{"id":"https://openalex.org/W7140193686","doi":"https://doi.org/10.1016/j.displa.2026.103453","title":"Asymmetric double-gate (ADG) oxide TFTs with both gradual and steep subthreshold characteristics for mobile AMOLED displays","display_name":"Asymmetric double-gate (ADG) oxide TFTs with both gradual and steep subthreshold characteristics for mobile AMOLED displays","publication_year":2026,"publication_date":"2026-03-24","ids":{"openalex":"https://openalex.org/W7140193686","doi":"https://doi.org/10.1016/j.displa.2026.103453"},"language":"en","primary_location":{"id":"doi:10.1016/j.displa.2026.103453","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.displa.2026.103453","pdf_url":null,"source":{"id":"https://openalex.org/S191329154","display_name":"Displays","issn_l":"0141-9382","issn":["0141-9382","1872-7387"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Displays","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Yuhan Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuhan Zhang","raw_affiliation_strings":["School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lu Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lu Chang","raw_affiliation_strings":["School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Huan Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huan Yang","raw_affiliation_strings":["School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Lei Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Lu","raw_affiliation_strings":["School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Congwei Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210152380","display_name":"Shenzhen Technology University","ror":"https://ror.org/04qzpec27","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210152380"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Congwei Liao","raw_affiliation_strings":["College of Integrated Circuit and Optoelectronic Chips, Shenzhen Technology University, Shenzhen 518118, China"],"affiliations":[{"raw_affiliation_string":"College of Integrated Circuit and Optoelectronic Chips, Shenzhen Technology University, Shenzhen 518118, China","institution_ids":["https://openalex.org/I4210152380"]}]},{"author_position":"last","author":{"id":null,"display_name":"Shengdong Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengdong Zhang","raw_affiliation_strings":["School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","School of Integrated Circuits, Peking University, Beijing 100871, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Computer Engineering, Peking University Shenzhen Graduate School, Shenzhen 518055, China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing 100871, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210152380"],"apc_list":{"value":2470,"currency":"USD","value_usd":2470},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.77695364,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"93","issue":null,"first_page":"103453","last_page":"103453"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/amoled","display_name":"AMOLED","score":0.970300018787384},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.7562000155448914},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.5967000126838684},{"id":"https://openalex.org/keywords/subthreshold-conduction","display_name":"Subthreshold conduction","score":0.5501999855041504},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.484499990940094},{"id":"https://openalex.org/keywords/channel-length-modulation","display_name":"Channel length modulation","score":0.4287000000476837},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.41990000009536743},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.4154999852180481},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4153999984264374}],"concepts":[{"id":"https://openalex.org/C101050124","wikidata":"https://www.wikidata.org/wiki/Q527747","display_name":"AMOLED","level":5,"score":0.970300018787384},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8061000108718872},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.7562000155448914},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6473000049591064},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.5967000126838684},{"id":"https://openalex.org/C156465305","wikidata":"https://www.wikidata.org/wiki/Q1658601","display_name":"Subthreshold conduction","level":4,"score":0.5501999855041504},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.484499990940094},{"id":"https://openalex.org/C171291426","wikidata":"https://www.wikidata.org/wiki/Q5072499","display_name":"Channel length modulation","level":5,"score":0.4287000000476837},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.41990000009536743},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4154999852180481},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4153999984264374},{"id":"https://openalex.org/C162743726","wikidata":"https://www.wikidata.org/wiki/Q7115642","display_name":"Oxide thin-film transistor","level":4,"score":0.4065999984741211},{"id":"https://openalex.org/C150759737","wikidata":"https://www.wikidata.org/wiki/Q209593","display_name":"OLED","level":3,"score":0.39969998598098755},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.3885999917984009},{"id":"https://openalex.org/C33347731","wikidata":"https://www.wikidata.org/wiki/Q285210","display_name":"Stacking","level":2,"score":0.374099999666214},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36489999294281006},{"id":"https://openalex.org/C103566474","wikidata":"https://www.wikidata.org/wiki/Q7632226","display_name":"Subthreshold slope","level":5,"score":0.352400004863739},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34619998931884766},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.3416000008583069},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.29899999499320984},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.27619999647140503},{"id":"https://openalex.org/C70201059","wikidata":"https://www.wikidata.org/wiki/Q3142195","display_name":"Active matrix","level":4,"score":0.274399995803833},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2694999873638153},{"id":"https://openalex.org/C154275363","wikidata":"https://www.wikidata.org/wiki/Q904133","display_name":"ISFET","level":5,"score":0.26840001344680786},{"id":"https://openalex.org/C134256836","wikidata":"https://www.wikidata.org/wiki/Q545913","display_name":"Backplane","level":2,"score":0.2651999890804291},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.2606000006198883}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.displa.2026.103453","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.displa.2026.103453","pdf_url":null,"source":{"id":"https://openalex.org/S191329154","display_name":"Displays","issn_l":"0141-9382","issn":["0141-9382","1872-7387"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Displays","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1604260908","https://openalex.org/W1982968328","https://openalex.org/W2131716975","https://openalex.org/W2150512993","https://openalex.org/W2155601148","https://openalex.org/W2506133073","https://openalex.org/W2620929138","https://openalex.org/W2796006783","https://openalex.org/W2800315827","https://openalex.org/W2902481791","https://openalex.org/W2942969473","https://openalex.org/W2947423012","https://openalex.org/W3010710902","https://openalex.org/W3088331919","https://openalex.org/W3121439431","https://openalex.org/W3175875810","https://openalex.org/W4205312733","https://openalex.org/W4211177244","https://openalex.org/W4283782157","https://openalex.org/W4362676162","https://openalex.org/W4381327611","https://openalex.org/W4386069676","https://openalex.org/W4390031877","https://openalex.org/W4390671477","https://openalex.org/W4396701429","https://openalex.org/W4401119920","https://openalex.org/W4402124990","https://openalex.org/W4406611067","https://openalex.org/W4408709600","https://openalex.org/W4414436086","https://openalex.org/W7077048394"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2026-03-25T00:00:00"}