiliation_string":"Institute of Semiconductors, Guangdong Academy of Science, No.363 Changxing Road, Guangzhou 610650, China","institution_ids":["https://openalex.org/I4210149211"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5135232652"],"corresponding_institution_ids":["https://openalex.org/I4210149211"],"apc_list":{"value":2480,"currency":"USD","value_usd":2480},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.60548152,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"180","issue":null,"first_page":"106211","last_page":"106211"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7918999791145325,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.7918999791145325,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.056699998676776886,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.008799999952316284,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.5346999764442444},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5166000127792358},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.31679999828338623},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.31119999289512634},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.2971999943256378},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.2939999997615814}],"concepts":[{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.5346999764442444},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5242000222206116},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5166000127792358},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.45399999618530273},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.31679999828338623},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.31119999289512634},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3034999966621399},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.2971999943256378},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.2939999997615814},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2833999991416931},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.2777999937534332},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.27379998564720154},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.26499998569488525},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.2639999985694885},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2549000084400177},{"id":"https://openalex.org/C2984999661","wikidata":"https://www.wikidata.org/wiki/Q603159","display_name":"Surface fitting","level":3,"score":0.2540999948978424},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.25290000438690186}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.dsp.2026.106211","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.dsp.2026.106211","pdf_url":null,"source":{"id":"https://openalex.org/S64117906","display_name":"Digital Signal Processing","issn_l":"1051-2004","issn":["1051-2004","1095-4333"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Digital Signal Processing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.40841683745384216}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2891336752","https://openalex.org/W3012374719","https://openalex.org/W3126281026","https://openalex.org/W3135443395","https://openalex.org/W3146188393","https://openalex.org/W3195969653","https://openalex.org/W4229048511","https://openalex.org/W4304481239","https://openalex.org/W4306392845","https://openalex.org/W4315490537","https://openalex.org/W4321433787","https://openalex.org/W4380592191","https://openalex.org/W4381460233","https://openalex.org/W4387789872","https://openalex.org/W4390629764","https://openalex.org/W4391823537","https://openalex.org/W4392434823","https://openalex.org/W4392931965","https://openalex.org/W4400080005","https://openalex.org/W4400266963","https://openalex.org/W4401954962","https://openalex.org/W4406890663","https://openalex.org/W4407960777"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-06-19T15:47:20.252518","created_date":"2026-05-05T00:00:00"}