{"id":"https://openalex.org/W7127617892","doi":"https://doi.org/10.1016/j.asoc.2026.114728","title":"Fault sample generation under continuous degradation using CRGAN-MDTR: A conditional recurrent GAN with maximum degenerate trend retention","display_name":"Fault sample generation under continuous degradation using CRGAN-MDTR: A conditional recurrent GAN with maximum degenerate trend retention","publication_year":2026,"publication_date":"2026-02-04","ids":{"openalex":"https://openalex.org/W7127617892","doi":"https://doi.org/10.1016/j.asoc.2026.114728"},"language":"en","primary_location":{"id":"doi:10.1016/j.asoc.2026.114728","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.asoc.2026.114728","pdf_url":null,"source":{"id":"https://openalex.org/S140556538","display_name":"Applied Soft Computing","issn_l":"1568-4946","issn":["1568-4946","1872-9681"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Soft Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5125066792","display_name":"Yujie Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yujie Cheng","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, 100191, China","Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Pengchao Wang","orcid":"https://orcid.org/0009-0005-2840-6146"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pengchao Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, 100191, China","Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing"],"raw_orcid":"https://orcid.org/0009-0005-2840-6146","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111276577","display_name":"Haoxin Gu","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoxin Gu","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, 100191, China","Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031836081","display_name":"Jiyan Zeng","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiyan Zeng","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, 100191, China","Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5125020175","display_name":"Jian Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jian Ma","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, 100191, China","Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing"],"raw_orcid":"https://orcid.org/0000-0001-5932-469X","affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, 100191, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Science & Technology Laboratory on Reliability & Environmental Engineering, Beihang University, Beijing","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5125020175"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":{"value":3350,"currency":"USD","value_usd":3350},"apc_paid":null,"fwci":9.6806,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.96009345,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"192","issue":null,"first_page":"114728","last_page":"114728"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.8370000123977661,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.8370000123977661,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.021800000220537186,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.016699999570846558,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.8655999898910522},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4632999897003174},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4244000017642975},{"id":"https://openalex.org/keywords/sample-size-determination","display_name":"Sample size determination","score":0.3959999978542328},{"id":"https://openalex.org/keywords/generative-adversarial-network","display_name":"Generative adversarial network","score":0.39489999413490295},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.3919000029563904},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.3774000108242035},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.3732999861240387}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.8655999898910522},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6152999997138977},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4632999897003174},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4244000017642975},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.39959999918937683},{"id":"https://openalex.org/C129848803","wikidata":"https://www.wikidata.org/wiki/Q2564360","display_name":"Sample size determination","level":2,"score":0.3959999978542328},{"id":"https://openalex.org/C2988773926","wikidata":"https://www.wikidata.org/wiki/Q25104379","display_name":"Generative adversarial network","level":3,"score":0.39489999413490295},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.3919000029563904},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.3774000108242035},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3732999861240387},{"id":"https://openalex.org/C198531522","wikidata":"https://www.wikidata.org/wiki/Q485146","display_name":"Sample (material)","level":2,"score":0.3635999858379364},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3474000096321106},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3359000086784363},{"id":"https://openalex.org/C46686674","wikidata":"https://www.wikidata.org/wiki/Q466303","display_name":"Boosting (machine learning)","level":2,"score":0.33309999108314514},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.30630001425743103},{"id":"https://openalex.org/C109747225","wikidata":"https://www.wikidata.org/wiki/Q815758","display_name":"Scarcity","level":2,"score":0.30390000343322754},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.2903999984264374},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.28780001401901245},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.2831999957561493},{"id":"https://openalex.org/C2776436953","wikidata":"https://www.wikidata.org/wiki/Q5163215","display_name":"Consistency (knowledge bases)","level":2,"score":0.27239999175071716},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.2556000053882599},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.25270000100135803}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.asoc.2026.114728","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.asoc.2026.114728","pdf_url":null,"source":{"id":"https://openalex.org/S140556538","display_name":"Applied Soft Computing","issn_l":"1568-4946","issn":["1568-4946","1872-9681"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Applied Soft Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.6403707265853882}],"awards":[{"id":"https://openalex.org/G4978194864","display_name":null,"funder_award_id":"61803013","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8093056671","display_name":null,"funder_award_id":"ASFC-201933051001","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"},{"id":"https://openalex.org/F4320327472","display_name":"Chinese Aeronautical Establishment","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":48,"referenced_works":["https://openalex.org/W2051408490","https://openalex.org/W2896784509","https://openalex.org/W2910881901","https://openalex.org/W2990273315","https://openalex.org/W3012450219","https://openalex.org/W3025967384","https://openalex.org/W3042440267","https://openalex.org/W3092593798","https://openalex.org/W3096831136","https://openalex.org/W3102844584","https://openalex.org/W3109842401","https://openalex.org/W3133468499","https://openalex.org/W3134397144","https://openalex.org/W3155162522","https://openalex.org/W3160536166","https://openalex.org/W3161917984","https://openalex.org/W3164962239","https://openalex.org/W3209651137","https://openalex.org/W4212922948","https://openalex.org/W4283713720","https://openalex.org/W4293153026","https://openalex.org/W4315607822","https://openalex.org/W4319839684","https://openalex.org/W4321380810","https://openalex.org/W4323321983","https://openalex.org/W4324335423","https://openalex.org/W4367721727","https://openalex.org/W4368347327","https://openalex.org/W4377235515","https://openalex.org/W4385194769","https://openalex.org/W4385431515","https://openalex.org/W4385975776","https://openalex.org/W4387494810","https://openalex.org/W4391686199","https://openalex.org/W4392016375","https://openalex.org/W4392208038","https://openalex.org/W4392640734","https://openalex.org/W4393071667","https://openalex.org/W4393346493","https://openalex.org/W4399872993","https://openalex.org/W4400052920","https://openalex.org/W4400110290","https://openalex.org/W4400438859","https://openalex.org/W4400520334","https://openalex.org/W4401026365","https://openalex.org/W4403330442","https://openalex.org/W4403454489","https://openalex.org/W4404440408"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-14T06:11:07.267592","created_date":"2026-02-06T00:00:00"}