{"id":"https://openalex.org/W7167603955","doi":"https://doi.org/10.1016/j.compchemeng.2026.109808","title":"Feature extraction strategies for multi-rate process data: Applications to CMC manufacturing and Tennessee Eastman simulation","display_name":"Feature extraction strategies for multi-rate process data: Applications to CMC manufacturing and Tennessee Eastman simulation","publication_year":2026,"publication_date":"2026-07-07","ids":{"openalex":"https://openalex.org/W7167603955","doi":"https://doi.org/10.1016/j.compchemeng.2026.109808"},"language":"en","primary_location":{"id":"doi:10.1016/j.compchemeng.2026.109808","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.compchemeng.2026.109808","pdf_url":null,"source":{"id":"https://openalex.org/S150671403","display_name":"Computers & Chemical Engineering","issn_l":"0098-1354","issn":["0098-1354","1873-4375"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Chemical Engineering","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021966131","display_name":"Markku Ohenoja","orcid":"https://orcid.org/0000-0001-7577-7218"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Markku Ohenoja","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036579879","display_name":"Tero Vuolio","orcid":"https://orcid.org/0000-0002-8091-937X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tero Vuolio","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5053347781","display_name":"Mika Ruusunen","orcid":"https://orcid.org/0000-0002-1096-0094"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mika Ruusunen","raw_affiliation_strings":[],"raw_orcid":"https://orcid.org/0000-0002-1096-0094","affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":4070,"currency":"USD","value_usd":4070},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.85156277,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"214","issue":null,"first_page":"109808","last_page":"109808"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.20190000534057617,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.20190000534057617,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.1859000027179718,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.07599999755620956,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.675599992275238},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4950000047683716},{"id":"https://openalex.org/keywords/manufacturing-process","display_name":"Manufacturing process","score":0.4799000024795532},{"id":"https://openalex.org/keywords/extraction","display_name":"Extraction (chemistry)","score":0.4230000078678131},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4065000116825104},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.32760000228881836}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.675599992275238},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.5142999887466431},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4950000047683716},{"id":"https://openalex.org/C2987875673","wikidata":"https://www.wikidata.org/wiki/Q187939","display_name":"Manufacturing process","level":2,"score":0.4799000024795532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4781999886035919},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4772000014781952},{"id":"https://openalex.org/C4725764","wikidata":"https://www.wikidata.org/wiki/Q844704","display_name":"Extraction (chemistry)","level":2,"score":0.4230000078678131},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4065000116825104},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.37369999289512634},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35580000281333923},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.3425999879837036},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.32760000228881836},{"id":"https://openalex.org/C174998907","wikidata":"https://www.wikidata.org/wiki/Q357662","display_name":"Work in process","level":2,"score":0.3043999969959259},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.28760001063346863},{"id":"https://openalex.org/C189575605","wikidata":"https://www.wikidata.org/wiki/Q838129","display_name":"Process simulation","level":3,"score":0.2822999954223633},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2705000042915344}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.compchemeng.2026.109808","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.compchemeng.2026.109808","pdf_url":null,"source":{"id":"https://openalex.org/S150671403","display_name":"Computers & Chemical Engineering","issn_l":"0098-1354","issn":["0098-1354","1873-4375"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Computers & Chemical Engineering","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320328501","display_name":"Business Finland","ror":"https://ror.org/05bgf9v38"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1996195892","https://openalex.org/W2002448960","https://openalex.org/W2004186751","https://openalex.org/W2023267725","https://openalex.org/W2089069118","https://openalex.org/W2131987814","https://openalex.org/W2135461721","https://openalex.org/W2145159661","https://openalex.org/W2176097074","https://openalex.org/W2213612645","https://openalex.org/W2478307678","https://openalex.org/W2765946341","https://openalex.org/W2793908696","https://openalex.org/W2892145105","https://openalex.org/W2911807750","https://openalex.org/W2919115771","https://openalex.org/W2940155792","https://openalex.org/W2946424966","https://openalex.org/W2946669626","https://openalex.org/W2966150529","https://openalex.org/W2970982005","https://openalex.org/W2974982900","https://openalex.org/W3008297566","https://openalex.org/W3025229840","https://openalex.org/W3045920133","https://openalex.org/W3184068405","https://openalex.org/W3187574370","https://openalex.org/W3206551500","https://openalex.org/W4294275276","https://openalex.org/W4309264919","https://openalex.org/W4390971972","https://openalex.org/W4394585889"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-16T05:54:29.318815","created_date":"2026-07-08T00:00:00"}